Single photon source characterization with a superconducting single photon detector

Published

December 26, 2005

Author(s)

Robert Hadfield, Martin Stevens, Stephen Gruber, Aaron J. Miller, Robert E. Schwall, Richard Mirin, Sae Woo Nam

Abstract

Superconducting single photon detectors (SSPD) based on nanopatterned niobium nitride wires offer single photon counting at fast rates, low jitter, and low dark counts, from visible wavelengths well into the infrared. We demonstrate the first use of an SSPD, packaged in a commercial cryocooler, for single photon source characterization. The source is an optically pumped, microcavity-coupled InGaAs quantum dot, emitting single photons on demand at 902 nm. The SSPD replaces the second Silicon Avalanche Photodiode (APD) in a standard measurement of the source second-order correlation function, g⁽²⁾τ. The detection efficiency of the superconducting detector system is >2 % (coupling losses included). The SSPD system electronics jitter is 170 ps, versus 550 ps for the APD unit, allowing the source spontaneous emission lifetime to be measured with improved resolution.

Citation

Optics Express

Volume

13

Issue

26

Pub Type

Journals

Keywords

SSPD, superconducting single photon detectors

Citation

Hadfield, R. , Stevens, M. , Gruber, S. , Miller, A. , Schwall, R. , Mirin, R. and Nam, S. (2005), Single photon source characterization with a superconducting single photon detector, Optics Express (Accessed October 11, 2025)