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Behavior of ε (omega} and tan δ of a Class of Low-Loss Materials

Published

Author(s)

James R. Baker-Jarvis, Michael D. Janezic, Billy F. Riddle, Kim Sung

Abstract

In this project we study the behavior of the permittivity and loss tangent of a class of materials that exhibit relaxation. For relaxation response we show that the permittivity is a monotonically decreasing function of frequency. Also, for many low-liss ceramics, glasses, crystals, and solid polymers it is found that the loss tangent increases nearly linearly with frequency. This linearity is explained in terms of the pulse-response function and the Sparks-King-Mills model. We show that the linearity may be used to extrapolate the loss tangent out of the measurement band
Proceedings Title
CPEM 2010: Conference on Precision Electromagnetics Measurement 2010
Conference Dates
June 13-18, 2010
Conference Location
Daejeon

Keywords

Dielectric, loss tangent, low loss, microwave, millimeter wave, Dielectric, loss tangent, low loss, microwave, millimeter wave

Citation

Baker-Jarvis, J. , Janezic, M. , Riddle, B. and Sung, K. (2010), Behavior of ε (omega} and tan δ of a Class of Low-Loss Materials, CPEM 2010: Conference on Precision Electromagnetics Measurement 2010, Daejeon, -1, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=904756 (Accessed June 22, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created June 18, 2010, Updated February 19, 2017