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Displaying 21751 - 21775 of 73929

Distributed Force Probe Bending Model of CD-AFM Bias

April 1, 2013
Author(s)
Vladimir A. Ukraintsev, Ndubuisi George Orji, Theodore V. Vorburger, Ronald G. Dixson, Joseph Fu, Richard M. Silver
Critical Dimension AFM (CD-AFM) is a widely used reference metrology technique. To characterize modern semiconductor devices, small and flexible probes, often 15 nm to 20 nm in diameter, are used. Recent studies have reported uncontrolled and significant

Engineering novel detectors and sensors for MRI

April 1, 2013
Author(s)
Gary Zabow, Chunqi Qian, Alan Koretsky
Increasing detection sensitivity and image contrast have always been major topics of research in MRI. In this perspective, we summarize two engineering approaches to make detectors and sensors that have potential to extend the capability of MRI. The first

Field Standards for Weights and Measures

April 1, 2013
Author(s)
Georgia L. Harris
An article written for the measurement community on whether [field] standards are “fit for purpose”. Is the equipment used is in testing designed for the purpose in which it is being used. The concept of fit for purpose is common in method validation

Logic Minimization Techniques with Applications to Cryptology

April 1, 2013
Author(s)
Joan Boyar, Philip Matthews, Rene Peralta
A new technique for combinational logic optimization is described. The technique is a two-step process. In the rst step, the non-linearity of a circuit as measured by the number of non-linear gates it contains is reduced. The second step reduces the number

Path aggregation techniques for EXAFS visualization and analysis

April 1, 2013
Author(s)
Bruce Ravel
The path expansion model used by feff considers the EXAFS spectrum as the sum of contributions from scattering geometries of two or more atoms in a cluster surrounding the absorbing atom. This model and its representation as a collection of les is the
Displaying 21751 - 21775 of 73929
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