U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications

NIST Authors in Bold

Displaying 2076 - 2100 of 13215

A Prototype of Modeling and Simulation for Sustainable Machining

January 19, 2011
Author(s)
Guodong Shao, Eric Chernow, Deogratias Kibira, Kevin W. Lyons
… techniques have frequently been utilized to analyze manufacturing processes. The simulation of Numerically … savings of time and money. By validating these NC programs in a virtual environment, damage to valuable machines and … can be prevented, and production would not be interrupted in the factory. However, little work has been done in …

GAUSSIAN PROCESS REGRESSION (GPR) REPRESENTATION IN PREDICTIVE MODEL MARKUP LANGUAGE (PMML)

March 29, 2017
Author(s)
Jinkyoo Park, David Lechevalier, Ronay Ak, Max K. Ferguson, Kincho H. Law, Yung-Tsun Lee, Sudarsan Rachuri
… to generate GPR PMML representation using a real data set in the manufacturing domain. … The ASTM Journal of Smart and Sustainable Manufacturing … GAUSSIAN PROCESS REGRESSION (GPR) REPRESENTATION IN PREDICTIVE MODEL MARKUP LANGUAGE (PMML) …

Requirement elicitation for adaptive standards development

September 27, 2021
Author(s)
Marion Toussaint, Sylvere Krima, Allison Barnard Feeney, HERVE PANETTO
… The recent digitization of manufacturing, also referred to as the fourth industrial … complex projects with a long lifecycle, often developed in a predictive environment, which is not aligned anymore … solutions have not evolved to support this shift. In this paper, we discuss the new challenges brought by a …

The Interface Development for Machine Shop Simulation

October 1, 2006
Author(s)
Yan Luo, Yung-Tsun T. Lee
… Modeling and simulation technology is recognized for facilitating training, reducing … quality, and shortening development time. However, this technology remains largely underutilized by industry today. … developed at the National Institute of Standards and Technology, provides neutral data interfaces for integrating …

Rethinking Distributed Ledger Technology

March 20, 2019
Author(s)
David R. Kuhn, Dylan J. Yaga, Jeffrey M. Voas
… this paper we review the properties of distributed ledger technology (DLT) for use in typical data management … Rethinking Distributed Ledger Technology …

2012 Updates to the International Technology Roadmap for Semiconductors (ITRS) Metrology Chapter

January 1, 2013
Author(s)
Christina A. Hacker, Alain C. Diebold
… Technical Working Group was to revise the Metrology Technology Requirements Tables and initiate the new text for the 2013 revision of the International Technology Roadmap for Semiconductors (ITRS). The key areas … needs and in revising the Lithography Metrology Technology requirements tables to clarify critical dimension …

Junction-Isolated Electrical Test Structures for Critical Dimension Calibration Standards

May 1, 2004
Author(s)
Richard A. Allen, Michael W. Cresswell, Loren W. Linholm
… for use as critical dimension (CD) calibration standards. In earlier work, these structures have been electrically … including minimal susceptibility to charging when imaged in a CD scanning electron microscope (CDSEM), better edge … to verify that the features meet uniformity requirements. In this paper, we describe results for determining the …

Using Semantic Web Technologies to Integrate Models to Analytical Tools

November 9, 2015
Author(s)
Peter O. Denno, Mark R. Blackburn
… potential advantages and pitfalls of using semantic web technologies in the process of preparing engineering … prototype to reflect on the benefits of using semantic web technologies as an integrating mechanism. A potential … Using Semantic Web Technologies to Integrate Models to Analytical Tools …

INTERNATIONAL ROADMAP FOR DEVICES AND SYSTEMS TM 2024 METROLOGY

July 9, 2025
Author(s)
Yaw Obeng, Elisabeth Mansfield, Albert Davydov, Bryan Barnes, Andras Vladar
… from devices, systems, and integration of new materials in the semiconductor industry and describes research and … for research and development, and process control in manufacturing environments This metrology roadmap addresses … a long-term view of the challenges, potential solutions, technology, tools, and infrastructure needed to characterize …

An automated workflow for integrating sustainability assessment into parametric part design through standard reference models

August 6, 2020
Author(s)
William Z. Bernstein, Melissa Tensa, Maxwell Praniewicz, Soonjo Kwon, Deverajan Ramanujan
… environmental impact during the design stage often ignore manufacturing-related impacts resulting from the geometric … design models. The developed workflow utilizes the unit manufacturing process information model to evaluate manufacturing-phase resource consumption from process …

Simulation of a Modular Hierarchical Feedback System

July 1, 1982
Author(s)
Howard Bloom, Charles R. McLean, Cita M. Furlani, T J. Johnson, S Milligan, T Fortman
… aspects of the National Bureau of Standards Automated Manufacturing Research Facility (AMRF). The user is assumed … Automated Manufacturing Research Facility (AMRF), Hierarchical Control …

Next Generation Fire Suppression Technology Program: Fy2003 Progress

May 15, 2003
Author(s)
Richard G. Gann
… Department of Defense's Next Generation Fire Suppression Technology Program (NGP) has completed its sixth year of research with a goal to develop and demonstrate technology for economically feasible, environmentally … Next Generation Fire Suppression Technology Program: Fy2003 Progress …

Building and Fire Research Laboratory Activities, Accomplishments, and Recognitions 1999.

February 1, 2000
Author(s)
A J. Fowell
… those we serve, their dedication to quality and excellence in their work, and their commitment to stay at the forefront … many of which are already having significant benefits. In 1999, we maintained our focus on 10 technical objectives … have made substantial progress on each of them as noted in the following pages. Major drivers facing our customers …

NIST Conference Papers Fiscal Year 2017, Volume 2: Communications Technology Laboratory, Information Technology Laboratory, Material Measurement Laboratory

August 22, 2019
Author(s)
Andrea M. Medina-Smith, Kathryn Miller, Karen J. Wick
… Special Publication represents the work of Communications Technology Laboratory, Information Technology Laboratory, and Material Measurement Laboratory … Papers Fiscal Year 2017, Volume 2: Communications Technology Laboratory, Information Technology Laboratory, …
Displaying 2076 - 2100 of 13215
Was this page helpful?