Singular Current Density in the Planar Superconductor/Normal Metal/Superconductor Junction

Published

March 1, 2002

Author(s)

R D. Spal

Abstract

Interfacial resistivity (p) is crucial in limiting the maximum current density (J_n^max) in certain superconductor/metal junctions: as p decreases, J_n^max keeps rising until ultimately limited by the superconductor's critical current density. This little known effect is theoretically studied in a circuit with junctions formed by two superconducting contacts on the same face of a normal metal rectangular bar. The corresponding singularly perturbed mixed boundary value problem is solved numerically, and J_n^max is computed over a wide range of p and {l}, the gap between the contacts. Scaling behavior is found, and used to obtain an approximate formula for J_n^max (p,{l}).

Citation

Journal of Applied Physics

Volume

91

Issue

No. 5

Pub Type

Journals

Keywords

conformal mapping, electrical impedance tomography, interfacial resistivity, junction, Laplace's equation

Citation

Spal, R. (2002), Singular Current Density in the Planar Superconductor/Normal Metal/Superconductor Junction, Journal of Applied Physics (Accessed October 15, 2025)