Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications

NIST Authors in Bold

Displaying 1126 - 1150 of 3086

Storage Conditions for High-Accuracy Composition Standards of AlGaAs

May 1, 2005
Author(s)
Kristine A. Bertness, Alexana Roshko, S. E. Asher, Craig L. Perkins
… was examined in more detail with time-of-flight secondary ion mass spectrometry (TOF-SIMS). Surface oxides appeared to … surface contamination, time-of-flight secondary ion mass spectroscopy …

Cure temperature influences electrical properties via carbon nanotube-rich domain formation

July 27, 2016
Author(s)
Chelsea S. Davis, Nathan D. Orloff, Jeremiah W. Woodcock, Christian J. Long, Kevin A. Twedt, Bharath NMN Natarajan, Jonathan E. Seppala, Jabez J. McClelland, Jan Obrzut, James A. Liddle, Jeffrey W. Gilman
… metrology techniques such as scanning lithium-ion microscopy and microwave cavity perturbation, new … aggregation, carbon nanotubes, dispersion, ion microscopy, metrology, microwave, nanocomposites, …

Modeling the Fillet Lifting Defect

September 11, 1999
Author(s)
Clare Bailey, William J. Boettinger
… to predict the behavior of two solder materials -- the tin-lead eutectic (Sn63Pb37) and Sn95Pb5 -- during their …

Chip-Scale Atomic Frequency References

September 16, 2005
Author(s)
John E. Kitching, Svenja A. Knappe, Li-Anne Liew, P Schwindt, Vladislav Gerginov, V Shah, John Moreland, Alan Brannon, J Breitbarth, Z Popovic, Leo W. Hollberg
… Proc. 2005 ION-GNSS Conf. …
Displaying 1126 - 1150 of 3086
Was this page helpful?