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NIST Authors in Bold

Displaying 451 - 475 of 2769

Testing Three-body Quantum Electrodynamics with Trapped Ti-20 Ions: Evidence for a Z-Dependent Divergence between Experiment and Calculation

October 10, 2012
Author(s)
Lawrence T. Hudson, C T. Chantler, Mark N. Kinnane, John D. Gillaspy, A.T. Payne, L F. Smale, Albert Henins, Joseph N. Tan, J A. Kimpton, E Takacs, K Makonyi, Joshua M. Pomeroy
… for all reported w-line transitions in two- electron ions for Z > 15 are considered, a general divergence becomes … quantum electrodynamics, highly-charged ions, helium-like titanium, electron beam ion trap, … Three-body Quantum Electrodynamics with Trapped Ti-20 Ions: Evidence for a Z-Dependent Divergence between …

Towards scaling up trapped ion quantum information processing

June 19, 2007
Author(s)
Dietrich G. Leibfried, David J. Wineland, Brad R. Blakestad, John J. Bollinger, Joseph W. Britton, J Chiaverini, Ryan Epstein, Wayne M. Itano, John D. Jost, Emanuel H. Knill, C. Langer, R Ozeri, Rainer Reichle, Signe Seidelin, Nobuyasu Shiga, Janus Wesenberg
… ion trap, quantum information processing, scale-up … Towards scaling up trapped ion quantum information processing …

Energy Levels of 4f3 in the Free Nd3+ Ion From Emission Spectra

February 1, 2006
Author(s)
J-F Wyart, Ali Meftah, Annik Bachelier, Jocelyne Sinzelle, Wan-U Lydia Tchang-Brillet, Norbert Champion, Nissan Spector, J Sugar
… to 37 levels of the 4f3 ground configuration in the free ion Nd3+. The levels 4f3 4F3/2 and 4I11/2, responsible for … Nd3+:LaCl3 are 3 to 5 percent smaller than in the free ion. … emission spectrum, energy levels, free-ion, neodymium, parametric fits, triply-ionized, wavelengths …

UV-sensitive superconducting nanowire single photon detectors for integration in an ion trap

April 17, 2017
Author(s)
Daniel H. Slichter, Varun B. Verma, Dietrich G. Leibfried, Richard P. Mirin, Sae Woo Nam, David J. Wineland
… electrode radio-frequency Paul traps for use in trapped ion quantum information processing. We operate detectors integrated into test ion trap structures at 3.8 K both with and without typical … Ion trap, Quantum detectors, Quantum computing, Quantum … nanowire single photon detectors for integration in an ion trap …

Product ion distributions using H3O+ proton-transfer-reaction time-of-flight mass spectrometry (PTR-ToF-MS): mechanisms, transmission effects, and instrument-to-instrument variability

February 27, 2025
Author(s)
Michael Link, Megan Claflin, Christina Cecelski, Ayomide Akande, Delany Kilgour, Paul Heine, Matthew Coggon, Chelsea Stockwell, Andrew Jensen, Jie Yu, Han Huyhn, Jenna Ditto, Carnsten Warneke, William Dresser, Keighan Gemmell, Spiro Jorga, Rileigh Robertson, Joost de Gouw, Timothy Bertram, Jonathan Abbatt, Nadine Borduas-Dedekind, Dustin Poppendieck
… mass spectrometry (PTR-MS) using hydronium ion (H3O+) ionization is widely used for the measurement of … H3O+ ionization, as well as the associated chemistry in an ion–molecule reactor, is known to generate product ion distributions (PIDs) that include other product ions …

Photoexcitation of Free Radicals and Molecular Ions Trapped in Rare-Gas Solids.

May 2, 2011
Author(s)
Marilyn E. Jacox
… The photochemical production of free radicals, molecular ions, and other highly reactive species, their trapping in … Spectrum, Free Radicals, Infrared Spectrum, Molecular Ions, Photoexcitation, Rare-Gas Matrices … Photoexcitation of Free Radicals and Molecular Ions Trapped in Rare-Gas Solids. …

Role of Ion-Beam Processing Time in the Formation and Growth of the High-Nitrogen Phase in Austenitic Stainless Steel

November 1, 2000
Author(s)
D L. Williamson, P J. Wilber, F R. Fickett, S Parascandola
… been prepared as a function of exposure time to a nitrogen ion beam Times from 15 to 4 h were selected with other … below the γ N and was found to be introduced during the Ar-ion sputter-cleaning/heating step used prior to exposure to the N-ion beam. This C-rich layer is punished ahead of the incoming …

High-precision measurements of n = 2 - n = 1 transition energies and level widths in He- and Be- like Argon Ions

March 26, 2018
Author(s)
Jorge Machado, Csilla Szabo-Foster, Jose Paulo Santos, Pedro Amaro, Mauro Guerra, Guojie Bian, Jean-Michel Isac, Paul Indelicato
… and of the 1s2s22p 1P1 → 1s22s2 1S0 line in Be-like argon ions. The highly-charged ions were produced in the plasma of an Electron-Cyclotron … Highly charged ions, He-like argon, Be-like argon, level widths, transition … energies and level widths in He- and Be- like Argon Ions …

Dynamic Partitioning of Neutral Polymers into a Single Ion Channel

June 1, 1999
Author(s)
S. M. Bezrukov, John J. Kasianowicz
… using single nanometer-scale pores formed by protein ion channels. The ionic conductance of a channel depends on … glycol) into two structurally and chemically different ion channels (staphylococcus aureus α-hemolysin and … alamethecin, alpha-hemolysin, diffusion, ion channel, noise analysis, partition coefficient, PEG, …

