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NIST Authors in Bold

Displaying 10651 - 10675 of 13225

An Independent Measurement System for Testing Automotive Crash Warning Systems

April 2, 2009
Author(s)
Sandor S. Szabo, Joseph A. Falco, Richard J. Norcross
… report describes the National Institute of Standards and Technology's role in the Integrated Vehicle-Based Safety Systems (IVBSS) … vehicles and heavy commercial trucks. NIST's primary role in the program included assisting in the development of …

A Threat Analysis on UOCAVA Voting Systems

December 19, 2008
Author(s)
Andrew R. Regenscheid, Nelson E. Hastings
… overseas voting. The transmission options discussed in this paper are postal mail, telephone, fax, electronic … a threat analysis based on the methodology provided in NIST SP 800-30 for each method. As part of the analysis, … possible. The mitigating controls for each threat provided in this report provide the basis for an effort to develop …

A New Spin on the Doppler Effect

October 17, 2008
Author(s)
Mark D. Stiles, Robert D. McMichael
… spin that accompanies transport of electron charge in ferromagnetic metals. In one manifestation of ferromagnet-current coupling, called … of this spin transfer torque anchors the magnetization in a medium that moves with the electron flow, such that …

Recent Developments in Y STR and Y SNP Analysis

October 16, 2008
Author(s)
John Butler
… studies. Multiplex assays for typing many of these markers in a parallel fashion are mentioned, as are newly available … Recent Developments in Y STR and Y SNP Analysis …

Spectroradiometric Sources

October 16, 2008
Author(s)
Howard W. Yoon, Charles E. Gibson
… climate modeling and global impacts of particles and gases in the atmosphere are some of the studies that benefit from … per unit area of a surface per wavelength interval in typical units of W cm-2 nm-1.Calibrations of the … the United States the National Institute of Standards and Technology (NIST) is the NMI. NIST issues 1000 W (ANSI …

The Collapse of the World Trade Center Twin Towers: A Metallurgist's View

October 16, 2008
Author(s)
Frank W. Gayle
… The National Institute of Standards and Technology (NIST) has completed its four-year investigation … of gaining valuable information for future best practices in building materials and design, and emergency procedures. … given by Frank W. Gayle (NIST) on April 12, 2007, in Symposium X at the Materials Research Society Spring …

Oxide Reliability of SiC MOS Devices

October 12, 2008
Author(s)
Liangchun (. Yu, Kin P. Cheung, Jason P. Campbell, John S. Suehle, Kuang Sheng
… high temperature where SiC devices are expected to excel. In this paper, we report that the thermally grown gate oxide … We further show that even with the current SiC processing technology, devices with 10 cm2 active area can still achieve …

Status of NIST Thermal Insulation Reference Materials

September 1, 2008
Author(s)
Robert R. Zarr
… materials at the National Institute of Standards and Technology (NIST) is presented. This paper describes an … is that a transfer specimen is measured individually in a guarded-hot-plate apparatus. Consequently, the value … individual measurement data for each material specimen. In contrast, a thermal insulation SRM is a batch of …

CODATA recommended values of the fundamental physical constants: 2006

April 1, 2008
Author(s)
Peter J. Mohr, Barry N. Taylor, David B. Newell
… recommended by the Committee on data for Science and Technology (CODATA) for international use. Further, it describes in detail the adjustment of the values of the constants, … The 2006 adjustment takes into account the data considered in the 2002 adjustment as well as the data that became …

Internal Photoemission Spectroscopy of Metal Gate/High-k/ Semiconductor Interfaces

September 30, 2007
Author(s)
Nhan V. Nguyen, Oleg A. Kirillov, Hao Xiong, John S. Suehle
… spectroscopy and photoelectron yield spectroscopy. In the first measurement type, IPE is used to determine the … experiment setup will be also presented. For applications, in this report we will focus mainly on the first aspect of …

Custom Hardware to Eliminate Bottlenecks in QKD Throughput Performance

September 5, 2007
Author(s)
Alan Mink
… The National Institute of Standards and Technology (NIST) high-speed quantum key distribution (QKD) … chip (FPGA) hardware, gaining a factor of 50x improvement in the sifting capacity rate. As we increased the distance … we discovered a number of other performance bottlenecks in our custom hardware. We discuss those bottlenecks along …

