Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Reducing Thermal Noise in Molecular Force Spectroscopy

Published

Author(s)

Gordon A. Shaw

Abstract

Molecular force spectroscopy is the practice of testing the mechanical properties of single molecules.  The precision determination of these properties requires an instrument capable of piconewton-level force measurement.  The atomic force microscope (AFM) is capable of such measurements if experiments are performed carefully.  One factor limiting the force measurement resolution of the AFM in wet chemical environments is the presence of a squeeze film damper between the microfabricated cantilever used for force measurement and the surface to which the molecules of interest are attached.  The effect of this damping on the force sensor s thermal noise is examined, and a new method is proposed to reduce this noise at low frequency by using a micropipette.
Proceedings Title
Proceedings of the Society for Experimental Mechanics Annual Meeting
Orlando, FL, 2008
Conference Dates
June 2-5, 2008
Conference Location
Orlando, FL

Keywords

force, metrology, nanotechnology, scanning probe microscopy, single molecule measurement

Citation

Shaw, G. (2008), Reducing Thermal Noise in Molecular Force Spectroscopy, Proceedings of the Society for Experimental Mechanics Annual Meeting Orlando, FL, 2008, Orlando, FL, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=824638 (Accessed February 24, 2024)
Created June 2, 2008, Updated February 19, 2017