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Electronics

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Displaying 626 - 650 of 695

Anomalies Observed in Wafer Level Microwave Testing

July 10, 1991
Author(s)
Dylan F. Williams, Roger Marks, T H. Miers, A Cangellaris
Two anomalies have been observed in the course of developing planar wafer level standards for the testing of GaAs monolithic microwave integrated circuits. The first involves a low-frequency characteristic impedance change of microstrip and coplanar

Growth and properties of YBa2Cu3O7 thin films on vicinal and polycrystalline MgO substrates

December 21, 1990
Author(s)
Stephen E. Russek, Brian H. Moeckly, D. K. Lathrop, R A. Buhrman, M. G. Norton, C, B. Carter
We discuss the results of a study on the growth by laser ablation of YBa2Cu3O7 thin films on polycrystalline and annealed vicinal (001) MgO substrates. In both instances the filss were found to grow predominantly with the c axis normal the the plane of the
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