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Metrology

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Displaying 1326 - 1350 of 2730

SIM.EM-S5 Voltage, Current and Resistance Comparison

June 1, 2012
Author(s)
Harold Sanchez, Lucas Di Lillo, Gregory Kyriazis, Rodrigo Ramos, Randolph Elmquist, Nien F. Zhang
This paper reports the results of the second Interamerican Metrology System (SIM) comparison on calibration of digital multimeters, performed for strengthening the interaction among National Metrology Institutes (NMIs) and for establishing the degree of

Strain and Magnetic-Field Characterization of a Bronze-Route Nb 3 Sn ITER Wire: Benchmarking of Strain Measurement Facilities at NIST and University of Twente

June 1, 2012
Author(s)
Najib Cheggour, Arend Nijhuis, H J. Krooshoop, Xifeng Lu, Jolene D. Splett, Theodore C. Stauffer, Loren F. Goodrich, Matthew C. Jewell, Arnaud Devred, Y Nabara
A benchmarking experiment was conducted to compare strain measurement facilities at the National Institute of Standards and Technology (NIST) and the University of Twente. The critical current of a bronze-route Nb 3Sn wire, which was fabricated for the

Modeling the Peak Cutting Temperature During High-Speed Machining of AISI 1045 Steel

May 22, 2012
Author(s)
Timothy J. Burns, Steven P. Mates, Richard L. Rhorer, Eric P. Whitenton, Debasis Basak
This paper presents new experimental data on AISI 1045 steel from the NIST pulse-heated Kolsky Bar Laboratory. The material is shown to exhibit a stiffer response to compressive loading when it has been rapidly preheated, than it does when it has been

Frequency-selective contrast on variably doped p-type silicon with a scanning microwave microscope

May 14, 2012
Author(s)
Atif A. Imtiaz, Thomas M. Wallis, SangHyun S. Lim, H. Tanbakuchi, H-P Huber, A. Hornung, P. Hinterdorfer, J. Smoliner, F. Kienberger, Pavel Kabos
We report frequency dependent contrast in d(S11)/dV measurements of a variably doped p-type silicon sample in the frequency range from 2GHz to 18GHz. The measurements were conducted bys use of a scanning microwave microscope. The measurements were done at

SHREC12 Track: Sketch-Based 3D Shape Retrieval

May 13, 2012
Author(s)
Bo Li, Afzal A. Godil
Sketch-based 3D shape retrieval has become an important research topic in content-based 3D object retrieval. The aim of this track is to measure and compare the performance of sketch-based 3D shape retrieval methods implemented by different participants

Ultra-Small-Angle X-ray Scattering-X-ray Photon Correlation Spectroscopy: A New Measurement Technique for in-situ Studies of Equilibrium and Nonequilibrium Dynamics

May 1, 2012
Author(s)
Fan Zhang, Andrew J. Allen, Lyle E. Levine, Jan Ilavsky, Gabrielle G. Long
Ultra-small-angle X-ray scattering—X-ray photon correlation spectroscopy (USAXS-XPCS) is a novel measurement technique for the study of equilibrium and slow nonequilibrium dynamics in disordered materials. This technique fills an existing gap between the

Anti-Drain Requirements for Retail Motor-fuel Dispensers

April 26, 2012
Author(s)
Marc A. Buttler
Two of the most fundamental components that can be found in any liquid fuel dispenser are the measuring device and the hose that transports the metered product to the consumers vehicle. The fuel that fills the volume of space in between the measuring

Strategic Roadmap for Fire Risk Reduction in Buildings and Communities

April 18, 2012
Author(s)
Anthony P. Hamins, Jason D. Averill, Richard G. Gann, Nelson P. Bryner, Rick D. Davis, David T. Butry, Alexander Maranghides, Jiann C. Yang, Daniel M. Madrzykowski, Matthew F. Bundy, Samuel L. Manzello, Jeffrey W. Gilman, Francine K. Amon, William E. Mell
The burden of fire on the U.S. economy continues to be large, comprising approximately $280 billion annually, or 2 percent of GDP. Over the last 30 years, civilian fire deaths and injuries have decreased due to the efforts of many people and organizations

Contour Metrology using Critical Dimension Atomic Force Microscopy

April 9, 2012
Author(s)
Ndubuisi G. Orji, Ronald G. Dixson, Andras Vladar, Bin Ming, Michael T. Postek
The critical dimension atomic force microscope (CD-AFM), which is used as a reference instrument in lithography metrology, has been proposed as a supplemental instrument for contour measurement and verification. However, although data from CD-AFM is

On CD-AFM bias related to probe bending

April 9, 2012
Author(s)
Vladimir A. Ukraintsev, Ndubuisi George Orji, Theodore V. Vorburger, Ronald G. Dixson, Joseph Fu, Richard M. Silver
Critical Dimension AFM (CD-AFM) is a widely used reference metrology. To characterize modern semiconductor devices, very small and flexible probes, often 15 nm to 20 nm in diameter, are now frequently used. Several recent publications have reported on

Bilateral Comparison between NIST and PTB for Flows of High Pressure Natural Gas

April 6, 2012
Author(s)
Aaron N. Johnson, B Mickan, H. Toebben, Tom Kegel
In 2009 NIST developed a U.S. national flow standard to provide traceability for flow meters used for custody transfer of pipeline quality natural gas. NIST disseminates the SI unit of flow by calibrating a customer flow meter against a parallel array of

A Prototype Web-Based User Interface for Sustainability Modeling and Optimization

March 28, 2012
Author(s)
Guodong Shao, David Westbrook, Alexander Brodsky
A growing number of manufacturing industries are initiating efforts to address sustainability issues. Energy efficient manufacturing and low carbon manufacturing are gaining particular attention. Finding the optimal solution of operational strategy and

Ground Truth for Evaluating 6 Degrees of Freedom Pose Estimation Systems

March 28, 2012
Author(s)
Jeremy Marvel, Joseph Falco, Tsai H. Hong
Systems developed to estimate poses of objects in 6 degrees of freedom (6DOF) Cartesian space (X, Y, and Z coordinates plus roll, pitch, and yaw) are reliant on the vendors' own processes to determine performance and measurement accuracy. These practices

2011 Solutions in Perception Challenge Performance Metrics and Results

March 22, 2012
Author(s)
Jeremy Marvel, Tsai H. Hong, Elena R. Messina
The 2011 Solutions in Perception Challenge (SPC) presented an international collection of teams with the opportunity to develop algorithms that could positively identify and accurately locate in space an arbitrary collection of artifacts. Researchers at

An IEEE 1588 Performance Testing Dashboard for Power Industry Requirements

March 22, 2012
Author(s)
Julien M. Amelot, YaShian Li-Baboud, Clement Vasseur, Jeffrey Fletcher, Dhananjay Anand, James Moyne
The numerous time synchronization performance requirements in the Smart Grid entails the need for a set of common metrics and test methods to verify the ability of the network system and its components to meet the power industry�s accuracy, reliability and
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