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Talks

A Fast, Simple Wafer-level Hall-Mobility Measurement Technique

Author(s)
Liangchun (. Yu, Kin P. Cheung, Vinayak Tilak, Greg Dunne, Kevin Matocha, Jason P. Campbell, Kuang Sheng
Mobility is a good indicator of device reliability. High channel mobility is one of the biggest challenges especially in novel devices such as high-k based

NBTI: Why Won't This Thing Go Away?

Author(s)
Jason P. Campbell
The negative-bias temperature instability (NBTI) is a reliability problem that, in the last ten years, has risen from relative obscurity to become the most

Wafer-level Hall Measurement on SiC MOSFET

Author(s)
Liangchun (. Yu, Kin P. Cheung, Vinayak Tilak, Greg Dunne, Kevin Matocha, Jason P. Campbell, John S. Suehle, Kuang Sheng
Low channel mobility is one of the biggest challenges to commercializing SiC MOSFETs. Accurate mobility measurement is essential for understanding the

Fabrication with Flip-Chip Lamination

Author(s)
Mariona Coll Bau, Curt A. Richter, Christina Hacker
Fabrication with Flip-Chip Lamination , Mariona Coll, DR Hines, CA Richter, CA Hacker, MRSEC surface physics colloquium, University of Maryland, College Park

Station Nightclub Fire Investigation Status Report.

Author(s)
William L. Grosshandler
National Construction Safety Team (NCST) Advisory Committee Meeting, Presentation: The Station Nightclub Fire Investigation Status Report, October 20, 2004
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