Simulator for Amplifier and Transistor Noise-Parameter Measurements
James P. Randa
This paper describes a simulation program that was developed to compare the uncertainties that would be expected with different measurement strategies for the noise parameters of connectorized amplifiers and of amplifiers or transistors on wafers. Both type A and type B uncertainties are included. An illustrative example is given.
CPEM 2010: Conference on Precision Electromagnetics Measurement 2010
June 13-18, 2010
CPEM CONFERENCE ON PRECISION ELECTROMAGNETIC MEASUREMENTS