A Next Generation Sampling Comparator Probe For The NIST Sampling Waveform Analyzer

Published

June 1, 2008

Author(s)

Owen B. Laug, David I. Bergman, T. M. Souders, Bryan C. Waltrip

Abstract

The design and performance of A Next Generation Sampling Comparator Probe (NGSCP) is described. It is intended as one of a group of probes designed for use with the NIST Sampling Waveform Analyzer (SWA). The probe design is centered on an application specific integrated circuit (ASIC) analog comparator featuring a bandwidth of 6 GHz. The design considerations of the ASIC analog comparator and the probe are discussed. The probe's performance features are compared against an earlier designed ASIC probe. In addition to the design aspects of the probe a thermal error correction technique is described which shows how high-speed settling performance can be enhanced. This technical note provides complete schematic diagrams of the ASIC comparator and the probe.

Citation

Technical Note (NIST TN) - 1496

Report Number

1496

NIST Pub Series

Technical Note (NIST TN)

Pub Type

NIST Pubs

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Keywords

comparator, sampling comparator, latching comparator, waveform sampler, sampling comparator probe, thermal correction, pulse settling

Citation

Laug, O. , Bergman, D. , Souders, T. and Waltrip, B. (2008), A Next Generation Sampling Comparator Probe For The NIST Sampling Waveform Analyzer, Technical Note (NIST TN), National Institute of Standards and Technology, Gaithersburg, MD, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32891 (Accessed October 28, 2025)