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NIST Authors in Bold

Displaying 4726 - 4750 of 7112

Poisson transition rates from time-domain measurements with finite bandwidth

March 17, 2006
Author(s)
Ofer Naaman, Joe Aumentado
We show that in realistic time-domain measurements of a Poisson two-level system, the observed transition rates are renormalized downwards due to the finite bandwidth of the experiment. This effect introduces systematic errors in estimating the system''s

NIST Facility for Color Rendering Simulation

May 13, 2005
Author(s)
Wendy L. Davis, J L. Gardner, Yoshihiro Ohno
The color rendering index (CRI) does not adequately assess the color rendering properties of solid-state light sources. An improved metric will be critical to the development of such new light sources for general lighting applications. A facility for color

Tip Characterization for Dimensional Nanometrology

January 1, 2004
Author(s)
John S. Villarrubia
Abstract: Technological trends are increasingly requiring dimensional metrology at size scales below a micrometer. Scanning probe microscopy has unique advantages in this size regime, but width and roughness measurements must be corrected for imaging

Near Unity Absorption in Tungsten films

December 19, 2003
Author(s)
Danna Rosenberg, Sae Woo Nam, Aaron J. Miller, Arto Salminen, Erich N. Grossman, Robert E. Schwall, John M. Martinis
… including quantum key distribution and quantum computing. Increasing the absorption of these devices from …

Combinatorial Edge Delamination Test for Thin Film Adhesion Concept, Procedure, Results

July 1, 2003
Author(s)
Martin Y. Chiang, J He, R Song, Alamgir Karim, Wen-Li Wu, Eric J. Amis
A high-throughput combinatorial approach to edge delamination test is proposed to map the failure of adhesion as a function of both temperature and film thickness in a single step. In this approach, a single specimen of a thin film bonded to a substrate

Spectral Data for the Chandra X-Ray Observatory

June 1, 2003
Author(s)
Larissa Podobedova, Arlene Musgrove, Daniel E. Kelleher, Joseph Reader, Wolfgang L. Wiese, J S. Coursey, Karen J. Olsen
Tables of critically compiled wavelengths, line classifications, and transition probabilities are given for ionized spectra of neon (Ne V to Ne VIII), magnesium (Mg V to Mg X), silicon (Si VI to Si XII) and sulfur (S VIII to S XIV) in the 20 to 170 region

Intelligent Systems: Architectures, Design, Control

December 31, 2002
Author(s)
A Meystel, James S. Albus
This book addresses the theoretical foundations for the design of intelligent systems. It presents an approach based on loops of interacting components arranged in a multiresolutional hierarchy of layers. It proposes computational processes of focusing

Investigation of Velocity Boundary Conditions in Counterflow Flames

January 1, 2002
Author(s)
W C. Park, Anthony Hamins
The effects of velocity boundary conditions on the structure of methane-air nonpremixed counterflow flames were investigated by two-dimensional numerical simulation. Two low global strain rates, 12 s-1 and 20 s-1, were considered for comparison with

A New Stable Speed Test Apparatus for Milling

May 1, 2001
Author(s)
J P. Snyder, Jon R. Pratt, Matthew A. Davies, S J. Smith
This paper describes a new device that uses a non-contact force actuator in conjunction with spindle rotation to produce an impulsive periodic driving force on the tool at the tooth passing frequency. Measurements are made of the applied and of the

Embracing Uncertainty: Modeling Uncertainty in EPMA - Part II

January 1, 2001
Author(s)
Nicholas Ritchie
This, the second in a series of articles present a new framework for considering the computation of uncertainty in electron excited X-ray microanalysis measurements, will discuss matrix correction. The framework presented in the first article will be

Equation of State for Polymer Chains in Good Solvents

February 1, 2000
Author(s)
L L. Lue
A free-energy model is developed for polymer chains in good solvents. This model, which combines the ideas of polymer field theory with liquid-state theory, is valid in the dilute, semidilute, and concentrated regimes. The model is compared against

Report on the NIST Java TM AES Candidate Algorithm Analysis

November 25, 1999
Author(s)
James F. Dray Jr.
NIST solicited candidate algorithms for the Advanced Encryption Standard in a Federal Register Announcement dated September 12, 1997. Fifteen candidates were submitted, and NIST has subsequently worked with a worldwide community of cryptanalysts and

The NIST Length Scale Interferometer

July 23, 1999
Author(s)
John S. Beers, William B. Penzes
The National Institute of Standards and Technology (NIST) interferometer for measuring graduated length scales has been in use since 1965. It was developed in response to the redefinition of the meter in 1960 from the prototype platinum-iridium bar to the

The NIST Length Scale Interferometer

May 1, 1999
Author(s)
John S. Beers, William B. Penzes
The National Institute of Standards and Technology (NIST) interferometer for measuring graduated length scales has been in use since 1965. It was developed in response to the redefinition of the meter in 1960 from the prototype platinum-iridium bar to the

Mechanical Hardness: Atomic-Level Calculations for Diamond-Like Materials

September 1, 1998
Author(s)
D G. Clerc
Calculations of atomic-level mechanical hardness are reported for fice diamond-like materials: diamond, silica, β-silicon-carbide, β-boron-nitride, and boron phosphide. These calculations employ a hardness model based on screened electrostatics and elastic
Displaying 4726 - 4750 of 7112
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