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A Multireflect-Thru Method of Vector-Network-Analyzer Calibration
Published
Author(s)
Arkadiusz Lewandowski, Wojciech Wiatr, Nate Orloff, James Booth
Abstract
We present a new method for two-port vector-network-analyzer calibration which uses multiple offset-reflect standards and a flush thru connection. Offset-reflect standards consist of sections of the same uniform transmission-line with different lengths, which are terminated with the same highly-reflective load. The unknown propagation constant of the transmission line and the load reflection coefficient are then determined simultaneously with the vector-network- analyzer calibration coefficients. We compare our method with the multiline thru-reflect-line method, and show that both methods yield similar results. Our new multireflect-thru method is solely based upon dimensional parameters of the calibration standards. Therefore, like the multiline thru-reflect-line method, it can be used to establish a traceable vector-network- analyzer calibration, Thus, the multireflect-thru method constitutes an alternative to the multiline thru-reflect-line calibration in environments in which the use of transmission lines is troublesome, such as in the case vector-network-analyzers with very small coaxial and waveguide connectors.
Citation
IEEE Transactions on Microwave Theory and Techniques
Lewandowski, A.
, Wiatr, W.
, Orloff, N.
and Booth, J.
(2017),
A Multireflect-Thru Method of Vector-Network-Analyzer Calibration, IEEE Transactions on Microwave Theory and Techniques, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=920602
(Accessed October 9, 2025)