Infrared Optical Properties of Materials

Published

February 24, 2015

Author(s)

Simon G. Kaplan, Leonard M. Hanssen, Raju V. Datla

Abstract

This document describes the Fourier Transform Infrared Spectrophotometry (FTIS) Facility at the Sensor Science Division (SSD) of the National Institute of Standards and Technology (NIST) to provide the infrared optical properties of materials (IROPM) calibration service, 38075 S, over the infrared spectral range of 1 µm – 25 µm. It is organized as follows. Section 1 introduces the FTIS facility for measuring the infrared reflectance, transmittance, absorptance/ emittance of materials and the services available. Section 2 describes the physics basis for the measurements. Section 3 describes the setups and measurements. Section 4 describes the measurement assurance process with various publications as appendices on the FTIS measurement uncertainties and intercomparisons. The template for the calibration service report for customers is provided in Sec. 5 and references are added in Sec. 6.

Citation

Special Publication (NIST SP) - 250-94

Report Number

250-94

NIST Pub Series

Special Publication (NIST SP)

Pub Type

NIST Pubs

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DOI Link

Keywords

diffuse reflectance, directional hemispherical reflectance, reflectance, Fourier Transform Spectrophotometer, Integrating sphere, specular reflectance, transmittance, absorptance, emittance.

Optical physics and communications

Citation

Kaplan, S. , Hanssen, L. and Datla, R. (2015), Infrared Optical Properties of Materials, Special Publication (NIST SP), National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NIST.SP.250-94 (Accessed September 27, 2021)