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Simulator for Amplifier and Transistor Noise-Parameter Measurements

Published

Author(s)

James P. Randa

Abstract

This paper describes a simulation program that was developed to compare the uncertainties that would be expected with different measurement strategies for the noise parameters of connectorized amplifiers and of amplifiers or transistors on wafers. Both type A and type B uncertainties are included. An illustrative example is given.
Proceedings Title
CPEM 2010: Conference on Precision Electromagnetics Measurement 2010
Conference Dates
June 13-18, 2010
Conference Location
Daejeon
Conference Title
CPEM CONFERENCE ON PRECISION ELECTROMAGNETIC MEASUREMENTS

Keywords

amplifier noise, measurement uncertainty, noise measurement, noise parameters, transistor noise

Citation

Randa, J. (2010), Simulator for Amplifier and Transistor Noise-Parameter Measurements, CPEM 2010: Conference on Precision Electromagnetics Measurement 2010, Daejeon, -1, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=904927 (Accessed February 23, 2024)
Created June 18, 2010, Updated February 19, 2017