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A Next Generation Sampling Comparator Probe For The NIST Sampling Waveform Analyzer
Published
Author(s)
Owen B. Laug, David I. Bergman, T. M. Souders, Bryan C. Waltrip
Abstract
The design and performance of A Next Generation Sampling Comparator Probe (NGSCP) is described. It is intended as one of a group of probes designed for use with the NIST Sampling Waveform Analyzer (SWA). The probe design is centered on an application specific integrated circuit (ASIC) analog comparator featuring a bandwidth of 6 GHz. The design considerations of the ASIC analog comparator and the probe are discussed. The probe's performance features are compared against an earlier designed ASIC probe. In addition to the design aspects of the probe a thermal error correction technique is described which shows how high-speed settling performance can be enhanced. This technical note provides complete schematic diagrams of the ASIC comparator and the probe.
Laug, O.
, Bergman, D.
, Souders, T.
and Waltrip, B.
(2008),
A Next Generation Sampling Comparator Probe For The NIST Sampling Waveform Analyzer, Technical Note (NIST TN), National Institute of Standards and Technology, Gaithersburg, MD, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32891
(Accessed October 7, 2025)