Reducing Thermal Noise in Molecular Force Spectroscopy

Published

June 2, 2008

Author(s)

Gordon A. Shaw

Abstract

Molecular force spectroscopy is the practice of testing the mechanical properties of single molecules.  The precision determination of these properties requires an instrument capable of piconewton-level force measurement.  The atomic force microscope (AFM) is capable of such measurements if experiments are performed carefully.  One factor limiting the force measurement resolution of the AFM in wet chemical environments is the presence of a squeeze film damper between the microfabricated cantilever used for force measurement and the surface to which the molecules of interest are attached.  The effect of this damping on the force sensor s thermal noise is examined, and a new method is proposed to reduce this noise at low frequency by using a micropipette.

Proceedings Title

Proceedings of the Society for Experimental Mechanics Annual Meeting
Orlando, FL, 2008

Conference Dates

June 2-5, 2008

Conference Location

Orlando, FL

Pub Type

Conferences

Download Paper

Local Download

Keywords

force, metrology, nanotechnology, scanning probe microscopy, single molecule measurement

Citation

Shaw, G. (2008), Reducing Thermal Noise in Molecular Force Spectroscopy, Proceedings of the Society for Experimental Mechanics Annual Meeting Orlando, FL, 2008, Orlando, FL, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=824638 (Accessed October 10, 2025)