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Full waveform metrology: characterizing high-speed electrical signals and equipment

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Author(s)

Paul D. Hale, Andrew M. Dienstfrey, Chih-Ming Wang

Abstract

We review NIST efforts in high-speed waveform metrology and place these in the context of the Euramet project on dynamical metrology. Aspects of waveform metrology that need particular consideration for high-speed electrical applications are discussed. These include time calibration, the effect of the wave-like nature of the electrical signal, the requirement of low uncertainties in both the time and frequency domains, and the dynamic nature of the measurements, thus making deconvolution necessary.
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NIST
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http://NIST.GOV
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Keywords

covariance, highspeed, metrology, uncertainty, waveform
Optoelectronics

Citation

Hale, P. , Dienstfrey, A. and Wang, C. (2010), Full waveform metrology: characterizing high-speed electrical signals and equipment, NIST, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=906015, http://NIST.GOV (Accessed December 12, 2024)

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Created June 1, 2010, Updated April 12, 2019