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Search Publications

NIST Authors in Bold

Displaying 51 - 75 of 3084

Optimized superconducting detectors using the proximity effect in Ti/TiN multilayers

June 14, 2013
Author(s)
David P. Pappas, Michael R. Vissers, Jiansong Gao, Martin O. Sandberg, David S. Wisbey, Kent D. Irwin
… We apply the superconducting proximity effect in TiN/Ti multi-layers films to tune the critical temperature, … higher for resonators in the GHz range. Both trilayers of TiN/Ti/TiN and thicker multilayer films were prepared, demonstrating … superconducting detectors using the proximity effect in Ti/TiN multilayers …

Design and testing of a software feedback loop for RF power leveling

December 12, 2008
Author(s)
Xiaohai Cui, Thomas P. Crowley
… 30 ppm. In this system, a bolometric sensor with a Type IV power meter is used to detect the power. Feedback is … DC substituted power that is caused by loading of the Type IV when it is connected to the Type II. The new leveling … RF power, microwave power, bolometer, Type IV power meter …

The Mobilities of NO + (CH 3 CN)n Cluster Ions (n=0-3) Drifting in helium-Acetonitrile Mixtures

December 1, 1996
Author(s)
J A. de Gouw, L N. Ding, M Krishnamurthy, H S. Lee, E B. Anthony, V M. Bierbaum, S R. Leone
… The mobilities of NO+(CH 3 CN) n cluster ions (N=0-3) drifting in helium and in mixtures of helium and … of the geometric cross sections of the different cluster ions. The rate constants for the various cluster formation … 2 and NO + (CH 3 CN) 3 , the drift velocities for these ions are found to be strongly dependent on the acetonitrile …

Scanning Ion Microscopy with Low Energy Lithium Ions

July 1, 2014
Author(s)
Kevin A. Twedt, Lei Chen, Jabez J. McClelland
… Using an ion source based on photoionization of laser-cooled lithium atoms, we have developed a scanning ion microscope with probe sizes of a few tens of nanometers … in ion microscopy when detecting backscattered ions, due to a decreased interaction volume and the potential …

Mass Absorption Coefficient of Tungsten for 1600-2100 eV

February 1, 2002
Author(s)
Zachary H. Levine, S Grantham, I McNulty
… and a synchrotron source. This region includes the M IV and M V edges. The two tungsten films had thicknesses of … of tungsten, and some additional constant factors. The M V,IV edges have widths (10%-90% after backgroundsubtraction) of … M-sub-IV edge, M-sub-V edge, mass absorption coefficient, tungsten …

Mass Absorption Coefficient of Tungsten, 1600 eV to 2100 eV

January 24, 2002
Author(s)
Zachary H. Levine, S Grantham, I McNulty
… and a synchrotron source. This region includes the M IV and M V edges. The two tungsten films had thicknesses of … of tungsten, and some additional constant factors. The M V,IV edges have widths (10%-90% after backgroundsubtraction) of … M-sub-IV edge, M-sub-V edge, mass absorption coefficient, tungsten …

Mass Absorption Coefficient of Tungsten, 1606-2100 eV

January 1, 2002
Author(s)
Zachary H. Levine, S Grantham, I McNulty
… and a synchrotron source. This region includes the M IV and M V edges. The two tungsten films had thicknesses of … of tungsten, and some additional constant factors. The M V,IV edges have widths (10%-90% after backgroundsubtraction) of … M-sub-IV edge, M-sub-V edge, mass absorption coefficient, tungsten …

X-Ray Spectroscopy of Trapped Ions With a Microcalorimeter on the NIST Electron Beam Ion Trap

December 1, 2002
Author(s)
E Takacs, John D. Gillaspy, L P. Ratliff, K Makonyi, J M. Laming, E Silver, H. Schnopper, M Barbera, J. Beeman, E. E. Haller, N. Madden
… The electron beam ion trap (EBIT) was invented about 15 years ago. Judging from … and study the structure and interactions of highly charged ions. Today, EBITs exist in several different laboratories … in a variety of fields of research where multiply charged ions relevant. Recent astrophysical missions by NASA and …

Performance of a C 60 + Ion Source on a Dynamic SIMS Instrument

July 1, 2006
Author(s)
Albert J. Fahey, John G. Gillen, P Chi, Christine M. Mahoney
… An IonOptika [1] C60+ ion source has been fitted onto a CAMECA [1] ims-4f. Stable ion beams of C60+ and C602+ have been obtained with typical … able to be focussed into a spot size of ~1 ?m and scanning ion images acquired. We have performed analyses to … Buckministerfullerene, cluster ion beams, ion source, SIMS ion source …

Noninvasive monitoring of ion current and ion energy during plasma processing

July 15, 2008
Author(s)
Mark A. Sobolewski
… technique has been developed for noninvasive monitoring of ion energy and ion current in plasma reactors. The technique relies on … electrical waveforms, the technique determines the total ion current, the plasma potential and sheath voltage … ion current, ion energy, electrical measurements, inductively …

Cold atomic beam ion source for focused ion beam applications

July 23, 2013
Author(s)
Brenton J. Knuffman, Adam V. Steele, Jabez J. McClelland
… We report measurements and modeling performed on an ion source based on ionization of a laser-cooled atomic beam. … for use in next-generation, high-resolution focused ion beam (FIB) systems. Our measurements of total ion current as a function of ionization conditions support a …

Inter-ion Coulomb interactions in a Magneto-Optical Trap Ion Source

May 19, 2011
Author(s)
Jabez J. McClelland, Brenton J. Knuffman, Adam V. Steele
… We have investigated the role played by inter-ion Coulomb interactions in a magneto-optical trap ion source (MOTIS). Using a Monte Carlo simulation accounting … MOTIS, ion beams, coulomb replusion … Inter-ion Coulomb interactions in a Magneto-Optical Trap Ion Source …

