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Displaying 51 - 75 of 332

Kicking the Tires of the NIST Microwave Uncertainty Framework Part 2*

November 27, 2017
Author(s)
Ronald A. Ginley
Traceability of a measurement requires two parts. An unbroken chain of measurements and uncertainties for each link of the chain. The NIST Microwave Uncertainty Framework (MUF) can provide both the required parts for a single link in the chain or for

A Multistate Single-Connection Calibration for Microwave-Microfluidics

October 12, 2017
Author(s)
Xiao Ma, Charles A. Little, Chris Long, Jordi Mateu, James Booth, James Hwang, Nate Orloff
With emerging medical, chemical, and biological applications of microwave-microfluidic devices, many researchers desire a fast, accurate calibration that can be achieved in a single connection. However, traditional on-wafer or coaxial calibrations require

Dimensional Measurement of Nanostructures with Scanning Electron Microscopy

September 20, 2017
Author(s)
Kristine A. Bertness
Scanning electron microscopy (SEM) is widely used for the measurement of dimensions of nanostructures. This document describes the calibration of SEM magnification using the ASTM E766-14 practice with NIST Reference Material (RM) 8820 and the calculation

Large Area Alpha Sources with a Lip: Integral Counting and Spectral Distortions

August 31, 2017
Author(s)
Lynne E. King, Ryan P. Fitzgerald, Ronald Tosh
The detection efficiency for large area alpha sources with adjustable heights of a raised lip around the edge were measured by 2π gas-filled proportional counter. The variations in low- energy spectral shape were modeled using a Geant4 radiation and charge

Effects of Powder Oxidation on Impact Toughness of Electron Beam Melt Ti-6Al-4V

August 25, 2017
Author(s)
Edward J. Garboczi, Enrico Lucon, William Grell, Z Loftus, Maciej Kumosa, E Solis-Ramos, Paul Predecki, E Clark
Powder quality in additive manufacturing (AM) electron beam melt (EBM) of Ti-6Al-4V components is crucial in determining the critical material properties of the end item. In this study, we report on the effect of powder oxidation on Charpy impact energy of

Determination of the molar mass of argon from a high precision acoustic comparison

May 18, 2017
Author(s)
XiaoJuan Feng, Jintao Zhang, Michael R. Moldover, Inseok Yang, Mark Plimmer, H. Lin
This article describes the accurate determination of the molar mass of a sample of argon gas used for a determination of the Boltzmann constant. The method due to one of the authors [Moldover et al., J. Res. Natl. Bur. Stand. 93, 85-144 (1988)] uses the

High-precision measurement of the X-ray Cu K-alpha spectrum

May 12, 2017
Author(s)
Marcus H. Mendenhall, Albert Henins, Lawrence T. Hudson, Csilla I. Szabo-Foster, Donald A. Windover, James P. Cline
The structure of the x-ray emission lines of the Cu Kα complex has been remeasured on a newly commissioned instrument, in a manner directly traceable to the Système Internationale definition of the meter. In this measurement, the region from 8000 to 8100

Selected Procedures for Volumetric Calibrations (2017 Ed)

March 28, 2017
Author(s)
Val R. Miller, Georgia L. Harris
This publication contains Good Measurement Procedures (GMP), Good Laboratory Procedures (GLP), and Standard Operating Procedures (SOP) for use in calibration laboratories performing volumetric calibrations. This edition is updated from the 2013 version

A Multireflect-Thru Method of Vector-Network-Analyzer Calibration

March 1, 2017
Author(s)
Arkadiusz Lewandowski, Wojciech Wiatr, Nate Orloff, James Booth
We present a new method for two-port vector-network-analyzer calibration which uses multiple offset-reflect standards and a flush thru connection. Offset-reflect standards consist of sections of the same uniform transmission-line with different lengths

Final report on the key comparison, CCM.PK15 in the pressure rangefrom 1.0 x 10-4 Pa to 1.0 Pa

