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Clathrate Hydrate Physical Property Database

Author(s)
Kenneth G. Kroenlein, Chris D. Muzny, Andrei F. Kazakov, Vladimir Diky, Robert D. Chirico, E. D. Sloan, Michael D. Frenkel
To facilitate advances in application of technologies pertaining to gas hydrates, a database containing experimentally-derived information about those materials...

Overview of the TAC 2008 Update Summarization Task

Author(s)
Hoa T. Dang, Karolina K. Owczarzak
The summarization track at the Text Analysis Conference (TAC) is a direct continuation of the Document Understanding Conference (DUC) series of workshops...

A VVSG-derived model of election data

Author(s)
David W. Flater
An effort to define a common data format for voting systems should begin with a data model that specifies the relevant concepts. To accelerate adoption and...

Performance of a Nanopositioner Controller Filter Compensator

Author(s)
Donna Le, Nicholas Dagalakis, Jason J. Gorman, Jae M. Yoo
We describe the use of appropriate type simple resistor and capacitor (RC) compensators, which properly connected to a power amplifier, can improve the dynamic...

NIST s Integrated Colony Enumerator (NICE)

Author(s)
Matthew L. Clarke, Jeeseong Hwang
Enumeration of bacterial colonies in an agar plate is simple in concept, but automated colony counting is difficult due to variations in colony color, size...

DSQAP Exercise C Report

Author(s)
Catherine A. Rimmer, Laura J. Wood, Katrice A. Lippa, Melissa M. Phillips

Mobile Device Forensics - Tool Testing

Author(s)
Richard Ayers
The goal of the Computer Forensic Tool Testing (CFTT) project at the National Institute of Standards and Technology (NIST) is to establish a methodology for...

Non-GSM Mobile Device Tool Specification

Author(s)
Richard Ayers
As mobile devices proliferate, incorporating a host of integrated features and capabilities, their use can be seen everywhere in our world today. Mobile...

2nd Annual Tri-National Workshop on Standards for Nanotechnology - (NIST presentations)

Author(s)
Ronald G. Dixson, Jon R. Pratt, Vincent A. Hackley, James E. Potzick, Richard A. Allen, Ndubuisi G. Orji, Michael T. Postek, Herbert S. Bennett, Theodore V. Vorburger, Jeffrey A. Fagan, Robert L. Watters
A new era of cooperation between North American National Measurement Institutes (NMIs) was ushered by the National Research Council of Canada Institute for...

Proprietary Design Information and Fruit Pies

Author(s)
John A. Horst
The proliferation of proprietary design info exchange formats is causing high costs to manufacturers. The standards solution is offered as both attainable and...

The NIST Standards in Trade Program

Author(s)
P L. Heydemann
Plans, organizes, and manages the placement of technical experts from NIST, or selected by NIST, in key U.S. embassies and missions to provide technical advice...

Diagnosis of Pulsed Squeezing in Multiple Temporal Modes

Author(s)
Scott C. Glancy, Emanuel H. Knill, Thomas Gerrits, Tracy S. Clement, Martin J. Stevens, Sae Woo Nam, Richard P. Mirin
When one makes squeezed light by downconversion of a pulsed pump laser, many temporal / spectral modes are simultaneously squeezed by different amounts. There...

Environmental Trends Affecting Electronics Manufacturing

Author(s)
Eric D. Simmon, John V. Messina, Matthew L. Aronoff, Michael Cox
Companies that in the recent past were primarily concerned with satisfying environmental regulations are finding that environmental responsibility and...

The Role of Phase Noise Research and Metrology

Author(s)
David A. Howe
The oscillating, or repeating, signal that is the basis for constructing all signals is a voltage that exactly follows simple periodic sine and cosine functions...

Information management for Environmental Concerns

Author(s)
Eric D. Simmon, John V. Messina, Kevin G. Brady
Around the world there is a growing awareness that the environmental impact from manufacturing needs to be minimized. Concerns about issues from toxic materials...
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