U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Metrology

Search Publications

Search Title, Abstract, Conference, Citation, Keyword or Author
  • Published Date
Displaying 1351 - 1375 of 2718

NIST Framework and Roadmap for Smart Grid Interoperability Standards, Release 2.0

February 16, 2012
Author(s)
George W. Arnold, Gerald FitzPatrick, David A. Wollman, Thomas L. Nelson, Paul A. Boynton, Galen H. Koepke, Allen R. Hefner Jr., Cuong Nguyen, Jeffrey A. Mazer, Dean Prochaska, Marianne M. Swanson, Tanya L. Brewer, Victoria Yan Pillitteri, David H. Su, Nada T. Golmie, Eric D. Simmon, Allan C. Eustis, David Holmberg, Steven T. Bushby, Michael D. Janezic, Ajitkumar Jillavenkatesa
The Energy Independence and Security Act (EISA) of 2007 requires that NIST develop a framework of standards for the Smart Grid. This document is the second release of the framework first published in January, 2010. It covers the activities and outputs of

A New Generation of Grain Moisture Meters

February 6, 2012
Author(s)
Gloria D. Lee
One of the current technologies used in the commercial determination of grain moisture is dielectric technology, a technology that has been used for over 60 years. Although this technology has some inherent limitations, meter moisture determination has

A statistical study of de-embedding applied to eye diagram analysis

February 1, 2012
Author(s)
Paul D. Hale, Jeffrey A. Jargon, Chih-Ming Wang, Brett Grossman, Matthew Claudius, Jose Torres, Andrew M. Dienstfrey, Dylan F. Williams
We describe a stable method for calibrating digital waveforms and eye diagrams using the measurement system response function and its regularized inverse. The function describing the system response includes the response of the oscilloscope and any

Polymer Dynamics in Constrained Geometries

February 1, 2012
Author(s)
Christopher Soles, Ryan Nieuwendaal, Huagen H. Peng
The wide-spread interest in the dynamical property of organic materials under strong states of confinement largely began with differential scanning calorimeter (DSC) measurements in the early 90's of the glass transition and heat capacity of glass forming

MICROHOTPLATE TEMPERATURE SENSOR CALIBRATION AND BIST

January 3, 2012
Author(s)
Muhammad Y. Afridi, Christopher B. Montgomery, Stephen Semancik, Kenneth G. Kreider, Jon C. Geist
In this paper we describe a novel long-term microhotplate temperature sensor calibration technique suitable for Built-In Self Test (BIST). The microhotplate thermal resistance (thermal efficiency) and the thermal voltage from an integrated platinum-rhodium

Through-focus Scanning Optical Microscopy

December 31, 2011
Author(s)
Ravikiran Attota
Through-focus scanning optical microscopy (TSOM) method provides three-dimensional information (i.e. the size, shape and location) about micro- and nanometer-scale structures. TSOM, based on a conventional optical microscope, achieves this by acquiring and

Spectroscopy of the methane N3 Band with an accurate midinfrared coherent dual-comb spectrometer

December 28, 2011
Author(s)
Esther Baumann, Fabrizio R. Giorgetta, William C. Swann, Alexander M. Zolot, Ian R. Coddington, Nathan R. Newbury
We demonstrate a high-accuracy dual-comb spectrometer centered at 3.4 υm. The amplitude and phase spectra of the P,, Q, and partial R branches of the methane Ņ3 band are measured at 25 to 100 MHz point spacing with resolution under 10 kHz and a signal-to

Nanometrology Using Through-Focus Scanning Optical Microscopy Method

December 21, 2011
Author(s)
Ravikiran Attota, Richard M. Silver
We present an initial review of a novel through-focus scanning optical microscopy (TSOM) imaging method that produces nanometer dimensional measurement sensitivity using a conventional bright-field optical microscope. In the TSOM method a target is scanned

Feedback Control of Optically Trapped Particles

December 17, 2011
Author(s)
Jason J. Gorman, Arvind K. Balijepalli, Thomas W. LeBrun
Optical trapping is a method for manipulating micro- and nanoscale particles that is widely used in biophysics and colloid science, among other areas. This method uses optical forces to confine the position of a particle to a localized region, which is

Spherical indentation testing of poroelastic relaxations in thin hydrogel layers

December 16, 2011
Author(s)
Edwin Chan, Yuhang Hu, Peter M. Johnson, Zhigang Suo, Christopher Stafford
In this work, we present the Poroelastic Relaxation Indentation (PRI) testing approach for quantifying the mechanical and transport properties of thin layers of poly(ethylene glycol) hydrogel materials with thicknesses on the order of 200 m. Specifically

Seafood - Good Quantity Control Practices

December 15, 2011
Author(s)
David A. Sefcik
Webinar will identify the 4 primary components of a packaging system and help stakeholders know and recognize the 12 good quantity control practices, as outlined in HB 130. It will also teach them the criteria for evaluating their suppliers quantity

Report of the 96th National Conference on Weights and Measures (2011) SP1125

December 13, 2011
Author(s)
Linda D. Crown, Tina G. Butcher, Steven E. Cook, Richard A. Harshman, Lisa Warfield, David A. Sefcik
The 96th Annual Meeting of the National Conference on Weights and Measures (NCWM) was held July 17 to 21, 2011, at the Holiday Inn Downtown at the Park, Missoula, Montana. The theme of the meeting was Educating Today for Tomorrow. Reports by the NCWM Board

Three-dimensional Nanometrology with TSOM Optical Method

December 10, 2011
Author(s)
Ravikiran Attota
Through-focus scanning optical microscopy (TSOM) is a new metrology method that achieves 3D nanoscale measurement sensitivity using conventional optical microscopes; measurement sensitivities are comparable to what is typical when using scatterometry

Towards realization of a large-area, LED-based solar simulator

November 27, 2011
Author(s)
Behrang H. Hamadani, Kangbin Chua, John F. Roller, Howard W. Yoon, Brian P. Dougherty
LED-based solar simulators have shown great promise as alternative light sources for indoor testing of PV cells as compared to their traditional counterparts. However, large-area uniform illumination more suitable for larger cells and module measurements

TSOM Method for Nanoelectronics Dimensional Metrology

November 18, 2011
Author(s)
Ravikiran Attota
Through-focus scanning optical microscopy (TSOM) is a relatively new method that transforms conventional optical microscopes into truly three-dimensional metrology tools for nanoscale to microscale dimensional analysis. TSOM achieves this by acquiring and
Was this page helpful?