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NIST Authors in Bold

Displaying 10076 - 10100 of 13225

NIST Big Data Interoperability Framework: Volume 7, Big Data Standards Roadmap

October 22, 2015
Author(s)
Wo L. Chang, David Boyd, Carl Buffington , NBD-PWG NIST Big Data Public Working Group
… Data is a term used to describe the large amount of data in the networked, digitized, sensor-laden, information-driven … of data is outpacing scientific and technological advances in data analytics. To advance progress in Big Data, the NIST Big Data Public Working Group (NBD-PWG) …

Standardization of Smart Grid Customer Interfaces

July 1, 2015
Author(s)
Steven T. Bushby, David G. Holmberg
… modernized “smart grid” is to combine modern communication technology with an improved electric grid to enable energy … consumers to exchange information with energy suppliers in order to collaboratively manage electricity supply and … requirements for those interfaces and emerging standards in the United States that address these issues. …

Applied and Computational Mathematics Division, Summary of Activities for Fiscal Year 2014

June 2, 2015
Author(s)
Ronald F. Boisvert
… and Computational Sciences Division of NIST’s Information Technology Laboratory. Part I (Overview) provides a … projects of particular note this year. This is followed in Part III (Project Summaries) by brief synopses of all … technical talks, and other professional activities in which Division staff members have participated. The …

On-wafer Magnetic Resonance of Magnetite Nanoparticles

May 11, 2015
Author(s)
Charles A. Little, Stephen E. Russek, James C. Booth, Pavel Kabos, Robert J. Usselman
… resonance using integrated microfluidics and microwave technology can significantly reduce cost and sample volumes …

Infrared Optical Properties of Materials

February 24, 2015
Author(s)
Simon G. Kaplan, Leonard M. Hanssen, Raju V. Datla
… Division (SSD) of the National Institute of Standards and Technology (NIST) to provide the infrared optical properties … the calibration service report for customers is provided in Sec. 5 and references are added in Sec. 6. …

A determination of the local acceleration of gravity for the NIST-4 watt balance

January 21, 2015
Author(s)
David B. Newell, Eric J. Leaman, Darine El Haddad, Frank C. Seifert, Leon S. Chao, Yusi A. Cao, Jon R. Pratt, Stephan Schlamminger
… constructed at the National Institute of Standards and Technology in preparation for the redefinition of the International … uncertainty goal for this instrument of a few parts in 108 requires that the local acceleration due to gravity be …

EUV spectra of Rb-like to Ni-like dysprosium ions in an electron beam ion trap

August 12, 2014
Author(s)
Deirdre Kilbane, G. O'Sullivan, Yuri A. Podpaly, John D. Gillaspy, Joseph Reader, Yuri Ralchenko
… was measured at the National Institute of Standards and Technology. The ions were created, trapped, and excited in an electron beam ion trap (EBIT), and the spectra were … recorded with a flat-field grazing-incidence spectrometer in the wavelength range 3nm to 17nm. Tuning the electron beam …

Applied and Computational Mathematics Division, Summary of Activities for Fiscal Year 2013

April 28, 2014
Author(s)
Ronald F. Boisvert
… and Computational Sciences Division of NIST’s Information Technology Laboratory. Part I (Overview) provides a … projects of particular note this year. This is followed in Part III (Project Summaries) by brief synopses of all … technical talks, and other professional activities in which Division staff members have participated. The …

Report: Authentication Diary Study

February 4, 2014
Author(s)
Michelle P. Steves, Mary F. Theofanos
… such as password management software. We were interested in these coping strategies and the “friction points” that … as part of their daily life, as empirical research in that area is currently lacking. …

IMPROVEMENTS TO NIST'S AIR SPEED CALIBRATION SERVICE

September 24, 2013
Author(s)
Iosif I. Shinder, Christopher J. Crowley, Bernard J. Filla, Michael R. Moldover
… conducted by the National Institute of Standards and Technology (NIST): 1. Reduced-uncertainty calibrations of the … that account for the position-dependence of the air speed in the test volume and for window effects on the LDA, 3. …

