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Recent Advances in Metrology for the Electromagnetic Characterization of Bulk Materials at Microwave Frequencies

Published

Author(s)

Jerzy Krupka, Claude Weil
Proceedings Title
Proc., Intl. Microwave Conf. MIKON
Conference Dates
May 20-22, 1998
Conference Location
Krakow, 1, PL

Citation

Krupka, J. and Weil, C. (1998), Recent Advances in Metrology for the Electromagnetic Characterization of Bulk Materials at Microwave Frequencies, Proc., Intl. Microwave Conf. MIKON, Krakow, 1, PL (Accessed April 17, 2024)
Created April 30, 1998, Updated October 12, 2021