Ion-Molecule Reactions and Ion Energies in CF 4 Discharges

December 1, 1999
Author(s)
B. Peko, I. V. Dyakov, R. Champion, MVVS. Rao, James K. Olthoff
… E/N values ranging from 4 x 10 -18 V m 2 (4 to 25 kTd). Ion energy and ion intensity data for the Townsend discharges are analyzed … cross sections, dissociative charge transfer, ion energies, ion molecule reactions, Townsend discharge … Ion-Molecule Reactions and Ion Energies in CF 4 Discharges …

High-brightness Cs focused ion beam from a cold-atomic-beam ion source

May 2, 2017
Author(s)
Adam V. Steele, Andrew Schwarzkopf, Jabez J. McClelland, Brenton Knuffman
… of focal spot size and brightness in a focused ion beam system utilizing a laser-cooled atomic beam source … than the highest brightness observed in a Ga liquid metal ion source. The behavior of brightness as a function of beam … as next-generation circuit edit and nanoscale secondary ion mass spectrometry. …

Magneto-Optical-Trap-Based, High Brightness Ion Source for Use as a Nanoscale Probe

August 21, 2008
Author(s)
James L. Hanssen, Shannon B. Hill, Jon Orloff, Jabez J. McClelland
… on the demonstration of a low emittance, high brightness ion source based on magneto-optically trapped neutral atoms. Our source has ion optical properties comparable to or better than those of the commonly used liquid metal ion source. In addition, it has several advantages that offer …

Ion Solvation in Water Acetonitrile Mixtures

January 1, 2001
Author(s)
Raymond D. Mountain
… The results of a preliminary molecular dynamics study of ion (NA+ and Cl-) solvation and association in water, … is expected to be an important factor governing ion solvation and association. Results for ions in pure water … than the temperature in determining the degree of ion association. Preliminary results for the mixtures are …

The Discovery of Type-IV Binary Fluid Phase Behavior

October 16, 2008
Author(s)
Johanna Levelt Sengers
… mixture for constant excluded volume uncovered the Type-IV phase diagram as a transition between Type-II and Type-III … meets the common boundary of regions of Type-II and Type-IV at what Meijer coined the Van Laar point in 1989. As early … explicitly. He postulated and proved the existence of Type-IV. Aspects of his proof are discussed. …

Micro-fabricated stylus ion trap

August 7, 2013
Author(s)
Kyle S. McKay, Christian L. Arrington, Ehren D. Baca, Jonathan J. Coleman, Yves Colombe, Patrick Finnegan, Dustin A. Hite, Andrew E. Hollowell, Robert Jordens, John D. Jost, Dietrich G. Leibfried, Adam M. Rowen, Ulrich J. Warring, David J. Wineland, David P. Pappas, Andrew C. Wilson
… stylus Paul trap was designed to confine a single atomic ion for use as a sensor to probe the electric-field noise of … with the UV-LIGA technique to reduce the distance of the ion from the surface of interest. We detail the fabrication … environment. After cooling a motional mode of the ion at 4 MHz close to its ground state (n = 0.34 � 0.07), the …

Advances in source technology for focused ion beam instruments

April 1, 2014
Author(s)
Noel Smith, John Notte, Adam V. Steele
… Owing to the development of new ion source technology, users of focused ion beams (FIBs) have an increasingly wide array of uniquely … capable platforms to choose from. Specifically, the new ion sources are able to offer superior performance in several … ion sources, focused ion beams, inductively coupled plasma, …

Negative Cesium Sputter Ion Source for Generating Cluster Primary Ion Beams for Secondary Ion Mass Spectrometry Analysis

April 1, 2001
Author(s)
John G. Gillen, R L. King, B Freibaum, R Lareau, J Bennett, F Chmara
… The use of a cluster (or polyatomic) primary ion projectile for organic SIMS has been demonstrated to … use of a commercially available negative cesium sputter ion as a means of generating cluster ion beams on our Cameca IMS 4F and 6F magnetic sector SIMS … cluster beam, depth profiling, organic secondary ion mass spectrometry …

Motional Squeezing for Trapped Ion Transport and Separation

August 20, 2021
Author(s)
Robert Sutherland, Shaun Burd, Daniel Slichter, Stephen Libby, Dietrich Leibfried
… Transport, separation, and merging of trapped ion crystals are essential operations for most large-scale … framework, we develop a new, general protocol for trapped ion transport, separation, and merging. We show that motional squeezing can prepare an ion wave packet to enable transfer from the ground state of …

Helium Ion Microscopy: A New Technique for Semiconductor Metrology and Nanotechnology

January 1, 2007
Author(s)
Michael T. Postek, Andras Vladar, John A. Kramar, L A. Stern, John Notte, Sean McVey
… The Helium Ion Microscope (HIM) offers a new, potentially disruptive … the helium ions, it is theoretically possible to focus the ion beam into a smaller probe size relative to that of an … achievable. In contrast to the SEM, when the helium ion beam interacts with the sample, it generates …

Multifilmamentary Nb 3 Sn wires reacted in hydrogen gas

May 1, 2002
Author(s)
M Takayasu, R G. Ballinger, Ronald B. Goldfarb, A. A. Squitieri, P. J. Lee, David C. Larbalestier
… superconductive properties of bronze-process and internal-tin-process Nb 3 Sn wires were investigated. Compared with … wire by 12% at 12 T and 14% at 5 T, and in the internal-tin wire by 4% at 12 T and 10% AT 8 t. Hysteresis losses over … by 14% for the bronze wire and by 8% for the internal-tin wire by the hydrogen heat treatment, approximately …
Displaying 51 - 75 of 3084
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