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Displaying 3751 - 3775 of 4637

Modeling early breakdown failures of gate oxide in SiC power MOSFETs

July 14, 2016
Author(s)
Zakariae Chbili, Asahiko Matsuda, Jaafar Chbili, Jason T. Ryan, Jason P. Campbell, Mhamed Lahbabi, D. E. Ioannou, Kin P. Cheung
… We argue that a local increase in leakage current via trap-assisted-tunneling (TAT) leads to early oxide breakdown. …

POSS modified cellulose for improving flammability characteristics of polystyrene

April 2, 2010
Author(s)
Douglas M. Fox, Mauro Zammarano, Jeffrey W. Gilman, Jieun Lee, Eric Balsley, Erica Ford
Due to its strength, charring ability, and biodegradability, cellulose-based reinforced polymers have received considerable attention. However, its high polarity, large molecular size, and solvent resistivity, have often resulted in immiscible or

Chip scale atomic devices

March 13, 2007
Author(s)
Svenja A. Knappe, P Schwindt, Vladislav Gerginov, V Shah, Alan Brannon, Brad Lindseth, Li-Anne Liew, Hugh Robinson, John Moreland, Z Popovic, Leo W. Hollberg, John E. Kitching
We give an overview over our research on chip-scale atomic devices. By miniaturizing optical setups based on precision spectroscopy, we develop small atomic sensors and atomic references such as atomic clocks, atomic magnetometers, and optical wavelength
Displaying 3751 - 3775 of 4637
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