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A History of Fire Testing: Past, Present, and Future.

March 30, 2009

Author(s)

James R. Lawson

This paper discusses the breakthroughs in science and engineering that have brought fire testing technology to its current state of maturity and provides...

Making Kilopixel X-Ray Microcalorimeter Arrays a Reality

February 9, 2009

Author(s)

William B. Doriese, Megan E. Eckart

To enable unprecedented imaging X-ray spectroscopy, scientists at NASA's Goddard Space Flight Center and the National Institute of Standards and Technology are...

Non-GSM Mobile Device Tool Specification

January 7, 2009

Author(s)

Richard Ayers

As mobile devices proliferate, incorporating a host of integrated features and capabilities, their use can be seen everywhere in our world today. Mobile...

GSM Mobile Device and Associated Media Tool Specification

January 6, 2009

Author(s)

Richard Ayers

Mobile devices incorporating cellular capabilities are ubiquitous and contain a wealth of personal information useful in criminal cases, civil disputes...

Non-GSM Mobile Device Tool Test Assertions and Test Plan

January 1, 2009

Author(s)

Richard Ayers

As mobile devices proliferate, incorporating a host of integrated features and capabilities, their use can be seen everywhere in our world today. Mobile...

National Conference on Weights and Measures Interim Meeting Agenda, January 11 to 14, 2009. (Publication 15, 2009)

December 16, 2008

Author(s)

Linda D. Crown, Tina G. Butcher, Steven E. Cook, Lisa Warfield

This is the agenda for the four Standing Committees of the National Conference on Weights and Measures - 94th Interim Meeting. This meeting will be held at the...

2nd Annual Tri-National Workshop on Standards for Nanotechnology - (NIST presentations)

December 10, 2008

Author(s)

Ronald G. Dixson, Jon R. Pratt, Vincent A. Hackley, James E. Potzick, Richard A. Allen, Ndubuisi G. Orji, Michael T. Postek, Herbert S. Bennett, Theodore V. Vorburger, Jeffrey A. Fagan, Robert L. Watters

A new era of cooperation between North American National Measurement Institutes (NMIs) was ushered by the National Research Council of Canada Institute for...

Real time Data acquisition platform: computer software and FPGA firmware source codes

December 5, 2008

Author(s)

Sergey V. Polyakov

We present an inexpensive and simple data acquisition platform for Field Programmable Gate Arrays (FPGAs) designed to acquire and characterize fast digital or...

Proprietary Design Information and Fruit Pies

November 7, 2008

Author(s)

John A. Horst

The proliferation of proprietary design info exchange formats is causing high costs to manufacturers. The standards solution is offered as both attainable and...

NIST 38. NIST Spectroscopic Properties of Atoms and Atomic Ions Database

October 16, 2008

Author(s)

J R. Rumble

The NIST Spectroscopic Properties of Atoms and Atomic Ions Database provides listings of prominent air or vacuum emission wavelengths for neutral atoms and...

The NIST Standards in Trade Program

October 16, 2008

Author(s)

P L. Heydemann

Plans, organizes, and manages the placement of technical experts from NIST, or selected by NIST, in key U.S. embassies and missions to provide technical advice...

Diagnosis of Pulsed Squeezing in Multiple Temporal Modes

August 26, 2008

Author(s)

Scott C. Glancy, Emanuel H. Knill, Thomas Gerrits, Tracy S. Clement, Martin J. Stevens, Sae Woo Nam, Richard P. Mirin

When one makes squeezed light by downconversion of a pulsed pump laser, many temporal / spectral modes are simultaneously squeezed by different amounts. There...

Recommended List of Common Impurities for Metallic Fixed-point Materials of the ITS-90

August 18, 2008

Author(s)

Dean C. Ripple, Anatoly Pokhodun, Peter Steur, Gregory F. Strouse

Working Group 1 of the Consultative Committee for Thermometry (CCT) has recommended methods for estimating the uncertainties of fixed-point temperatures...

