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PUBLICATIONS

Diagnostics of 'Colossal' Magnetoresistance Manganate Films by Raman Spectroscopy

Published

Author(s)

V B. Podobedov, D B. Romero, A Weber, Joseph P. Rice, R Schreekala, M Rajeswari, R Ramesh, T Venkatesan, H D. Drew

Abstract

Polarized Raman scattering by phonons is used to characterize thin films prepared by laser ablation of a lanthanum manganese oxide target. It was found that in the temperature range from 6 K to 300 K phonon spectra of La0.7Ca0.3MnO3 films exhibit observable differences from those in bulk materials (microcrystalline ceramics and single crystals). A significant difference was found in the spectra of as-grown films compared to those annealed in oxygen at 800 degrees C. The observed Raman peaks and their linewidths exhibit an irregular temperature dependence near Tc. A correlation of Raman data with magnetization of the sample was also found.
Citation
Applied Physics Letters
Volume
73
Issue
No. 22
Pub Type
Journals

Keywords

LCMO film, phonon, Raman scattering

Citation

Podobedov, V. , Romero, D. , Weber, A. , Rice, J. , Schreekala, R. , Rajeswari, M. , Ramesh, R. , Venkatesan, T. and Drew, H. (1998), Diagnostics of 'Colossal' Magnetoresistance Manganate Films by Raman Spectroscopy, Applied Physics Letters (Accessed October 13, 2024)

Issues

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Created October 31, 1998, Updated October 12, 2021