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PUBLICATIONS

Lateral force cantilever for precise atomic force microscope friction measurements

Published

Author(s)

Mark Reitsma, Richard S. Gates, Robert F. Cook

Abstract

We present a microfabricated atomic force microscope (AFM) cantilever and associated calibration procedure that provide a path for quantitative friction measurement using a lateral force microscope. The lateral force cantilever presented is equipped with lever-arms that facilitate the application of normal and lateral forces, comparable to those acting in a typical AFM friction experiment. The cantilever allows for calibration and friction measurements to be carried out in situ and an AFM operator can select acceptable measurement precision via calibration measurements across the full working range of the instrument photodetector. We also identify and account for a misalignment susceptibility that could be encountered by operators using the methods described. The microfabricated lateral force cantilever is compatible with typical commercial AFM instrumentation and allows for common AFM techniques such as topography imaging and other surface force measurements to be performed.    
Proceedings Title
Society for Experimental Mechanics (SEM) XI International Congress & Exposition
Conference Dates
June 2-5, 2008
Conference Location
Orlando, FL
Pub Type
Conferences

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Keywords

atomic force microscope friction measurement
Nanometrology and Calibration services

Citation

Reitsma, M. , Gates, R. and Cook, R. (2008), Lateral force cantilever for precise atomic force microscope friction measurements, Society for Experimental Mechanics (SEM) XI International Congress & Exposition , Orlando, FL, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=853564 (Accessed October 11, 2025)

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Created June 2, 2008, Updated February 19, 2017
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