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Displaying 451 - 475 of 1600

Photonic microwave generation with high-power photodiodes

May 14, 2013
Author(s)
Tara M. Fortier, Franklyn J. Quinlan, Archita Hati, Craig W. Nelson, Jennifer A. Taylor, Yang Fu, Joe Campbell, Scott A. Diddams
… we generate a 10 GHz microwave tone with less than 500 attoseconds absolute integrated timing jitter (1 Hz - 10 …

Protecting Wireless Local Area Networks

December 3, 2012
Author(s)
Shirley M. Radack, David R. Kuhn
… of their WLANs. Information is provided about access to SP 500-153, and to other NIST resources that are available to …

Optical n(p, T_90) measurement suite 2: H_2O and D_2O

May 28, 2024
Author(s)
Patrick Egan, Yuanchao Yang
A suite of measurements of refractive index n(p, T_90) is reported for gas phase ordinary water H_2O and heavy water D_2O. The methodology is optical refractive index gas metrology, operating at laser wavelength 633 nm and covering the range (293 T_90 43

Comparison of Multiple Methods for Obtaining PO Resistances with Low Uncertainties

September 3, 2019
Author(s)
Kwang Min Yu, Dean G. Jarrett, Albert Rigosi, Shamith Payagala, Marlin E. Kraft
Capabilities for high resistance determinations are essential for calibration of currents below 1 pA, as typically requested in several applications, including semiconductor device characterization, single electron transport, and ion beam technologies

Mid-infrared upconversion spectroscopy based on a Yb:fiber frequency laser

October 11, 2011
Author(s)
Scott A. Diddams, Todd Johnson
… comb produced a mid-infrared (MIR) comb tunable from 2.7 − 4.7 υm (2100 − 3700 cm−1) with average power up to 40 mW. The … per spectral element was determined to be 4.4 x 10−7 cm−1 from measurements with low pressure CH4. The spectral …

Mass Absorption Coefficient of Tungsten for 1600-2100 eV

February 1, 2002
Author(s)
Zachary H. Levine, S Grantham, I McNulty
… M V edges. The two tungsten films had thicknesses of 107.7 10 nm and 51.5 10 nm; the intensity of the transmitted x … width in all x-ray tables based on atomic form factors and 44 eV within a real-space multiple-scattering theory. The …

Mass Absorption Coefficient of Tungsten, 1600 eV to 2100 eV

January 24, 2002
Author(s)
Zachary H. Levine, S Grantham, I McNulty
… M V edges. The two tungsten films had thicknesses of 107.7 10 nm and 51.5 10 nm; the intensity of the transmitted x … width in all x-ray tables based on atomic form factors and 44 eV within a real-space multiple-scattering theory. The …

Mass Absorption Coefficient of Tungsten, 1606-2100 eV

January 1, 2002
Author(s)
Zachary H. Levine, S Grantham, I McNulty
… M V edges. The two tungsten films had thicknesses of 107.7 10 nm and 51.5 10 nm; the intensity of the transmitted x … width in all x-ray tables based on atomic form factors and 44 eV within a real-space multiple-scattering theory. The …

A Thin-Film Cryotron Suitable For Use as an Ultra-Low-Temperature Switch

October 6, 2016
Author(s)
Peter J. Lowell, John A. Mates, William B. Doriese, Gene C. Hilton, Kelsey M. Morgan, Daniel S. Swetz, Joel N. Ullom, Daniel R. Schmidt
… off state with 1.8 mA and has a leakage current less than 500 nA. The transition between the on and off states of the …
Displaying 451 - 475 of 1600
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