U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Manufacturing

Search Publications

Search Title, Abstract, Conference, Citation, Keyword or Author
  • Published Date
Displaying 1176 - 1200 of 2179

Mathematical Metrology for Evaluating a 6DOF Visual Servoing System

October 8, 2009
Author(s)
Tommy Chang, Tsai H. Hong, Milli Shah, Roger D. Eastman
In this paper we develop the best homogeneous matrix trans- formation to fit two streams of dynamic six-degree-of-freedom (6DOF) data for evaluating perception systems using ground truth. In particular, we compare object position and orien- tation results

Quantifying the Performance of MT-Connect in a Distributed Manufacturing Environment

October 8, 2009
Author(s)
John L. Michaloski, Byeong Eon Lee, Frederick M. Proctor, Sid Venkatesh, Sidney Ly
In the CNC manufacturing world, the continuing pressure to reduce costs and improve time to market places a premium on smarter ways of manufacturing and intensifies the need to integrate feedback from the shop floor into the enterprise business systems

Ontology Formalisms: What is Appropriate for Different Applications?

October 6, 2009
Author(s)
Craig I. Schlenoff
Ontologies can take many forms. There are ontologies that are extremely formal (e.g., using first order logic), and there are ontologies that are much less formally defined (e.g., ontologies in the relational databases or dictionaries). Nonetheless, all of

A Service Oriented Framework for Construction Supply Chain Integration

October 1, 2009
Author(s)
Jack Cheng, Kincho H. Law, Albert T. Jones, Ram D. Sriram
Supply chain management integrates key business processes and facilities, involving end users and suppliers that provide products, services and information. Supply chain integration can potentially add value to the stakeholders along product development

Influence of room temperature control system on AFM imaging

October 1, 2009
Author(s)
Joseph Fu, Wei Chu, Theodore V. Vorburger
As technology progresses, the control of environment for experiments is also getting more sophisticated; such as the control of lab temperature and vibration. Temperature controlled within ± 0.25° C for a general purpose lab is common place. We illustrate

The Dimensional Markup Language Specification for Inspection Results Data

October 1, 2009
Author(s)
William G. Rippey
The Dimensional Markup Language (DML) specification defines a data model and Extensible Model Language (XML) encoding rules for dimensional inspection results for discrete parts. To support manufacturing quality assurance processes, DML results files are

Update on DMIS Certification

October 1, 2009
Author(s)
William G. Rippey
The Dimensional Standards Consortium (DMSC) and the National Institute of Standards and Technology (NIST) announced the rollout of the DMSC's DMIS Certification Program at the International Manufacturing Technology Show (IMTS), September 2008. The

Measurement Traceability and Quality Assurance in a Nanomanufacturing Environment

September 25, 2009
Author(s)
Ndubuisi G. Orji, Ronald G. Dixson, Aaron Cordes, Benjamin Bunday, John Allgair
A key requirement for nano-manufacturing is maintaining acceptable traceability of measurements performed to determine size. Given that properties and functionality at the nanoscale are governed by absolute size, maintaining the traceability of dimensional

Electrochemical Micromachining of Hastelloy B-2 with Ultrashort Voltage Pulses

September 8, 2009
Author(s)
Gordon A. Shaw, Joseph J. Maurer, Steven E. Fick, Thomas P. Moffat, J. J. Mallett, John L. Hudson
Electrochemical micromachining (ECMM) with ultrashort voltage pulses, a maskless all-electrochemical micro and nanofabrication technique, has been used to fabricate microstructures on a corrosion resistant nickel-based superalloy, Hastelloy B-2. Because of

Nanometrology Solutions Using an Ultra-High Resolution In-lens SEM

September 1, 2009
Author(s)
Michael T. Postek, Andras Vladar, John S. Villarrubia
The imaging and measurement of nanostructures such as particles, carbon nanotubes, and quantum dots have placed new demands on the high resolution imaging capabilities of scanning electron microscopes. A barrier to accurate dimensional metrology is the

