Krupka, J.
and Weil, C.
(1998),
Recent Advances in Metrology for the Electromagnetic Characterization of Bulk Materials at Microwave Frequencies, Proc., Intl. Microwave Conf. MIKON, Krakow, 1, PL (Accessed April 27, 2026)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Recent Advances in Metrology for the Electromagnetic Characterization of Bulk Materials at Microwave Frequencies
Published
Author(s)
Jerzy Krupka,
Proceedings Title
Proc., Intl. Microwave Conf. MIKON
Conference Dates
May 20-22, 1998
Conference Location
Krakow, 1, PL
Pub Type
Conferences
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact [email protected].
Created April 30, 1998, Updated October 12, 2021