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NIST Authors in Bold

Displaying 14426 - 14450 of 17285

The NIST Meeting Room Phase II Corpus

May 1, 2006
Author(s)
Martial Michel, Jerome G. Ajot, Jonathan G. Fiscus
… Speech Group and Smart Spaces Lab of National Institute of Standards and Technology's Information Technology Laboratory …

International Comparison of Impact Reference Materials (2004)

April 3, 2006
Author(s)
Christopher N. McCowan, G. Roebben, Y. Yamaguchi, S. Lefrancois, Jolene D. Splett, S. Takagi, A. Lamberty
… Institute of Japan (NMIJ), the National Institute of Standards and Technology in the United States (NIST), and the …

The development of procedures for impact testing

February 1, 2006
Author(s)
Thomas A. Siewert, Christopher N. McCowan
This report provides a broad overview of the progress in procedural improvements for impact testing. It includes a short summary of early developments, a discussion of topics that have been the subject of recent research, and a description of the

Single photon source characterization with a superconducting single photon detector

December 26, 2005
Author(s)
Robert Hadfield, Martin Stevens, Stephen Gruber, Aaron J. Miller, Robert E. Schwall, Richard Mirin, Sae Woo Nam
Superconducting single photon detectors (SSPD) based on nanopatterned niobium nitride wires offer single photon counting at fast rates, low jitter, and low dark counts, from visible wavelengths well into the infrared. We demonstrate the first use of an

Ontology Formalization of Product Semantics for Product Lifecycle Management

November 1, 2005
Author(s)
Lalit Patil, Ram D. Sriram
Product Lifecycle Management (PLM) is a concept that takes into account that the development of a product is influenced by knowledge from various stakeholders throughout its lifecycle. Computing environments in the PLM framework are expected to have

FORENSIC STUDY OF THE STEEL IN THE WORLD TRADE CENTER

December 30, 2004
Author(s)
Thomas A. Siewert, Joseph D. McColskey, Christopher N. McCowan, Frank W. Gayle, William E. Luecke, Stephen W. Banovic, Timothy J. Foecke, Richard J. Fields
… In September of 2002, the National Institute of Standards and Technology began a two-year investigation into …

Electrostatic Discharge Protection For Embedded-Sensor Systems-On-a-Chip

October 8, 2004
Author(s)
Javier A. Salcedo, Juin J. Liou, Muhammad Afridi, Allen R. Hefner Jr., Ankush Varma
The robustness of Embedded-Sensor (ES) System-on-a-Chip (SoC) applications involves several design constrains that require a unique assessment. For example, space-efficient electrostatic discharge protection (ESD) must be provided to protect the CMOS

Quartz capillary flow meter for gases

March 1, 2004
Author(s)
Robert F. Berg
This article describes an accurate meter for gas flow rates below 1000 micromol/s. (~1 micromol/s  1.3 cm3/min at 0 °C and 1 atm.) Two gauges measure the input and output pressures as the gas flows through a flow element consisting of either a single

Characterization of Precision Spheres With XCALIBIR

January 1, 2004
Author(s)
Ulf Griesmann, Johannes A. Soons, Quandou (. Wang
The geometry of a nearly spherical surface, for example that of a precision optic, is completely determined by the radius-of-curvature at one point and the deviation from the perfect spherical form at all other points of the sphere. Measurements of radius

Toward a Generic Model for Autonomy Levels for Unmanned Systems (ALFUS)

August 18, 2003
Author(s)
Hui-Min Huang, Elena R. Messina, James S. Albus
Unmanned systems (UMSs) have been deployed to military and civilian operations. UMSs vary widely in their capabilities andcivilian operations. UMSs vary widely in their capabilities and purposes. It would be beneficial to have a set of widely recognized
Displaying 14426 - 14450 of 17285
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