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Electronics

Electromagnetics

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Displaying 1051 - 1075 of 1583

Spherical-Wave Characterization of Interior and Exterior Sources

August 1, 1998
Author(s)
David A. Hill
This paper presents the theoretical basis for spherical, near-field scanning in the general case where radiating sources exist both inside and outside the measurement region. The fields are expanded in terms of outgoing spherical waves (due to interior

International Comparison of Noise-Temperature Measurements at 2, 4, and 12 GHz

July 1, 1998
Author(s)
James P. Randa, J. Achkar, F. I. Buchholz, T. Colard, D. Schubert, M. Sinclair, John Rice, G. S. Williams
We report results of a recent international comparison of thermal noise-power measurements, performed under the auspices of CIPM/CCE. The noise temperatures of two solid-state sources with GPC-7 connectors were measured at 2, 4, and 12 GHz. All results

Polarimetric Calibration for Monostatic Radar Systems

July 1, 1998
Author(s)
Lorant A. Muth, Paul D. Domich, B. M. Welsh, A. L. Buterbaugh, B. M. Kent
Calibration standards for radar systems are being developed cooperatively at NIST and DoD measurement facilities. Our goals are to develop standard procedures for polarimetric radar calibrations and to improve the uncertainty in the estimation of system

Characterization of On-Wafer Diode Noise Sources

June 1, 1998
Author(s)
James P. Randa, Dave K. Walker, Lawrence P. Dunleavy, Robert L. Billinger, John Rice
A set of wafer probeable diode noise source transfer standards are characterized using on-wafer noise temperature methods developed recently at the National Institute of Standards and Technology (NIST). This paper reviews the methods for accurate on-wafer

Comparison of SOLR and TRL Calibrations

June 1, 1998
Author(s)
Dave K. Walker, Dylan F. Williams
We examine a short-open-load-reciprocal scattering parameter calibration in both in-line and orthogonal probe configurations. We explore its standard definitions and verify its accuracy by comparing it to a multiline thru-reflect-line calibration.

In-Line Multiport Calibration Algorithm

June 1, 1998
Author(s)
Dylan F. Williams, Dave K. Walker
We present a multiport measurement procedure well suited to on-wafer measurement. It can correct multiport measurements with any conventional in-line calibration, including the thru-reflect-line calibration. We demonstrate the procedure in a four-port

Characterization of Broad-Band Transmission for Coplanar Waveguides on CMOS Silicon Substrates

May 1, 1998
Author(s)
V. Milanovic, Mehmet Ozgur, Donald C. DeGroot, Jeffrey Jargon, Michael Gaitan, Mona E. Zaghloul
This paper presents characteristics of microwave transmission in coplanar waveguides (CPW's) on silicon (Si) substrates fabricated through commercial CMOS foundries. Due to the CMOS fabrication, the metal strips of the CPW are encapsulated in thin films of

Uncertainties in NIST Noise-Temperature Measurements

March 1, 1998
Author(s)
James P. Randa
Uncertainty analyses are presented for NIST measurements of noise temperature. All systems currently used in NIST calibrations of thermal-noise sources are treated. These include tuned systems for 30 and 60 MHz, coaxial total-power radiometers for 1 to 12

Time-Domain Calibrations of D-Dot Sensors

February 1, 1998
Author(s)
Robert T. Johnk, Arthur Ondrejka
This Tech Note covers in detail the procedures that are necessary to measure the receive transfer function of a broadband electric-field sensor using direct-pulse, time-domain methods. The calibration techniques presented here are applicable to a cone and

Series-Resistor Calibration

December 1, 1997
Author(s)
Dylan F. Williams, Dave K. Walker
We develop a coplanar-waveguide probe-tip scattering parameter calibration based on a thru, a reflect, and an accurately modeled Series resistor. Comparison to a multiline Thru-Reflect-Line calibration verifies the accuracy of the method.
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