Measuring the difference in nuclear charge radius of Xe isotopes by EUV spectroscopy of highly charged Na-like ions

November 5, 2018
Author(s)
Roshani Silwal, A. Lapierre, John D. Gillaspy, Joan M. Dreiling, S A. Blundell, Dipti Goyal, A. Borovik, Jr., G Gwinner, A.C.C. Villari, Yuri Ralchenko, Endre Takacs
… extreme ultraviolet spectroscopy of highly charged Na-like ions. The isotope shift of the Na-like D1 (3s 2S1/2 − 3p … EUV spectroscopy, Na-like ions, highly charged ions, EBIT, nuclear radius Category, atomic physics, atomic … Xe isotopes by EUV spectroscopy of highly charged Na-like ions …

Calibration of a Stopping Power Model for Silicon Based on Analysis of Neutron Depth Profiling and Secondary Ion Mass Spectrometry Measurements

June 1, 2002
Author(s)
Kevin J. Coakley, Huaiyu H. Chen-Mayer, George P. Lamaze, David S. Simons, P E. Thompson
… a silicon sample with four delta-doped planes by secondary ion mass spectrometry. In a neutron depth profiling (NDP) … model calibration, neutron depth profiling, secondary ion mass spectrometry, silicon, stopping power, transport of … Based on Analysis of Neutron Depth Profiling and Secondary Ion Mass Spectrometry Measurements …

Determination of Organic Acids in Vaccinium Berry Standard Reference Materials

June 27, 2010
Author(s)
Melissa M. Phillips, Lane C. Sander, Katherine E. Sharpless, Stephen A. Wise, Catherine A. Rimmer, Ryan Case, James H. Yen
… acid, shikimic acid, and tartaric acid) and two anions (phosphate and sulfate) were determined in a suite of … dilution mass spectrometry. The second method utilized ion chromatography with conductivity detection. Finally, gas … acids, berry, liquid chromatography, gas chromatography, ion chromatography, mass spectrometry, isotope dilution …

Effects of Proteins on Metal Corrosion

October 16, 2008
Author(s)
H J. Mueller
… silver anodically polarized to 0.4 V vs SCE, calcium- and phosphate-containing products were intermixed with silver … chloride when protein was absent, while no calcium-and phosphate-containing products occurred when protein was … calcium, chloride, copper, corrosion, phosphate, polarization, products, protein, silver …

Measuring the Ion Current in High-Density Plasmas Using Radio-Frequency Current and Voltage Measurements

September 1, 2001
Author(s)
Mark A. Sobolewski
… methods have recently been proposed for monitoring the ion current in situ. These methods rely on passive, … by comparison to direct, independent measurements of the ion current at the substrate electrode made using lower … more accurate numerical sheath model, gives values of the ion current in agreement with the independent measurements. …

Study of Direct Lithiation of Thin Si Membranes with Spatially-Correlative Low Energy Focused Li Ion Beam and Analytical Electron Microscopy Techniques

November 22, 2016
Author(s)
Vladimir P. Oleshko, Christopher L. Soles, Kevin A. Twedt, J J. McClelland
… Si is an attractive anode material for high-performance Li-ion batteries. The practical use of Si-based anodes is, … these problems. Here, we report on controlled low dose Li+ ion implantation into 9 nm-thick amorphous (a-Si) membranes … (c-Si) membranes using a low-energy focused lithium ion beam. With probe sizes of a few tens of nanometers at …

A transition-edge sensor-based x-ray spectrometer for the study of highly charged ions at the National Institute of Standards and Technology electron beam ion trap

December 16, 2019
Author(s)
Paul Szypryt, Galen C. O'Neil, Endre Takacs, Joseph N. Tan, Sean W. Buechele, Aung Naing, Douglas A. Bennett, William B. Doriese, Malcolm S. Durkin, Joseph W. Fowler, Johnathon D. Gard, Gene C. Hilton, Kelsey M. Morgan, Carl D. Reintsema, Daniel R. Schmidt, Daniel S. Swetz, Joel N. Ullom, Yuri Ralchenko
… Sensor (TES) x-ray spectrometer for the Electron Beam Ion Trap (EBIT) at the National Institute of Standards and … NIST EBIT has produced numerous studies of highly charged ions in diverse fields such as atomic physics, plasma … Institute of Standards and Technology, highly charged ions, atomic physics, plasma spectroscopy, laboratory …

Seeding Cells into Calcium Phosphate Cement

January 1, 2002
Author(s)
Carl Simon Jr., Francis W. Wang
… biocompatability, biomaterials, bone graft, calcium phosphate cement, cell seeding, cell therapy, hydrogel, … Seeding Cells into Calcium Phosphate Cement …

High Precision Measurements of Arsenic Implantation Dose in Silicon by Secondary Ion Mass Spectrometry

February 1, 2001
Author(s)
P Chi, David S. Simons, J M. McKinley, F A. Stevie, C N. Granger
… to be accomplished with low systematic error. Secondary ion mass spectrometry (SIMS) has a demonstrated capability to … investigated include arsenic analytical species, matrix ion species, energy bandpass, and sample holder design. With … profile, energy distribution, high precision measurement, ion implantation, SIMS …
Displaying 451 - 475 of 2769
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