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NIST Authors in Bold

Displaying 1326 - 1350 of 1916

Data Loss Prevention

March 29, 2010
Author(s)
Simon Liu, D. Richard Kuhn
… In today's digital economy, data enters and leaves enterprises' …

NISURF-II, An Upgraded Surface Measuring Facility

September 1, 2001
Author(s)
S Z. Zahwi, M F. Koura, Thomas Brian Renegar, A M. Mekawi
… running in the HP BASIC environment, which controlled a digital voltmeter data acquisition unit through a general …

Ultrastable Laser Array at 633 nm for Real-Time Dimensional Metrology

July 1, 2001
Author(s)
John R. Lawall, J Pedulla, Y LeCoq
We describe a laser system for very high-accuracy dimensional metrology. A sealed-cavity helium-neon laser is offset-locked to an iodine-stabilized laser in order to realize a secondary standard with higher power and less phase noise. Synchronous averaging

Ultrastable Laser Array at 633 nm for Real-Time Dimensional Metrology

January 1, 2001
Author(s)
Y Lecoq, J Pedulla, John Lawall
We describe a laser system for very high-accuracy dimensional metrology. A sealed-cavity helium-neon laser is offset-locked to an iodine-stabilized laser in order to realize a secondary standard with higher power and less phase noise. Synchronous averaging

Privilege Management of Mobile Agents

October 1, 2000
Author(s)
Wayne Jansen, Athanasios T. Karygiannis
Most mobile agent systems use internal data structures within an agent to control and specify its security requirements and properties. These structures typically contain authorization information regarding access to computational resources on distributed

NIST Random Profile Roughness Specimens and Standard Bullets

January 1, 2000
Author(s)
Jun-Feng Song, Theodore V. Vorburger, Robert A. Clary, Michael L. McGlauflin, Eric P. Whitenton, Christopher J. Evans
Based on the numerical controlled (NC) diamond turning process used previously for manufacturing random profile roughness specimens, two prototype standard bullets were developed at the National Institute of Standards and Technology (NIST). These standard

NIST Random Profile Roughness Specimens and Standard Bullets

January 1, 2000
Author(s)
Jun-Feng Song, Theodore V. Vorburger, Christopher J. Evans, Michael L. McGlauflin, Eric P. Whitenton, Robert A. Clary
Based on the numerical controlled (NC) diamond turning process used previously for manufacturing random profile roughness specimens, two prototype standard bullets were developed at the National Institute of Standards and Technology (NIST). These standard

IEEE-P1451.2 Smart Transducer Interface Module

September 11, 1996
Author(s)
Stan Woods, David Rasmussen, Michael Mattes, Kang B. Lee, Norm Lecomte, John Houldsworth, Fernando Gen_kuong, Micahel Geipel, Edwin El-kareh, Steven Cranmer, S Chen, Januz Bryzek
… discussed. Detailed descriptions of the STIM, TEDS, digital interface, and plug-and-play operation are also …
Displaying 1326 - 1350 of 1916
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