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Rationale of Color Quality Scale

Author(s)
Yoshihiro Ohno, Wendy L. Davis
The color quality of solid state lighting (SSL) products is critical and is the subject of increasing attention. The CIE Color Rendering Index (CRI) [1] has...

Why are we concerned with large covariance matrices?

Author(s)
Paul D. Hale, Andrew M. Dienstfrey, Chih-Ming Wang
In order to promote discussion, we outline the two different paradigms for propagating uncertainties from the various waveform measurement impairments to the...

CCQM–K62: Nutrients in Infant/Adult Formula – Vitamins: Final Report

Author(s)
Katherine E. Sharpless, Catherine A. Rimmer, Karen W. Phinney, Bryant C. Nelson, David L. Duewer, Stephen A. Wise
Key Comparison CCQM-K62 was designed to enable demonstration of the equivalence in capabilities for measurement of vitamins in a food matrix. A milk-based...

Smart Phone Tool Specification

Author(s)
Richard Ayers
This paper defines requirements for mobile device applications capable of acquiring data from smart phones operating over a Global System for Mobile...

Smart Phone Tool Test Assertions and Test Plan

Author(s)
Richard Ayers
This paper defines assertions and test cases for mobile device applications capable of acquiring data from mobile devices operating over a Global System for...

Strategic Plan 2010

Author(s)
Gerald T. Fraser
The Optical Technology Division s 2010 Strategic Plan defines the Mission, Vision, and Strategic Elements for the Division. The Strategic Elements consist of...

Nanomechanical Measurements and Tools

Author(s)
Robert F. Cook
Nanotechnology provides great opportunities for the development of advanced devices with enormous quality-of-life and economic benefits, with applications...

Report on the Key Comparison CCPR K2.a-2003

Author(s)
Yoshihiro Ohno, Steven W. Brown, Thomas C. Larason
Under the framework of Mutual Recognition Arrangement (MRA) for national measurements standards and for calibration and measurement certificates issued by...

Innovations in Maximum Likelihood Quantum State Tomography

Author(s)
Scott C. Glancy, Emanuel H. Knill, Thomas Gerrits, Tracy S. Clement, Brice R. Calkins, Adriana E. Lita, Aaron J. Miller, Alan L. Migdall, Sae Woo Nam, Richard P. Mirin
At NIST we are engaged in an experiment whose goal is to create superpositions of optical coherent states (such superpositions are sometimes called...

Update on DMIS Certification

Author(s)
William G. Rippey
The Dimensional Standards Consortium (DMSC) and the National Institute of Standards and Technology (NIST) announced the rollout of the DMSC's DMIS Certification...

First approaches to standard protocols and reference materials for the assessment of potential hazards associated with nanomaterials

Author(s)
Iseult Lynch, Hans Bouwmeester, Hans Marvin, Alan Casey, Gordon Chambers, Markus Berges, Martin Clift, Teresa Fernandes, Lise Fjellsbo, Lucienne Juillerat, Gert Roebben, Christoph Klein, Qinglan Wu, Vincent A. Hackley, Jean-Pierre Kaiser, Wolfgang Kreyling, C. Michael Garner, Peter Hatto, Kenneth Dawson, Michael Riediker
This report presents the outcome of the discussions of 60 experts in the field of safety assessment of manufactured NMs from academia, industry, government and...
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