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NIST Authors in Bold

Displaying 3751 - 3775 of 17264

October 2009 SRM Spotlight

October 14, 2009
Author(s)
Regina R. Montgomery
The SRM Spotlight is a newsletter published by the Measurement Services Division for users of NIST standard reference materials. The Spotlight announces new reference materials and provides information about their use. In addition, this newsletter contains

SRM Spotlight

July 9, 2009
Author(s)
Regina R. Montgomery
The SRM Spotlight is a newsletter published by the Measurement Services Division for users of NIST standard reference materials. The Spotlight announces new reference materials and provides information about their use. In addition, this newsletter contains

SRM Spotlight

February 18, 2009
Author(s)
Regina R. Montgomery
The SRM Spotlight is a newsletter published by the Measurement Services Division for users of NIST standard reference materials. The Spotlight announces new reference materials and provides information about their use. In addition, this newsletter contains

SRM Spotlight

December 17, 2008
Author(s)
Regina R. Montgomery
The SRM Spotlight is a newsletter published by the Measurement Services Division for users of NIST standard reference materials. The Spotlight announces new reference materials and provides information about their use. In addition, this newsletter contains

SRM Spotlight July 2008

July 1, 2008
Author(s)
Regina R. Montgomery
The SRM Spotlight is a newsletter published by the Measurement Services Division for users of NIST Standard Reference Materials. The Spotlight announces new reference materials and provides information about their use. In addition, this newsletter contains

Dose calibrator manufacturer-dependent bias in assays of 123I

March 26, 2014
Author(s)
Denis E. Bergeron, Jeffrey T. Cessna, Daniel B. Golas, Rheannan K. Young, Brian E. Zimmerman
Calibration factors for commercial ionization chambers (i.e. dose calibrators) were determined for a solution of 123I; the activity was based on the 1976 NBS standard. A link between the NIST standard and the International Reference System (SIR) was

IEEE Trans on Instrumentation - Forward

April 1, 1999
Author(s)
Norman B. Belecki
… The National Institute of Standards and Technology hosted the 1998 Conference on … the world, for discussions on the latest advances in standards, instrumentation, measurement techniques, and … dc-low frequency, electromagnetic measurements, standards, time and frequency …

Principles of Quantitation: Chromatography

January 12, 2017
Author(s)
Lane C. Sander
… is provided on sample handling, the addition of internal standards, the number of calibrants, the number of replicate … calibration, quantitative analysis, internal standards, response factor …

Reference Metrology Using a Next Generation CD-AFM

May 24, 2004
Author(s)
Ronald G. Dixson, Angela Guerry
… International SEMATECH (ISMT and the National Institute of Standards and Technology (NIST) are working together to … the rapid change in the semiconductor industry, relevant standards are often not available. Consequently, there is … These include measurements on new NIST/ISMT linewidth standards, a reference tool for CD-scanning electron …

National Institute of Standards and Technology Environmental Scan 2020

February 9, 2021
Author(s)
Heather Evans, Kristen K. Greene, William M. Healy, Elizabeth Hoffman, Kate Rimmer, Anna V. Sberegaeva, Neil M. Zimmerman
… The 2020 National Institute of Standards and Technology Environmental Scan provides an … NIST to maintain and advance its leadership in metrology, standards, and technology. However, a broad range of emerging … National Institute of Standards and Technology Environmental Scan 2020 …

Developing Standards for Commercial Electric Vehicle Fueling and Submetering

March 27, 2013
Author(s)
Marc A. Buttler
… NIST plays a role in the development of standards for commercial measuring systems that are used in … 130 and NIST Handbook 44 are published by NIST and contain standards that have been adopted at the National Conference … Developing Standards for Commercial Electric Vehicle Fueling and …

Stability Study of ac Voltage Source using Josephson Voltage Standards

August 30, 2024
Author(s)
Ghislain Granger, Waldemar G. Kuerten Ihlenfeld, Alain Rufenacht, Nathan Flowers-Jacobs, Anna Fox, Raegan Johnson, Jesus Mejia
… stability of < 4 µV/V per year. The National Institute of Standards and Technology (NIST) uses differential sampling to … Study of ac Voltage Source using Josephson Voltage Standards …

Stacked Niobium-MoSi 2 -Niobium Josephson Junctions for AC Voltage Standards

June 1, 2005
Author(s)
Paul Dresselhaus, Yonuk Chong, Samuel Benz
… have proven to be a critical technology for voltage standards. NIST has used SNS junctions for both programmable DC and AC voltage standards. Previous devices have primarily used PdAu as a … junction stacks for application to ac Josephson voltage standards. … Niobium-MoSi 2 -Niobium Josephson Junctions for AC Voltage Standards …

Toward Better Integration of Vehicle Assembly Production Systems

November 15, 2012
Author(s)
Jorge Arinez, John L. Michaloski, Frederick M. Proctor, William G. Rippey, C J. Yen
In today's manufacturing world, system integration often necessitates composing systems of technology that are not designed to interoperate with each other. This inherent incompatibility results in redundant, non-value added work that is required for

OntoSTEP: OWL-DL Ontology for STEP

May 4, 2009
Author(s)
Sylvere Krima, Raphael Barbau, Xenia Fiorentini, Sudarsan Rachuri, Ram D. Sriram
… STEP, standards, semantics, ontology, OWL-DL, EXPRESS …

NIST Cesium Fountains - Current Status and Future Prospects

September 12, 2007
Author(s)
Steven R. Jefferts, Thomas P. Heavner, Thomas E. Parker, Jon H. Shirley
We review the current status of the U.S. Primary Frequency Standard, NIST-F1. NIST-F1 is a laser-cooled cesium fountain based frequency standard with an inaccuracy of less than δ f/f {less than or equal to} 5×10 -16 limited mainly by the radiation field in

Effect of Tribologically-Induced Changes in Surface Termination of Silicon-Containing Diamond-Like Carbon Coatings on the Resistance to Biomolecule Adsorption

August 1, 2022
Author(s)
Cherno Jaye, Daniel A. Fischer, Zixuan Li, Jennings Z. Ye, Jieming Yan, Nicolas Molina, Hsu-Ming Lien, Robert Chrostowksi, Jianliang Lin, Mangolini Mangolini
Silicon-containing diamond-like carbon (DLC) is a class of thin-film materials with excellent mechanical properties, high thermal stability, and good tribological performance over a wide range of environmental conditions. While non-alloyed/non-doped DLCs
Displaying 3751 - 3775 of 17264
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