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Instrumentation, Metrology, and Standards, Three Keys to the Nanotech Kingdom

Published

Author(s)

Michael T. Postek, Kevin W. Lyons
Citation
http://mm.printless-publishing.com/1-4/

Keywords

nanomanufacturing, micromanufacturing, metrology, NNI, National Nanotechnology Initiative

Citation

Postek, M. and Lyons, K. (2009), Instrumentation, Metrology, and Standards, Three Keys to the Nanotech Kingdom, http://mm.printless-publishing.com/1-4/, [online], http://mm.printless-publishing.com/1-4/ (Accessed October 10, 2024)

Issues

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Created May 1, 2009, Updated February 19, 2017