January 30, 2017
Author(s)
Christian Wuethrich, Hitoshi Akimichi, Mercede Bergoglio, James A. Fedchak, Karl Jousten, Sueng Soo Hong, Jorge T. Guzman
The comparison CCM.M.P-K14 is a key comparison in pressure involving six laboratories in three regional metrological organizations (RMO). The measurand of the comparison is the accommodation coefficient of two spinning rotating gauge characterized in

Vector-Network-Analyzer Calibration Using Line and Multiple Coplanar-Waveguide Offset Reflects

December 9, 2016
Author(s)
Arkadiusz C. Lewandowski, Wojciech Wiatr, Dazhen Gu, Nate Orloff, Thomas Mitchell (Mitch) Wallis, Pavel Kabos
We present the application of our newly developed multi-reflect-thru technique to vector-network-analyzer calibration in the on-wafer environment. This technique uses a set of highly-reflective one-port devices, referred to as offset-reflects, and a single

Kicking the Tires of the NIST Microwave Uncertainty Framework,

December 8, 2016
Author(s)
Ronald A. Ginley
As with anything new, especially metrology tools, you want to know how good the new tool is. This is generally done through comparisons with existing systems. In this paper such a comparison is described. The new NIST method of processing measurements and

New Methods for Series-Resistor Calibrations on Lossy Substrates up to 110 GHz

December 1, 2016
Author(s)
Liu Song, Nate Orloff, Song Liu, Charles A. Little, Xifeng Lu, James Booth, IIja Ocket, Arkadiusz Lewandowski, Dominique Schreurs, Bart Nauwelaers
We present two new methods to perform seriesresistor calibrations on lossy substrates. Lossless calibration substrates, which are required by the traditional calibration comparison technique, are not needed. The proposed methods rely on the multiline TRL

The 2016 revision of ISO 1 Standard reference temperature for the specification of geometrical and dimensional properties

November 10, 2016
Author(s)
Steven D. Phillips, Craig M. Shakarji, Alessandro Balsamo, Michael Krystek, Edward P. Morse
This paper discusses the recently published 2016 (third edition) of ISO 1. While the value of the standard reference temperature remains unchanged at 20 C, definitions for the reference temperature and standard reference temperature are now included. This

Transfer Standard Uncertainty Can Cause Inconclusive Inter-Laboratory Comparisons

October 7, 2016
Author(s)
John D. Wright, Blaza Toman, Bodo Mickan, Gerd Wubbeler, Olha Bodnar, Clemens Elster
Inter-laboratory comparisons use the best available transfer standards to check the participants’ uncertainty analyses, identify underestimated uncertainty claims or unknown measurement biases, and improve the global measurement system. For some measurands

NIST Programs to Advance Accurate, Internationally-Recognized Stack Emissions Measurements

September 15, 2016
Author(s)
Aaron Johnson, Iosif Isaakovich Shinder, Rodney A. Bryant, JohnPaul R. Abbott, Keith A. Gillis, Joey Boyd, James Filla, Michael R. Moldover
Accurate flow measurements are essential to quantify the amount of greenhouse gases (GHGs) and other pollutants emitted from power plant stacks. Although protocols have been developed, the uncertainty of stack flow measurements has not been documented. 

Marie Curies Last Radium Standard Grand Challenge

September 1, 2016
Author(s)
Bert M. Coursey
The last of the radium-226 standards that Marie Curie personally handled is destined for a radioactive materials waste dump. Presented here is a history of the standards and a challenge to the scientific community to present a rationale for why this

Microwave Radiometry of Blackbody Radiation

August 11, 2016
Author(s)
Dazhen Gu
We outline the theoretical formulation of radiometry of the free-space radiation emitted by a blackbody target. Simulation shows a much smaller drop of radiation intensity of a Lambertian source than that of an incoherent source in the near-field region
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