New Methods for Series-Resistor Calibrations on Lossy Substrates up to 110 GHz

Published

December 1, 2016

Author(s)

Liu Song, Nate Orloff, Song Liu, Charles A. Little, Xifeng Lu, James Booth, IIja Ocket, Arkadiusz Lewandowski, Dominique Schreurs, Bart Nauwelaers

Abstract

We present two new methods to perform seriesresistor calibrations on lossy substrates. Lossless calibration substrates, which are required by the traditional calibration comparison technique, are not needed. The proposed methods rely on the multiline TRL-calibrated series-resistor and seriescapacitor data. The first method uses closed-form equations and the second method is based on multi-frequency optimization. Also an improved version of the traditional calibration comparison technique is proposed and is used as the benchmark technique. By measurement results on a lossy silicon substrate up to 110 GHz, the validity of the proposed approaches is demonstrated

Citation

IEEE Transactions on Microwave Theory and Techniques

Volume

64

Issue

12

Pub Type

Journals

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Keywords

millimeter wave measurement, series-resistor, calibration, impedance standards, calibration comparison, silicon

Citation

Song, L. , Orloff, N. , Liu, S. , Little, C. , Lu, X. , Booth, J. , Ocket, I. , Lewandowski, A. , Schreurs, D. and Nauwelaers, B. (2016), New Methods for Series-Resistor Calibrations on Lossy Substrates up to 110 GHz, IEEE Transactions on Microwave Theory and Techniques, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=919927 (Accessed October 10, 2025)