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Metrology

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Displaying 1351 - 1375 of 2730

Frequency-stabilized cavity ring-down spectroscopy

March 21, 2012
Author(s)
David A. Long, A. Cygan, Roger D. van Zee, Mitchio Okumura, C. E. Miller, D Lisak, Joseph T. Hodges
This Frontiers article describes frequency-stabilized cavity ring-down spectroscopy (FS-CRDS), an ultraprecise refinement of conventional cw-CRDS. We review the technique and highlight some recent studies which have utilized FS-CRDS to perform precision

Stylus Tip-Size Effect on the Calibration of Periodic Roughness Specimens with Rectangular Profiles

March 21, 2012
Author(s)
Thomas B. Renegar, Johannes A. Soons, Balasubramanian Muralikrishnan, John S. Villarrubia, Xiaoyu A. Zheng, Theodore V. Vorburger, Jun-Feng Song
Stylus instruments are widely used for surface characterization. It is well known that the size and shape of the stylus tip affects the measured surface geometry and parameters. In most cases, increasing the tip size decreases the measured Ra value because

Selected Procedures for Volumetric Calibrations

March 16, 2012
Author(s)
Georgia L. Harris
This NIST IR of Selected Publications has been compiled as an interim update for a number of Good Laboratory Practices, Good Measurement Practices, and Standard Operating Procedures for Volume Calibrations. These procedures are updates to procedures that

Tumor Necrosis Factor Interaction with Gold Nanoparticles

March 14, 2012
Author(s)
De-Hao D. Tsai, Sherrie R. Elzey, Frank W. DelRio, Robert I. MacCuspie, Suvajyoti S. Guha, Michael R. Zachariah, Athena M. Keene, Jeffrey D. Clogston, Vincent A. Hackley
We report on a systematic investigation of molecular conjugation of tumor necrosis factor protein-α (TNF) onto gold nanoparticles (AuNPs) and the subsequent binding behavior to its antibody (anti-TNF). We employ a combination of physical and spectroscopic

Traceable Calibration of a Critical Dimension Atomic Force Microscope

March 9, 2012
Author(s)
Ronald G. Dixson, Ndubuisi G. Orji, Craig D. McGray, John E. Bonevich, Jon C. Geist
The National Institute of Standards and Technology (NIST) has a multifaceted program in atomic force microscope (AFM) dimensional metrology. One component of this program, and the focus of this paper, is the use of critical dimension atomic force

Tunnel FET Heterojunction Band Alignment by Internal Photoemission Spectroscopy

March 6, 2012
Author(s)
Qin Zhang, Guangle Zhou, Huili G. Xing, Alan C. Seabaugh, Kun Xu, Sio Hong, Oleg A. Kirillov, Curt A. Richter, Nhan Van Nguyen
The electron energy band alignment of a metal-oxide-semiconductor tunnel field-effect transistor (TFET) heterojunction, W/Al2O3/InGaAs/InAs/InP is determined by internal photoemission spectroscopy. At the oxide flat-band condition, the barrier height from

Optical fibre-coupled cryogenic radiometer with carbon nanotube absorber

March 2, 2012
Author(s)
David J. Livigni, Nathan A. Tomlin, Christopher L. Cromer, John H. Lehman
A cryogenic radiometer was constructed for direct-substitution optical-fibre power measurements. The cavity is intended to operate at the 3 K temperature stage of a dilution refrigerator or 4.2 K stage of a liquid cryostat. The optical fibre is removable

CODATA Recommended Values of the Fundamental Physical Constants: 2010

March 1, 2012
Author(s)
Peter J. Mohr, Barry N. Taylor, David B. Newell
This paper give the 2010 self-consistent set of values of the basic constants and conversion factors of physics and chemistry recommended by the Committee on Data for Science and Technology (CODATA) for international use. The 2010 adjustment takes into

NIST Framework and Roadmap for Smart Grid Interoperability Standards, Release 2.0

February 16, 2012
Author(s)
George W. Arnold, Gerald FitzPatrick, David A. Wollman, Thomas L. Nelson, Paul A. Boynton, Galen H. Koepke, Allen R. Hefner Jr., Cuong Nguyen, Jeffrey A. Mazer, Dean Prochaska, Marianne M. Swanson, Tanya L. Brewer, Victoria Yan Pillitteri, David H. Su, Nada T. Golmie, Eric D. Simmon, Allan C. Eustis, David Holmberg, Steven T. Bushby, Michael D. Janezic, Ajitkumar Jillavenkatesa
The Energy Independence and Security Act (EISA) of 2007 requires that NIST develop a framework of standards for the Smart Grid. This document is the second release of the framework first published in January, 2010. It covers the activities and outputs of

A New Generation of Grain Moisture Meters

February 6, 2012
Author(s)
Gloria D. Lee
One of the current technologies used in the commercial determination of grain moisture is dielectric technology, a technology that has been used for over 60 years. Although this technology has some inherent limitations, meter moisture determination has

A statistical study of de-embedding applied to eye diagram analysis

February 1, 2012
Author(s)
Paul D. Hale, Jeffrey A. Jargon, Chih-Ming Wang, Brett Grossman, Matthew Claudius, Jose Torres, Andrew M. Dienstfrey, Dylan F. Williams
We describe a stable method for calibrating digital waveforms and eye diagrams using the measurement system response function and its regularized inverse. The function describing the system response includes the response of the oscilloscope and any

Polymer Dynamics in Constrained Geometries

February 1, 2012
Author(s)
Christopher Soles, Ryan Nieuwendaal, Huagen H. Peng
The wide-spread interest in the dynamical property of organic materials under strong states of confinement largely began with differential scanning calorimeter (DSC) measurements in the early 90's of the glass transition and heat capacity of glass forming

MICROHOTPLATE TEMPERATURE SENSOR CALIBRATION AND BIST

January 3, 2012
Author(s)
Muhammad Y. Afridi, Christopher B. Montgomery, Stephen Semancik, Kenneth G. Kreider, Jon C. Geist
In this paper we describe a novel long-term microhotplate temperature sensor calibration technique suitable for Built-In Self Test (BIST). The microhotplate thermal resistance (thermal efficiency) and the thermal voltage from an integrated platinum-rhodium

Through-focus Scanning Optical Microscopy

December 31, 2011
Author(s)
Ravikiran Attota
Through-focus scanning optical microscopy (TSOM) method provides three-dimensional information (i.e. the size, shape and location) about micro- and nanometer-scale structures. TSOM, based on a conventional optical microscope, achieves this by acquiring and

Spectroscopy of the methane N3 Band with an accurate midinfrared coherent dual-comb spectrometer

December 28, 2011
Author(s)
Esther Baumann, Fabrizio R. Giorgetta, William C. Swann, Alexander M. Zolot, Ian R. Coddington, Nathan R. Newbury
We demonstrate a high-accuracy dual-comb spectrometer centered at 3.4 υm. The amplitude and phase spectra of the P,, Q, and partial R branches of the methane Ņ3 band are measured at 25 to 100 MHz point spacing with resolution under 10 kHz and a signal-to

Nanometrology Using Through-Focus Scanning Optical Microscopy Method

December 21, 2011
Author(s)
Ravikiran Attota, Richard M. Silver
We present an initial review of a novel through-focus scanning optical microscopy (TSOM) imaging method that produces nanometer dimensional measurement sensitivity using a conventional bright-field optical microscope. In the TSOM method a target is scanned
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