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Quantum-Based SI Traceable Electric-Field Probe

Published

Author(s)

Joshua A. Gordon, Christopher L. Holloway, Steven R. Jefferts, Thomas P. Heavner

Abstract

We are presently investigating the feasibility of developing a technique that will allow direct traceable microwave electric field (E-field) measurements. The new approach is based on atomic rf-resonance spectroscopy, where an applied electrical field causes a transition between high-lying Rydberg states of an atom. The new technique will allow direct E-field measurements, traceable to fundamental physical constants and SI units. If successful, this self calibrating probe will provide more accurate field measurements and a better sensitivity than present techniques. Direct traceable E-field measurements with sensitivities below 0.1 V/m could be possible.
Proceedings Title
IEEE International Symposium on EMC
Conference Dates
July 25-30, 2010
Conference Location
Fort Lauderdale, FL

Keywords

calibration, probe, traceability, Rydberg, Electric field

Citation

Gordon, J. , Holloway, C. , Jefferts, S. and Heavner, T. (2010), Quantum-Based SI Traceable Electric-Field Probe, IEEE International Symposium on EMC, Fort Lauderdale, FL, [online], https://doi.org/10.1109/ISEMC.2010.5711293 (Accessed April 14, 2024)
Created July 25, 2010, Updated November 10, 2018