Report from the Mise en Pratique Task Group: the next international temperature scale and the mise en pratique for the definition of the kelvin

August 18, 2008

Author(s)

Dean C. Ripple, Bernd Fellmuth, Joachim Fischer, Graham Machin, PPM Steur, Osamu Tamura, Rod D. White

The Consultative Committee for Thermometry has asked Working Group 1 to coordinate a task group formulating an assessment and possible work plan for the next...

Environmental Trends Affecting Electronics Manufacturing

August 1, 2008

Author(s)

Eric D. Simmon, John V. Messina, Matthew L. Aronoff, Michael Cox

Companies that in the recent past were primarily concerned with satisfying environmental regulations are finding that environmental responsibility and...

Comparison of the NIST and NRC Josephson Voltage Standards (SIM.EM.BIPM-K10.b)

July 1, 2008

Author(s)

Yi-hua Tang, Barry Wood

A comparison between the National Institute of Standards and Technology (NIST) and the National Research Council (NRC) Josephson Voltage Standards (JVS) was...

Quirks Uncovered While Testing Forensic Tool

March 28, 2008

Author(s)

James R. Lyle

Powerpoint

The Role of Phase Noise Research and Metrology

February 19, 2008

Author(s)

David A. Howe

The oscillating, or repeating, signal that is the basis for constructing all signals is a voltage that exactly follows simple periodic sine and cosine functions...

Unified Strain-and-Temperature Scaling Law: Separable Parameter Set

February 11, 2008

Author(s)

John (Jack) W. Ekin

Power Point slides to be posted on web

Information management for Environmental Concerns

February 8, 2008

Author(s)

Eric D. Simmon, John V. Messina, Kevin G. Brady

Around the world there is a growing awareness that the environmental impact from manufacturing needs to be minimized. Concerns about issues from toxic materials...

GSM Mobile Device and Associated Media Tool Test Assertions and Test Plan

January 6, 2008

Author(s)

Richard P. Ayers

International Legal Metrology Organizational Primer

December 31, 2007

Author(s)

S. W. Stiefel

The world's metrology and legal metrology infrastructure abounds with organizations that play differing roles such as measurement research, standards, and...

Analysis of uncertainty in particle mass measurement using an aerosol particle mass analyzer

September 9, 2007

Author(s)

Kensei Ehara, Hiromu Sakurai, Akira Yabe, Naoko Tajima, Kevin Coakley

The aerosol particle mass analyzer (APM) classifies aerosol particles according to their mass-to-charge ratio (Ehara et al., 1996). Particle mass can be...

A Complete Guide to the Common Vulnerability Scoring System Version 2.0

July 30, 2007

Author(s)

Peter M. Mell, Karen A. Scarfone, Sasha Romanosky

The Common Vulnerability Scoring System (CVSS) provides an open framework for communicating the characteristics and impacts of IT vulnerabilities. CVSS consists...

CVSS-SIG Version 2 History

July 30, 2007

Author(s)

Peter M. Mell, Karen A. Scarfone, Gavin Reid

This document attempts to interpret the history and rationale behind changes made in the Common Vulnerability Scoring System (CVSS) from version 1 to version 2...

Cryogenic Technologies Group Website

June 11, 2007

Author(s)

Marilyn R. Yetzbacher, Peter E. Bradley

Revised website of Information pertaining to the Cryogenics Group. Provides general information, staffing, contact information, articles and publications...

Differential magnetometry based on a diverging laser beam

March 25, 2007

Author(s)

Eleanor Hodby, Elizabeth A. Donley, John E. Kitching

We discuss a new, compact design for a chip-scale differential atomic magnetometer that uses a single diverging laser beam to both pump and multiply probe the...

Why is a minute divided into 60 seconds, an hour into 60 minutes, yet there are only 24 hours in a day?

March 5, 2007

Author(s)

Michael A. Lombardi

A Novel Peak Detection Algorithm for Use in the Study of Machining Chip Segmentation

March 1, 2007

Author(s)

Eric P. Whitenton

The study of how metal is deformed (how it flows) as parts are machined yields important insights into the metal cutting process. Recent improvements in both...

Spin Torque for Dummies

January 6, 2007

Author(s)

Thomas J. Silva

I will present a stripped down presentation on the fundamental mechanisms that give rise to spin torque effects. This presentation will assume the audience has...

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