Formal Representation of Product Design Specifications for Validating Product Designs

August 27, 2009
Author(s)
Alex Weissman, Satyandra K. Gupta, Xenia Fiorentini, Sudarsan Rachuri, Ram D. Sriram
Large scale distributed design projects increasingly result in designs that do not fully conform to the stated design goals or specifications. Hence, there is a need to validate these designs against various requirements. For projects with a large set of

STEP-OAGIS Harmonization Joint Working Group, PDM Subgroup Interim Report

August 27, 2009
Author(s)
Xenia Fiorentini, Sudarsan Rachuri
In any manufacturing enterprise, there are two types of tools used to create and share product related data across its extended network. The engineering information of the product is created using what is commonly called engineering authoring tool (e.g

Input Data Management Methodology for Discrete Event Simulation

August 26, 2009
Author(s)
Nils E. Bengtsson, Guodong Shao, Yung-Tsun T. Lee, Swee K. Leong, Charles R. McLean, Bjorn Johansson, Anders Skoogh
Input Data Management (IDM) is a time consuming and costly process for Discrete Event Simulation (DES) projects. In this paper, a methodology for IDM in DES projects is described. The approach is to use a methodology to identify and collect data, then use

Representing Layout Information in the CMSD Specification

August 26, 2009
Author(s)
Frank H. Riddick, Yung-Tsun T. Lee
Developing mechanisms for the efficient exchange of information between simulations and other manufacturing tools is a critical problem. For many areas of manufacturing, neither representations for the information nor mechanisms for exchanging the

193 nm Angle-Resolved Scatterfield Microscope for Semiconductor Metrology

August 24, 2009
Author(s)
Martin Y. Sohn, Richard Quintanilha, Bryan M. Barnes, Richard M. Silver
An angle-resolved scatterfield microscope (ARSM( feating 193 nm excimer laser light wa developed for measuring critical dimension (CD) and overlay of nanoscale targets as used in semiconductor metrology. The microscope is designed to have a wide and

Enabling Flexible Manufacturing Systems by Using Level of Automation as Design Parameter

August 19, 2009
Author(s)
Bjoern J. Johansson, Asa Fasth, Johan Stahre, Juhani Heilala, Swee K. Leong, Yung-Tsun T. Lee, Frank H. Riddick
Handling flexibility in an ever changing manufacturing environment is one of the key challenges for a successful industry. By using tools for virtual manufacturing, industries can analyze and predict outcomes of changes before taking action to change the

System Builders Manual for Version 2.1.5 of the NIST DMIS Test Suite

August 19, 2009
Author(s)
Thomas R. Kramer, John A. Horst
This is a system builders manual for the NIST DMIS Test Suite, version 2.1.5. The purpose of the manual is to help system builders use software provided in the test suite for building systems that implement DMIS (the Dimensional Measuring Interface

Towards a Method for Harmonizing Information Standards

August 19, 2009
Author(s)
Xenia Fiorentini, Sudarsan Rachuri, Steven R. Ray, Ram D. Sriram
Designers and engineers use various engineering authoring tools, such as CAD, CAE, and PDM,, to generate information objects (engineering objects). On the business side, enterprise level business process modelers use various business authoring tools, such

Users Manual for Version 2.1.5 of the NIST DMIS Test Suite (for DMIS 5.1)

August 19, 2009
Author(s)
Thomas R. Kramer, John A. Horst
The NIST DMIS Test Suite, version 2.1.5, is described. The test suite is intended to serve two purposes, 1) to help users and vendors use version 5.1 of DMIS (the Dimensional Measuring Interface Standard) and 2) to provide utilities and test files for

Recommended Practices for Homeland Security Modeling and Simulation

August 13, 2009
Author(s)
Sanjay Jain, Charles McLean
This paper recommends practices for development and deployment of modeling, simulation and analysis (MS&A) tools for homeland security applications. The set of recommended practices applicable to any MS&A application includes: software engineering practice
Was this page helpful?