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NIST Authors in Bold

Displaying 12576 - 12600 of 17284

NIST Impact on Patenting

October 31, 2016
Author(s)
Gary W. Anderson Jr.
… The National Institute of Standards and Technology’s (NIST) mission is to “promote U.S. …

Heterodyne interferometer with subnanometer accuracy

August 24, 2014
Author(s)
Darine El Haddad, Frank C. Seifert, Stephan Schlamminger, Leon S. Chao, David B. Newell, Jon R. Pratt
… link to Planck constant at the National Institute of Standards and Technology. The light source is an …

The Metrology of Counting Protein Particles

July 13, 2013
Author(s)
Dean C. Ripple, Michael J. Carrier, Richard E. Cavicchi, Christopher B. Montgomery, Zhishang Hu
… accurate particle counts with traditional calibration standards and methods. We describe the development of …

The Metrology of Counting Protein Particles

March 18, 2013
Author(s)
Dean C. Ripple, Michael J. Carrier, Richard E. Cavicchi, Christopher B. Montgomery, Zhishang Hu
… accurate particle counts with traditional calibration standards and methods. We describe the development of …

Stable Field Emission from Nanoporous Silicon Carbide

February 15, 2013
Author(s)
Myung Gyu Kang, Henri Lezec, Fred Sharifi
A new method for fabrication of high current density field emitters based on nanoporous silicon carbide is presented. The emitters are monolithic structures which do not require high temperature gas phase synthesis and the process is compatible with

Calibration and uncertainty assessment for certified reference gas mixtures

January 13, 2011
Author(s)
Franklin R. Guenther, Antonio M. Possolo
The method to build an analysis function described in ISO 6143, Gas analysis - Comprarison methods for determining and checking the composition of calibration gas mixtures, is extended to recognize the typically small number of instrumental readings

The Semantics of Modules in Common Logic

January 20, 2010
Author(s)
Fabian M. Neuhaus
Common Logic (CL) is an ISO standard that specifies a family of knowledge representation languages. The function of modules within CL is to support local context with a local domains of discourse. Modules play a crucial role since they enable users to

Improved implementation of the Alicki Van Ryn nonclassicality test for a single particle using Si detectors

April 15, 2009
Author(s)
Sergey V. Polyakov, Alan L. Migdall, Giorgio Brida, Ivo P. Degiovanni, Marco Genovese, Fabrizio Piacentini, V Schettini, Nicolas Gisin
Recently a test of nonclassicality for a single qubit was proposed R. Alicki and N. Van Ryn, J. Phys, A: Math. Theor. 41, 062001 2008. We present an optimized experimental realization of this test leading to a 46standard deviation violation of classicality

FY 1998 Materials Reliability Division Annual Report

October 16, 2008
Author(s)
H I. McHenry
The technical activities of the Materials Reliability Division during Fiscal year 1998 are summarized. The Division has eighteen research projects in five program areas: Metals Processing (3), Ultrasonic Characterization of Materials (9), Electronic

An Octagonal Architecture for High Strength PIT Nb 3 Sn Conductors

June 6, 2006
Author(s)
L. R. Motowidlo, E Barzi, D. Turrioni, Najib Cheggour, Loren F. Goodrich
Powder-in-Tube (PIT) Nb 3Sn conductors have been fabricated utilizing a low-cost intermetallic Cu 5Sn 4 powder as the tin source. A novel octagonal PIT design that incorporates dispersion strengthened copper as well as a hexagonal PIT design were

Comment on the paper Metrologia 42 49-57 (2005) by K. Szymaniec et al,

February 21, 2006
Author(s)
Steven R. Jefferts, F Levi
A recent evaluation of the accuracy of National Physical Laboratory (NPL) primary frequency standard NPL CsF1 gives an overall frequency uncertainty of δŅ/Ņ 0 = 1 × 10 -15. This stated uncertainty includes a correction of a frequency bias of δŅ/Ņ 0 = 8 ×

Comment on the Paper Metrologia 42 49-57 (2005) by K. Szymaniec et al,

February 1, 2006
Author(s)
Steven R. Jefferts, F Levi
A recent evaluation of the accuracy of National Physical Laboratory (NPL) primary frequency standard NPL CsF1 gives an overall frequency uncertainty of δŅ/Ņ 0 = 1 × 10 -15. This stated uncertainty includes a correction of a frequency bias of δŅ/Ņ 0 = 8 ×
Displaying 12576 - 12600 of 17284
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