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Electronics

Electromagnetics

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Displaying 326 - 350 of 1580

Thermal Noise and Noise Measurements a 2010 Update

October 1, 2010
Author(s)
Anthony R. Kerr, James P. Randa
1. Introduction 2. Noise Temperature as a Measure of Noise Power 3. Available Noise Power from a Resistor 4. The Zero-Point Noise Term and the Minimum Noise of an Amplifier 5. Noise-Temperature Standards and Measurement of One-Port Noise Sources 6

Editorial: Editorial re. Associate Editors

August 1, 2010
Author(s)
Dylan F. Williams
Our editing team is key to the success of the Transactions. The Associate Editors who commit to a term of service are dedicated individual who work on a strictly voluntary basis to ensure the high quality of the manuscripts that are published. this is not

REFLECTIVITY STUDIES OF PASSIVE MICROWAVE CALIBRATION TARGETS AND ABSORPTIVE MATERIALS

July 30, 2010
Author(s)
Dazhen Gu, Amanda Cox, Derek A. Houtz, Dave K. Walker, James P. Randa, Robert L. Billinger
We report the characterization of blackbody reflections as a part of the recent progress on the development of brightness standards for microwave remote sensing at National Institute of Standards and Technology (NIST).Three blackbody targets at variable

Examining the True Effectiveness of Loading a Reverberation Chamber

July 29, 2010
Author(s)
Jason Coder, John M. Ladbury, Christopher L. Holloway, Kate Remley
In this paper we explore how placing the same amount of absorber in different locations within a reverberation chamber can have different loading effects. This difference can have a significant impact on measurement reproducibility, both for measurements

Quantum-Based SI Traceable Electric-Field Probe

July 25, 2010
Author(s)
Joshua A. Gordon, Christopher L. Holloway, Steven R. Jefferts, Thomas P. Heavner
We are presently investigating the feasibility of developing a technique that will allow direct traceable microwave electric field (E-field) measurements. The new approach is based on atomic rf-resonance spectroscopy, where an applied electrical field

Active Millimeter-Wave Imaging: Standoff Detection of Concealed Weapons

July 13, 2010
Author(s)
Randy Direen, David R. Novotny, Katherine MacReynolds
A near-field planar scanner is used to construct images of a nearby scene illuminated with millimeter-wave frequencies. We present our initial work in active millimeter-wave imaging, and how it applies to the detection of concealed weapons.

We need more "smarts" for the Society activity in Smart Grid

July 6, 2010
Author(s)
Galen H. Koepke, Donald Heirman
This editorial column in the Newsletter describes a recent "EMC for the Smart Grid" workshop held at Connectivity Week 2010 in Santa Clara, CA. The text is based on a meeting report from the workshop supplemented with remarks by the Associate Editor for

Two modes behavior of vortex oscillations in spin-transfer nanocontacts subject to in-plane magnetic fields

June 25, 2010
Author(s)
Michaela Kuepferling, Claudio Serpico, Matthew Pufall, William Rippard, Thomas Mitchell (Mitch) Wallis, Atif A. Imtiaz, Pavel Kabos
The field dependence of vortex oscillations in a spin-transfer metallic nanocontact, subject to in-plane, spatially uniform, external fields, is studied by measuring the power spectral density of the voltage across the device. The measured spectra as a

Behavior of e (omega} and tan d of a Class of Low-Loss Materials

June 18, 2010
Author(s)
James R. Baker-Jarvis, Michael D. Janezic, Billy F. Riddle, Kim Sung
In this project we study the behavior of the permittivity and loss tangent of a class of materials that exhibit relaxation. For relaxation response we show that the permittivity is a monotonically decreasing function of frequency. Also, for many low-liss

Simulator for Amplifier and Transistor Noise-Parameter Measurements

June 18, 2010
Author(s)
James P. Randa
This paper describes a simulation program that was developed to compare the uncertainties that would be expected with different measurement strategies for the noise parameters of connectorized amplifiers and of amplifiers or transistors on wafers. Both

Near-Field Antenna as a Scanning Microwave Probe for Characterization of Materials and Devices

April 12, 2010
Author(s)
Atif A. Imtiaz, Thomas M. Wallis, SangHyun S. Lim, Jonathan Chisum, Zoya Popovic, Pavel Kabos
The Scanning Microwave Probe (SMP) is emerging as an important broadband metrology tool for characterizing the materials and devices in the micron and sub-micron length scales in the frequency range of 10 MHz to 110 GHz. In this document we establish three

High-Frequency Dielectric Measurements: A Tutorial

April 1, 2010
Author(s)
James R. Baker-Jarvis, Michael D. Janezic, Donald C. DeGroot
KNOWLEDGE of the response of materials to electromagnetic (EM) fields in the frequency range of radio frequency (RF) through terahertz (THz) is critical to numerous research projects and electronic product development activities. Electromagnetic waves in

Broadband Characterization of Individual Platinum Nanowires

March 7, 2010
Author(s)
Kichul Kim, Thomas M. Wallis, Paul Rice, Chin J. Chiang, Atif A. Imtiaz, Pavel Kabos, Dejan Filipovic
Conductivity and contact resistance of 100 nm and 250 nm diameter platinum (Pt) nanowires (NWs) are investigated computationally and experimentally. Finite element method based full-wave modeling and circuit simulations are used in conjunction with
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