Applied and Computational Mathematics Division Applied and Computational Mathematics Division: Summary of Activities for Fiscal Year 2012

May 9, 2013
Author(s)
Ronald F. Boisvert
… and Computational Sciences Division of NIST’s Information Technology Laboratory. Part I (Overview) provides a … projects of particular note this year. This is followed in Part III (Project Summaries) by brief synopses of all … technical talks, and other professional activities in which Division staff members have participated. The …

Explosive Standards Forum Recommendations

March 28, 2013
Author(s)
William G. Billotte, Sharon B. Nakich
… by the U.S. Department of Homeland Security Science and Technology Directorate (DHS S&T), collected recommendations … was purposely inclusive and all input was considered in the final analysis phase. Sixteen standards were …

EUV spectra of Rb-like to Cu-like gadolinium ions in an electron beam ion trap

October 8, 2012
Author(s)
Yuri Ralchenko, Deirdre Kilbane, G. O'Sullivan, John D. Gillaspy, Joseph Reader
… ions were made at the National Institute of Standards and Technology. The ions were produced and confined in an electron beam ion trap (EBIT) and the spectra were … recorded with a flat-field grazing- incidence spectrometer in the wavelength range 3-17 nm. Ionization stages from …

SORCE SSI Workshop Summary

July 1, 2012
Author(s)
Joseph P. Rice, Jerald Harder, Martin Snow, Thomas Woods
… gathered at the National Institute of Standards and Technology (NIST) in Gaithersburg, Maryland, for the first Solar Spectral … Mission and other missions. The SORCE science team, in collaboration with NIST and NASA Goddard Space Flight …

Channel Length-Dependent Series Resistance?

June 10, 2012
Author(s)
Jason P. Campbell, Kin P. Cheung, Serghei Drozdov, Richard G. Southwick, Jason T. Ryan, Tony Oates, John S. Suehle
… Despite these virtues, the technique unexpectedly results in a channel length-dependent RSD which is observed across a …

Circuit-Aware Device Reliability Criteria Methodology

September 12, 2011
Author(s)
Jason T. Ryan, Lan Wei, Jason P. Campbell, Richard G. Southwick, Kin P. Cheung, Anthony Oates, John S. Suehle, Phillip Wong
… more difficult challenge with each generation of CMOS technology. The disconnection between conventional … criteria that reflects real-world operation of devices in circuits is proposed and demonstrated. This …

Reliability Study of Au-In Transient Liquid Phase Bonding for SiC Power Semiconductor Devices

May 24, 2011
Author(s)
Brian J. Grummel, Habib A. Mustain, Z. J. Shen, Allen R. Hefner Jr.
… temperature packaging. TLP bonding advances modern solder technology by raising the solder melting point to over 500 °C … traditional Sn-Pb solders. It is also shown here that Au-In TLP bonds exude excellent electrical reliability with … Transient Liquid Phase, Resistivity, EDX, SEM, Indium, Au-In, Reliability, Thermal Cycling …

Toward Privacy Standards Based on Empirical Studies

April 28, 2011
Author(s)
Serge M. Egelman, Erika McCallister
In this paper, we argue that if privacy standards are created … these standards are created with the primary stakeholder in mind: the data subject. Previous privacy and security …

Towards Evaluating World Modeling for Autonomous Navigation in Unstructured and Dynamic Environments

February 4, 2011
Author(s)
R Lakaemper, Rajmohan (. Madhavan
… Commerce Department's National Institute of Standards and Technology (NIST) Measurement Science and Engineering … map (world model) of its surroundings. The work presented in this paper discusses challenges involved and reports on a … extension to a previously developed mapping technique in evaluating world models of such dynamic and unstructured …
Displaying 10076 - 10100 of 13225
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