Krupka, J.
and Weil, C.
(1998),
Recent Advances in Metrology for the Electromagnetic Characterization of Bulk Materials at Microwave Frequencies, Proc., Intl. Microwave Conf. MIKON, Krakow, 1, PL (Accessed May 19, 2026)
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Recent Advances in Metrology for the Electromagnetic Characterization of Bulk Materials at Microwave Frequencies
Published
Author(s)
Jerzy Krupka,
Proceedings Title
Proc., Intl. Microwave Conf. MIKON
Conference Dates
May 20-22, 1998
Conference Location
Krakow, 1, PL
Pub Type
Conferences
Citation
Issues
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Created April 30, 1998, Updated October 12, 2021