Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

A Low Noise Latching Comparator Probe for Waverform Sampling Applications



David I. Bergman, Bryan C. Waltrip


A new latching comparator probe is described. The probe is being developed as part of an effort to extend voltage measurement capability in the 10 Hz to 1 MHz frequency range. The probe offers an input voltage range of ±10V, input impedance of 1 MΩ}, and noise referred to the input as low as 55 υV rms. The probe's 3 dB bandwidth is approximately 20 MHz. Total harmonic distortion is as low as -93 dB at 50 kHz. Gain flatness is within ±10 ppm from 100 Hz to 100 kHz. Improved step settling performance is achieved using a technique that minimizes circuit thermal errors. A frequency compensated, 1 MΩ} input impedance, 22:1 attenuator is further compensated with a digital filtering algorithm allowing 100 V pk pulses in the microsecond regime to be measured with 100 ppm accuracy.
IEEE Transactions on Instrumentation and Measurement


comparator, frequency compensation, signal sampling, successive approximation


Bergman, D. and Waltrip, B. (2002), A Low Noise Latching Comparator Probe for Waverform Sampling Applications, IEEE Transactions on Instrumentation and Measurement, [online], (Accessed July 14, 2024)


If you have any questions about this publication or are having problems accessing it, please contact

Created April 30, 2002, Updated October 12, 2021