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Displaying 7376 - 7400 of 13218

Current status and future directions for in situ transmission electron microscopy

August 6, 2016
Author(s)
M. L. Taheri, Eric Stach, Ilke Arslan, Peter A. Crozier, Kabius Bernd, Thomas LaGrange, Andrew Minor, Seiji Takeda, Mihaela M. Tanase, Jakob B. Wagner, Renu Sharma
… current and future possibilities for the application of in situ transmission electron microscopy to reveal synthesis … a workshop, held at Center for Nanoscale Science and Technology- National Institute of Science and Technology (CNST-NIST), are discussed. We provide a …

Overview of the TREC 2011 Web Track

November 15, 2011
Author(s)
Ian M. Soboroff, Nick Craswell, Charles L. Clarke, Gordon Cormack
… The TREC Web Track explores and evaluates Web retrieval technology over large collections of Web data. In its current incarnation, the Web Track has been active for …

Legal and Technical Requirements for Time and Frequency Metrology

March 2, 2006
Author(s)
Michael A. Lombardi
Who needs time and frequency? This paper answers that question by discussing the technologies and applications that rely on precise time and frequency, and exploring their legal and technical requirements for measurement uncertainty. The technologies and

Electronic Display Metrology--Not a Simple Matter

August 1, 2001
Author(s)
Edward F. Kelley
… can be very difficult to capture accurately and quickly in a meaningful way. With the advent of many new display … with several difficulties that will be reviewed especially in the areas of stray light management/measurement and …

1999 Annual Report to the Office of Management and Budget on the Implementation of OMB Circular A-119 and P.L. 104-113

December 1, 1999
Author(s)
K J. Leuteritz, P W. Cooke
… to report annually to OMB on Federal agency participation in voluntary standards activities. This report also describes … fulfillment of similar requirements of the National Technology Transfer and Advancement Act regarding use of … roles of the National Institute of Standards and Technology. Further actions are recommended to strengthen the …

Flat Panel Display Metrology -- Less than Meets the Eye

July 1, 1999
Author(s)
Edward F. Kelley
… measurement of electronic displays has become important in recent years owing to the advances in flat panel display technologies. A well-defined language … depends upon an unambiguous metrology being firmly in place to provide a level playing field. We will review …

Report of the NIST Workshop on Key Escrow Encryption

June 1, 1994
Author(s)
A Oldehoeft, Dennis K. Branstad
… On June 10, 1994, the National Institute of Standards and Technology (NIST) hosted a one-day workshop to present and discuss key escrow encryption technology, including the recently-approved Escrowed …

Ultrasonic Evaluation Methods Applicable to Polymer Concrete Composites

April 1, 2003
Author(s)
A Garbacz, Edward Garboczi
… and protection of building structures, as well as for manufacturing pre-cast elements. In the case of pre-cast elements as well as repair materials, … Activities of RILEM Technical Committees: TC-151 Adhesion Technology in Concrete Engineering - Physical and Chemical …

Comparison of High- and Low-Voltage X-Ray Mapping of an Electronic Device

February 1, 2001
Author(s)
John A. Small, David S. Bright
… In recent years, field-emission gun scanning electron … characteristic x-rays with energies as low as 150 eV. In conventional x-ray mapping the energy of the electron-beam … improve the lateral resolution of the x-ray maps. In this study, x-ray maps were acquired for Si-K x-rays at …

Fabrication and Electron Microprobe Characterization of Barium-Strontium-Titanate (BST) Films

February 1, 2001
Author(s)
Ryna B. Marinenko, J T. Armstrong, Debra L. Kaiser, Joseph J. Ritter, Peter K. Schenck, C P. Bouldin, J Blendell, Igor Levin
… the compositions determined by electron microprobe were in reasonably good agreement with the nominal compositions … Characterization and Metrology for ULSI Technology, International Conference | | AIP Conference … Proceeding #550 Characterization and Metrology for ULSI Technology 2000: International Conference | AIP …

Report of the 105th & 106th National Conference on Weights and Measures

June 30, 2022
Author(s)
Shelby Bowers, Yvonne Branden, Tina G. Butcher, Richard A. Harshman, Gloria Diane Lee, David Sefcik, Lisa Warfield
… held July 18 - 23, 2021, at the Hyatt Regency Rochester in Rochester, New York. The theme of the meeting was … Committee, Regional Association Meetings, and the Weigh-in-Motion Task Group. …
Displaying 7376 - 7400 of 13218
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