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A Verification Method for Noise-Temperature Measurements on Cryogenic Low-Noise Amplifiers

Published

Author(s)

Dazhen Gu, James P. Randa, Robert L. Billinger, Dave K. Walker

Abstract

We report a verification method for noise-temperature(NT) measurements on cryogenic low-noise amplifiers (LNAs) at liquid helium temperature. The method uses a comparison between the individual measurements of the LNA and an attenuator and the joint measurements of the tandem of the two. As a first step, we were able to determine the loss and the added NT of the cables that connected the cryogenic devices (the LNA, the attenuator, or their combination) to the test ports outside of a cryostat. The attenuator was also characterized successfully with 3% measurement uncertainty.
Citation
IEEE Transactions on Instrumentation and Measurement

Keywords

Cryogenic amplifier, measurement uncertainty, noise measurement, noise temperature, verification methods.

Citation

Gu, D. , Randa, J. , Billinger, R. and Walker, D. (2012), A Verification Method for Noise-Temperature Measurements on Cryogenic Low-Noise Amplifiers, IEEE Transactions on Instrumentation and Measurement (Accessed April 23, 2024)
Created July 1, 2012, Updated February 19, 2017