Randa, J.
(2010),
Simulator for Amplifier and Transistor Noise-Parameter Measurements, CPEM 2010: Conference on Precision Electromagnetics Measurement 2010, Daejeon, -1, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=904927
(Accessed October 22, 2025)
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Simulator for Amplifier and Transistor Noise-Parameter Measurements
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Abstract
This paper describes a simulation program that was developed to compare the uncertainties that would be expected with different measurement strategies for the noise parameters of connectorized amplifiers and of amplifiers or transistors on wafers. Both type A and type B uncertainties are included. An illustrative example is given.Proceedings Title
CPEM 2010: Conference on Precision Electromagnetics Measurement 2010
Conference Dates
June 13-18, 2010
Conference Location
Daejeon
Conference Title
CPEM CONFERENCE ON PRECISION ELECTROMAGNETIC MEASUREMENTS
Pub Type
Conferences
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Keywords
amplifier noise, measurement uncertainty, noise measurement, noise parameters, transistor noise
Citation
Issues
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Created June 18, 2010, Updated February 19, 2017