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NIST Authors in Bold

Displaying 31751 - 31775 of 73697

Improving the Reliability of VOC Emissions Testing of Building Products

October 1, 2007
Author(s)
Cynthia H. Reed, Andrew K. Persily, Steven J. Nabinger, John C. Little, Steven Cox
Manufacturers of building materials and furnishings are increasingly using emissions chamber testing to demonstrate low volatile organic compound (VOC) emissions from their products and to qualify for low-emitting certification and sustainable labeling

NIST optical fiber power measurements: intramural and international comparisons

October 1, 2007
Author(s)
Igor Vayshenker, John H. Lehman, David J. Livigni, Joshua A. Hadler
We discuss the results of intramural comparisons of NIST laser and optical fiber power meter (OFPM) measurements, and the results of OFPM comparisons between NIST and three National Measurement Institutes (NMIs). We also describe transfer standards

NIST Program to Support Testing and Evaluation of Trace Explosive Detection

October 1, 2007
Author(s)
R M. Verkouteren, John G. Gillen, Jennifer R. Verkouteren, Robert A. Fletcher, Eric S. Windsor, Wayne Smith
Trace detection is a primary strategy for thwarting terrorism activities in the US and abroad. The development of effective reference materials and methods for this purpose relies on fundamental knowledge regarding the size, mass, morphologies, and

Object-oriented Model for IEEE 1588 Standard

October 1, 2007
Author(s)
Kang B. Lee, Eugene Song
The IEEE 1588 standard specifies a protocol enabling precise synchronization of clocks in measurement and control systems implemented with technologies such as network communication, local computing, and distributed objects. This paper describes an object

Optical-to-microwave frequency comparison with fractional uncertainty of 10 -15

October 1, 2007
Author(s)
Jason Stalnaker, Scott A. Diddams, Tara M. Fortier, K Kim, Leo W. Hollberg, James C. Bergquist, Wayne M. Itano, Marie Delaney, Luca Lorini, Windell Oskay, Thomas P. Heavner, Steven R. Jefferts, Filippo Levi, Thomas E. Parker, Jon H. Shirley
We report the technical aspects of the optical-to-microwave comparison for our recent measurements of the optical frequency of the mercury single-ion frequency standard in terms of the SI second as realized by the NIST-F1 cesium fountain clock. Over the

Photomask Applications of Traceable Atomic Force Microscope Dimensional Metrology at NIST

October 1, 2007
Author(s)
Ronald G. Dixson, Ndubuisi G. Orji, James E. Potzick, Joseph Fu, Michael W. Cresswell, Richard A. Allen, S J. Smith, Anthony J. Walton
The National Institute of Standards and Technology (NIST) has a multifaceted program in AFM dimensional metrology. Two major instruments are being used for traceable measurements. The first is a custom in-house metrology AFM, called the calibrated AFM (C

Photon-number-discriminating detection using a quantum-dot, optically gated, field-effect transistor

October 1, 2007
Author(s)
Eric Gansen, Mary A. Rowe, M. Greene, Danna Rosenberg, Todd E. Harvey, Mark Su, Robert Hadfield, Sae Woo Nam, Richard Mirin
Detectors with the capability to directly measure the photon number of a pulse of light 1-3 enable linear optics quantum computing 4, affect the security of quantum communications 5, and can be used to characterize 6-8 and herald 9 non-classical states of
Displaying 31751 - 31775 of 73697
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