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Displaying 28401 - 28425 of 73829

1V and 10V SNS Programmable Voltage Standards for 70 GHz

June 3, 2009
Author(s)
Franz Mueller, Ralf Behr, T. Weimann, Luis Palafox, David I. Olaya, Paul Dresselhaus, Samuel Benz
Programmable Josephson voltage standards (PJVSs) in combination with fast switchable DC current sources have opened up new applications in the field of low frequency AC metrology. The growing interest in output voltages of up to 10 V initiated efforts by

Amorphous Nb-Si Barrier Junctions for Voltage Standard and Digital Applications

June 3, 2009
Author(s)
David I. Olaya, Paul Dresselhaus, Samuel Benz, Jon E. Bjarnason, Erich N. Grossman
Amorphous Nb-Si has been previously demonstrated as a Josephson junction barrier material for Nb-based superconducting voltage standard circuits, including both dc programmable and ac Josephson voltage standards operating at frequencies up to 20 GHz. This

DSQAP Exercise C Report

June 3, 2009
Author(s)
Catherine A. Rimmer, Laura J. Wood, Katrice A. Lippa, Melissa M. Phillips

Flexible Solution-Processed Memristors

June 3, 2009
Author(s)
Nadine E. Gergel-Hackett, Behrang H. Hamadani, B Dunlap, John S. Suehle, Curt A. Richter, Christina A. Hacker, David J. Gundlach
We have fabricated physically flexible nonvolatile memory devices using inexpensive, room-temperature, solution processing. The behavior of these devices is consistent with that of a memristor device, the missing fourth circuit element theoretically

Microwave Packaging for Voltage Standard Applications

June 3, 2009
Author(s)
Mike Elsbury, Charles J. Burroughs, Paul Dresselhaus, Zoya Popovic, Samuel Benz
Improvements to the packaging of Josephson Volt- age Standard (JVS) circuits have increased operating margins, reliability, and longevity of these systems. By using the "flip- chip-on-flex" technique, reliable chip and cryoprobe mounting have been

Molar Mass and Related Quantities in the New SI

June 3, 2009
Author(s)
Barry N. Taylor
This Letter addresses the calculation of molar mass and related quantities in the New SI currently under discussion by the International Committee for Weights and Measures and its Consultative Committee for Units and which could be adopted by the next

Tapered Transmission Lines with Dissipative Junctions

June 3, 2009
Author(s)
Paul D. Dresselhaus, Mike Elsbury, Samuel P. Benz
NIST is optimizing the design of a 10 V programmable Josephson voltage standard so that it uses less microwave power by use of fewer parallel-biased arrays with higher voltage per array. Increasing the voltage per array by adding more junctions is

Absolute Flux Calibration of Stars; Calibration of the Reference Telescope

June 2, 2009
Author(s)
Allan W. Smith, John T. Woodward IV, Colleen A. Jenkins, Steven W. Brown, Keith R. Lykke
Absolute stellar photometry is based on 1970s terrestrial measurements of the star Vega with instruments calibrated using the Planckian radiance from a Cu fixed-point blackbody. Significant advances in absolute radiometry have been made in the last 30

An Automated Video-Based System For Iris Recognition

June 2, 2009
Author(s)
Yooyoung Lee, P. Jonathon Phillips, Ross J. Micheals
We have successfully implemented a Video-based Automated System for Iris Recognition (VASIR), evaluating its successful performance on the MBGC dataset. The proposed method facilitates the ultimate goal of automatically detecting an eye area, extracting

CCPR-S1 Supplementary Comparison for Spectral Radiance in the range of 220 nm to 2500 nm

June 2, 2009
Author(s)
Boris Khlevnoy, Victor Sapritsky, Bernard Rougie, Charles E. Gibson, Howard Yoon, Arnold A. Gaertner, Dieter Taubert, Juergen Hartmann
In 1997, the Consultative Committee for Photometry and Radiometry (CCPR) initiated a supplementary comparison of spectral radiance in the wavelength range from 220 nm to 2500 nm (CCPR S1) using tungsten -strip filament lamps as transfer standards. Five

Determination of the Electron Escape Depth for NEXAFS Spectroscopy

June 2, 2009
Author(s)
Daniel A. Fischer, K E. Sohn, M D. Dimitriou, Jan Genzer, C Hawker, E. J. Kramer
Depth profiling using near-edge X-ray absorption fine structure (NEXAFS) spectroscopy was used to determine the carbon atom density as a function of depth by analyzing the post-edge signal in NEXAFS spectra. We show that the common assumption in the

Supercontinuum Sources for Metrology

June 2, 2009
Author(s)
John T. Woodward IV, Allan W. Smith, Colleen A. Jenkins, Chungsan Lin, Steven W. Brown, Keith R. Lykke
Supercontinuum (SC) sources are novel laser-based sources that generate a broad, white-light continuum in single mode photonic crystal fibers. Currently, up to 6 W of optical power is available, spanning the spectral range from 460 nm to 2500 nm. Advances

AIR-BRIDGE INTEGRATED STUB FILTER FOR SUB-MILLIMETER WAVE APPLICATIONS

June 1, 2009
Author(s)
Dazhen Gu, Fernando Rodriquez-Morales, Sigfrid Yngvesson
We report a coplanar waveguide notch filter with an integrated air-bridge, designed for operation at sub-millimeter wave frequencies and cryogenic temperatures. The filter is built with a planar slot- ring antenna, which is in turn loaded with a su

Application of the Josephson effect in electrical metrology

June 1, 2009
Author(s)
Samuel P. Benz, Blaise Jeanneret
Over the last 30 years, metrology laboratories have used the quantum behavior of the Josephson effect to greatly improve voltage metrology. The following article reviews the history and present status of the research and development Josephson voltage

Characterization of a Metafilm/Metasurface

June 1, 2009
Author(s)
Christopher L. Holloway, Andrew M. Dienstfrey, Edward E. Kuester
A metafilm (also referred to as a metasurface) is the surface equivalent of a metamaterial. More precisely, a metafilm is a surface distribution of suitably chosen electrically-small scatterers. Metafilms are becoming popular as an alternative to full

Computer-Generated Hologram Cavity Interferometry Test for Large X-Ray Mandrels: Design

June 1, 2009
Author(s)
Guangjun Gao, John P. Lehan, William W. Zhang, Ulf Griesmann, Johannes A. Soons
A glancing incidence interferometric test for large x-ray mirror mandrels, using two computer generated holograms (CGH s), is described. The two CGH s are used to form a double pass glancing incidence system. One layout of the CGH-cavity glancing incidence
Displaying 28401 - 28425 of 73829
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