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Electronics

Semiconductors

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Displaying 176 - 200 of 1445

Use of quantum effects as potential qualifying metrics for "quantum grade silicon"

December 30, 2019
Author(s)
Aruna N. Ramanayaka, Ke Tang, Joseph A. Hagmann, Hyun S. Kim, David S. Simons, Curt A. Richter, Joshua M. Pomeroy
Across solid state quantum information, material deficiencies limit performance through enhanced relaxation, charge defect motion, or isotopic spin noise. While classical measurements of device performance provide cursory guidance, specific qualifying

Appraising the extensibility of optics-based metrology for emerging materials

October 4, 2019
Author(s)
Bryan M. Barnes, Mark-Alexander Henn, Martin Y. Sohn, Hui Zhou, Richard M. Silver
To advance computational capabilities beyond conventional scaling limitations, novel device architectures enabled by emerging materials may be required. Optics-based methodologies, central to modern-day process control, will be pursued by the

Automated Mechanical Exfoliation of MoS2 and MoTe2 Layers for 2D Materials Applications

September 13, 2019
Author(s)
Albert Davydov, Sergiy Krylyuk, Kyle J. DiCamillo, Makarand Paranjape, Wendy Shi
An automated technique is presented for mechanically exfoliating single-layer and few-layer transition metal dichalcogenides using controlled shear and normal forces imposed by a parallel plate rheometer. A thin sample that is removed from bulk MoS2 or

A compact, UHV ion source for enriching 28Si and depositing epitaxial thin films

August 22, 2019
Author(s)
Ke Tang, Hyun S. Kim, Aruna N. Ramanayaka, David S. Simons, Joshua M. Pomeroy
An ultra-high-vacuum (UHV) compatible Penning ion source for growing pure, highly enriched 28Si epitaxial thin films is presented. Enriched 28Si is a critical material for quantum information due to the elimination of nuclear spins and, in some cases, must

Streaming Batch Eigenupdates for Hardware Neural Networks

August 6, 2019
Author(s)
Brian D. Hoskins, Matthew W. Daniels, Siyuan Huang, Advait Madhavan, Gina C. Adam, Nikolai B. Zhitenev, Jabez J. McClelland, Mark D. Stiles
Neuromorphic networks based on nanodevices, such as metal oxide memristors, phase change memories, and flash memory cells, have generated considerable interest for their increased energy efficiency and density in comparison to graphics processing units

Materials Science in the AI age: high-throughput library generation, machine learning and a pathway from correlations to the underpinning physics

July 22, 2019
Author(s)
Kamal Choudhary, Aaron G. Kusne, Francesca M. Tavazza, Jason R. Hattrick-Simpers, Rama K. Vasudevan, Apurva Mehta, Ryan Smith, Lukas Vlcek, Sergei V. Kalinin, Maxim Ziatdinov
The use of advanced data analytics, statistical and machine learning approaches (‘AI’) to materials science has experienced a renaissance, driven by advances in computer sciences, availability and access of software and hardware, and a growing realization

Electron Reflectometry for Measuring Nanostructures on Opaque Substrate

July 8, 2019
Author(s)
Lawrence H. Friedman, Wen-Li Wu
Here, we present a method for measuring dimensions of nanostructures using specular reflection of electrons from an opaque surface. Development of this method has been motivated by measurement needs of the semiconductor industry, but it can also be more

A Truth-Matrix View into Unary Computing

June 22, 2019
Author(s)
Advait Madhavan, Georgios Tzimpragos, Mark D. Stiles, Timothy Sherwood
Our community has been exploring Time-of-arrival based codes as a candidate for very low energy information processing. A ``space-time'' algebra has been recently proposed that captures the essential features of such a paradigm. In order to gain some

Electronics Supply Chain Integrity Enabled by Blockchain

June 1, 2019
Author(s)
Xiaolin Xu, Fahim Rahman, Bicky Shakya, Apostol Vassilev, Domenic Forte, Mark Tehranipoor
Electronic systems are ubiquitous today, playing an irreplaceable role in our personal lives as well as in critical infrastructures such as power grid, satellite communication, and public transportation. In the past few decades, the security of software

Induced quantum dot probe for materials characterization

April 19, 2019
Author(s)
Hilary M. Hurst, Yun-Pil Shim, Rusko Ruskov, Charles Tahan
We propose a non-destructive means of characterizing a semiconductor wafer via measuring parameters of an induced quantum dot on the material system of interest with a separate probe chip that can also house the measurement circuitry. We show that a single
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