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Proprietary Design Information and Fruit Pies

Author(s)
John A. Horst
The proliferation of proprietary design info exchange formats is causing high costs to manufacturers. The standards solution is offered as both attainable and

The NIST Standards in Trade Program

Author(s)
P L. Heydemann
Plans, organizes, and manages the placement of technical experts from NIST, or selected by NIST, in key U.S. embassies and missions to provide technical advice

Diagnosis of Pulsed Squeezing in Multiple Temporal Modes

Author(s)
Scott C. Glancy, Emanuel H. Knill, Thomas Gerrits, Tracy S. Clement, Martin J. Stevens, Sae Woo Nam, Richard P. Mirin
When one makes squeezed light by downconversion of a pulsed pump laser, many temporal / spectral modes are simultaneously squeezed by different amounts. There

Environmental Trends Affecting Electronics Manufacturing

Author(s)
Eric D. Simmon, John V. Messina, Matthew L. Aronoff, Michael Cox
Companies that in the recent past were primarily concerned with satisfying environmental regulations are finding that environmental responsibility and

The Role of Phase Noise Research and Metrology

Author(s)
David A. Howe
The oscillating, or repeating, signal that is the basis for constructing all signals is a voltage that exactly follows simple periodic sine and cosine functions

Information management for Environmental Concerns

Author(s)
Eric D. Simmon, John V. Messina, Kevin G. Brady
Around the world there is a growing awareness that the environmental impact from manufacturing needs to be minimized. Concerns about issues from toxic materials

CVSS-SIG Version 2 History

Author(s)
Peter M. Mell, Karen A. Scarfone, Gavin Reid
This document attempts to interpret the history and rationale behind changes made in the Common Vulnerability Scoring System (CVSS) from version 1 to version 2

Cryogenic Technologies Group Website

Author(s)
Marilyn R. Yetzbacher, Peter E. Bradley
Revised website of Information pertaining to the Cryogenics Group. Provides general information, staffing, contact information, articles and publications

Differential magnetometry based on a diverging laser beam

Author(s)
Eleanor Hodby, Elizabeth A. Donley, John E. Kitching
We discuss a new, compact design for a chip-scale differential atomic magnetometer that uses a single diverging laser beam to both pump and multiply probe the

Spin Torque for Dummies

Author(s)
Thomas J. Silva
I will present a stripped down presentation on the fundamental mechanisms that give rise to spin torque effects. This presentation will assume the audience has

Scanning Tunneling Microscope - Web Page

Author(s)
Marilyn E. Jacox, John William Gadzuk
The scanning tunneling microscope [STM] is widely used in both industrial and fundamental research to obtain atomic-scale images of metal surfaces. It provides

Ionic Liquids Database (ILThermo)

Author(s)
Qian Dong, Andrei F. Kazakov, Chris D. Muzny, Robert D. Chirico, Jason A. Widegren, Vladimir Diky, Joe W. Magee, Kenneth N. Marsh, Michael D. Frenkel
Ionic Liquids Database (ILThermo)is a free web research tool that allow users worldwide to access an up-to-data data collection from the publications on

CCEM.RF-S1.CL (GTRF/02-03): RF Power Measurements with 2.4 mm Connectors

Author(s)
Thomas P. Crowley, J Miall, J dereede, J. Furrer, A Michaud, E. Dressler, T Zhang, K. Shimaoka, Ji Hyun Kim
A supplementary comparison of RF power measurements using 2.4 mm connectors was performed at 9 national metrology laboratories. The traveling standards were two

High-Contrast CPT Resonances

Author(s)
John E. Kitching
The performance of an atomic clock or magnetometer based on CPT is determined by the resonance width and the signal-to-noise ratio. In particular, a large

Long-term Frequency Stability of Chip-Scale Atomic Clocks

Author(s)
Vladislav Gerginov, Svenja A. Knappe, V Shah, P Schwindt, Leo W. Hollberg, John E. Kitching
We present an evaluation of the long-term frequency instability and environmental sensitivity of a chip-scale atomic clock based on coherent population trapping

Chip-Scale Atomic Devices at NIST

Author(s)
John E. Kitching
The NIST program on chip-scale atomic devices (CSAD) seeks to design, build and characterize miniature atomic instruments and sensors based on fabrication