Recent Results from the NIST Pulse-Heated Kolsky Bar

September 3, 2007
Author(s)
Timothy J. Burns, Steven Mates, Richard L. Rhorer, Eric P. Whitenton, Debasis Basak
… bar laboratory for measuring dynamic material properties, in support of improved finite-element modeling of high-speed … been developed at the National Institute of Standards and Technology (NIST). The NIST split-Hopkinson pressure bar has … a test sample to a temperature on the order of 1000oC in less than a second, then holding the sample at a fixed …

Towards scaling up trapped ion quantum information processing

June 19, 2007
Author(s)
Dietrich G. Leibfried, David J. Wineland, Brad R. Blakestad, John J. Bollinger, Joseph W. Britton, J Chiaverini, Ryan Epstein, Wayne M. Itano, John D. Jost, Emanuel H. Knill, C. Langer, R Ozeri, Rainer Reichle, Signe Seidelin, Nobuyasu Shiga, Janus Wesenberg
… outperforms conventional computers. Atomic ions confined in an array of interconnected traps represent a potentially … basic requirements have been experimentally demonstrated in one and two qubit experiments. The remaining task is to … to many qubits while minimizing and correcting errors in the system. While this requires extremely challenging …

Comparative Inter-Laboratory Study of Wind Loading on Low Industrial Buildings

May 16, 2007
Author(s)
Bogusz Bienkiewicz, Munehito Endo, Joseph Main, William P. Fritz
… and coordinated by the National Institute of Standards and Technology was employed. Variability in the laboratory wind loading on low buildings was … variability was found for the building of lower height, in suburban wind exposure. This variability was primarily …

Visualization and Modeling of Smoke Transport Over Landscape Scales

May 1, 2007
Author(s)
Glenn P. Forney, William E. Mell
… been developed at the National Institute of Standards and Technology (NIST) for modeling fire spread and smoke … have been adapted to address fire scenarios that occur in the wildland urban interface (WUI) over kilometer-scale … Dynamics Simulator) for fire spread and smoke transport in the wildland-urban interface. The visualization tool is …

Mechanically Robust Spin-On Organosilicates Glasses for Nanoporous Applications

February 7, 2007
Author(s)
Hyun Wook Ro, K Char, Eun-Chae Jeon, H C. Kim, Dongil Kwon, Hae-Jeong Lee, J. H. Lee, Hee-Woo Rhee, Christopher L. Soles, Do Y. Yoon
… cage type silsesquioxane precursors that remain soluble in the reaction solution and can later be covalently … leading to an unparalleled 6-fold increase in elastic modulus, a 4-fold increase in hardness, and 20-fold decrease of the thermal expansion …

Marine Environmental Specimen Bank: Clean Room and Specimen Bank Protocols

January 1, 2007
Author(s)
Rebecca S. Pugh, Michael B. Ellisor, Amanda J. Moors, Barbara J. Porter, Paul R. Becker
… Biomonitoring Specimen Bank (NBSB) was established in 1979 from the pilot Environmental Specimen Bank Program … is maintained at the National Institute of Standards and Technology. Numerous research projects and programs have been developed in collaboration with national and international agencies …

Integration of Nanostructured Materials With MEMS Microhotplate Platforms to Enhance Chemical Sensor Performance

December 1, 2006
Author(s)
Kurt D. Benkstein, C Martinez, Guofeng Li, Douglas C. Meier, Christopher B. Montgomery, Stephen Semancik
… Nanostructured materials have also been showing promise in recent years as chemical sensor materials, owing to … developed at the National Institute of Standards and Technology to gain the benefits of both the materials and the … chemical sensor arrays. Here, we describe our success in overcoming the challenges of integration and the benefits …

International Comparison of Impact Reference Materials (2004)

April 3, 2006
Author(s)
Christopher N. McCowan, G. Roebben, Y. Yamaguchi, S. Lefrancois, Jolene D. Splett, S. Takagi, A. Lamberty
… of Charpy impact test machines. The participants in this study were the Institute for Reference Materials and … of Japan (NMIJ), the National Institute of Standards and Technology in the United States (NIST), and the Laboratoire National …

Bias Reduction in Roughness Measurement through SEM Noise Removal

March 24, 2006
Author(s)
R Katz, C D. Chase, R Kris, R Peltinov, John S. Villarrubia, B Bunday
… width metrics (LWR, CWR) have been dealt with widely in the literature and are becoming semiconductor industry … With the downscaling of semiconductor fabrication technology, the accuracy of these metrics is of increasing … challenge is to separate the image noise (present in any SEM image) from the physically present roughness. An …
Displaying 10651 - 10675 of 13225
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