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Modeling and Development of Polishing Processes

February 17, 2000

Author(s)

R B. Mindek

Lapping and polishing have a long history and are probably the oldest known manufacturing professions. They are considered abrasive processes and are used to

Unified Advanced CD-SEM specification for Sub-0.18um Technology (1999 Version)

January 31, 2000

Author(s)

J Allgair, C Archie, W Banke, H Bogardus, A Delaporte, Michael T. Postek, J Schlesinger, B Singh, Andras Vladar, A Yanof

The Advanced Metrology Advisory Group (AMAG) comprised of representatives from: the International SEMATECH (ISEMATECH) consortium member companies; the National

Chaotic Resonnce: Hopping Rates, Spectra and Signal-to-Noise Ratios.

January 1, 2000

Author(s)

Emil Simiu, A Kovaleva

We consider a noise-free bistable system with a low frequency signal and a secondary harmonic excitation that causes the system to experience chaotic motion

PARCS - A Primary Atomic Reference Clock in Space

January 1, 2000

Author(s)

Thomas P. Heavner, Leo W. Hollberg, Steven R. Jefferts, D Meekhof, Thomas E. Parker, William D. Phillips, S L. Rolston, Neil Ashby, W Klipstein, L Maleki, D Seidel, R W. Thompson, L Young, R Vessot, E Mattison, A Demarchi

A Recommendation for an Inspection Standard to Control Sub-Surface Damage in Single-Crystal Sapphire Components

January 1, 2000

Author(s)

Robert S. Polvani

A variety of characterization techniques have been investigated to study surface and subsurface damage in single-crystal sapphire. To characterize the damage in

The Effect of Non-Linear Viscoelasticity on Interfacial Shear Strength Measurements

January 1, 2000

Author(s)

Gale A. Holmes, R C. Petersen, Donald L. Hunston, Walter G. McDonough, C L. Schutte

A Microshear Test to Measure the Bond Between Dental Composites and Dental Substrates

January 1, 2000

Author(s)

Walter G. McDonough, Joseph M. Antonucci, Gary E. Schumacher, Y Shimada

Mechanical property tests such as the diametral tensile, uniaxial tensile, biaxial flexural, shear, and transverse strength tests are commonly used for

Effects of Resin Composition on the Remineralizing Ability of Amorphous Calcium Phosphate-Based Polymeric Composites

January 1, 2000

Author(s)

Joseph M. Antonucci, Drago Skrtic, E D. Eanes

Amorphous calcium phosphate (ACP)/acrylic matrix composites have the potential to promote remineralization and/or prevent demineralization of tooth structures

Color Issues of White LEDs

January 1, 2000

Author(s)

Yoshihiro Ohno

Microroughness-blind Optical Scattering Instrument

January 1, 2000

Author(s)

Thomas A. Germer

Final Report: 1998-1999 NIST/SEMATECH Project on Intercomparison of Linewidth Measurement Methods

January 1, 2000

Author(s)

John S. Villarrubia, Ronald G. Dixson, Samuel N. Jones, J R. Lowney, Michael T. Postek

Abstract unavailable.

1998-99 NIST/International SEMATECH Collaboration to Develop Atom-Based Linewidth Standards

January 1, 2000

Author(s)

Richard M. Silver

This is the final report for the SEMATECH funded SEMATECH/NIST contract for the development of atom-based standard artifacts. This report is intended to

Gate Dielectric Metrology Review: Project FEPZ001 Year 2 Report

January 1, 2000

Author(s)

Dennis Maher, Curt A. Richter

New Developments in Deep Ultraviolet Laser Metrology for Photolithography

January 1, 2000

Author(s)

Marla L. Dowell, Christopher L. Cromer, Richard D. Jones, Darryl A. Keenan, Thomas Scott

Current and future laser measurement services at 157, 193, and 248 nm will be reviewed. Laser power and energy measurements at 193 nm will be presented

NIST Random Profile Roughness Specimens and Standard Bullets

January 1, 2000

Author(s)

Jun-Feng Song, Theodore V. Vorburger, Robert A. Clary, Michael L. McGlauflin, Eric P. Whitenton, Christopher J. Evans

Based on the numerical controlled (NC) diamond turning process used previously for manufacturing random profile roughness specimens, two prototype standard

Final Report, 1998-1999 NIST/SEMATECH Collaboration for Improvement of High-Accuracy Critical-Dimension Meetrology for Semiconductor Manufacturing

December 14, 1999

Author(s)

Andras Vladar, Michael T. Postek

Beginning on or about January 15, 1999, researchers at the National Institute of Standards and Technology (NIST) received partial support from ISEMATECH to

Energy Dispersive X-Ray Spectrometry With the Transition Edge Sensor Microcalorimeter: A Revolutionary Advance in Materials Microanalysis

December 1, 1999

Author(s)

Dale E. Newbury, David A. Wollman, Kent D. Irwin, Gene C. Hilton, John M. Martinis

The NIST microcalorimeter energy dispersive x-ray spectrometer provides important advances in x-ray spectrometry. The high spectral resolution, approaching 2 eV

Miniaturization of Bioassays for Toxicological Analysis

December 1, 1999

Author(s)

Laurie E. Locascio

Short-Lived Ozone-Related Compounds, Scientific Assessment of Ozone Depletion: 1998, World Meteorological Organization

December 1, 1999

Author(s)

Michael J. Kurylo III, J M. Rodriguez, M O. Andreae, E L. Atlas, D Blake, John M. Butler, S Lal, D J. Lary, P M. Midgley, Stephen A. Montzka, P C. Novelli, C E. Reeves, P G. Simmonds, L P. Steele, W T. Sturges, R F. Weiss, Y Yokouichi

Boreal Fires, Aerosol Transport, and Feedback to Climate Change: The Need for a Large High-Intensity Boreal Crown Fire Experiment

December 1, 1999

Author(s)

W R. Cofer, C Cahoon, R D, B J. Stocks, J G. Goldhammer, Joseph Conny, M D. Fromm

Evaluation of Analytical Methodologies for Non-Intrusive Drug Testing: Supercritical Fluid Extraction of Cocaine from Hair

December 1, 1999

Author(s)

F Morrison j, Lorna T. Sniegoski, W J. Yoo

DVD '99 Workshop: Standards, Applications, and Technology

November 1, 1999

Author(s)

V R. McCrary, J H. Costello

Proceeding for DVD '99 Workshop: Standards, Applications, and Technology including the speeches of the keynote speakers.

Extracting Thermochemical Information From Ab Initio Data

November 1, 1999

Author(s)

Karl K. Irikura

These are two lectures delivered at the NATO ASI on Energetics of Stable Molecules and Reactive Intermediates, Castelo Branco, Portugal, July 1998. They have

Y2K Embedded System Testing Guidelines

October 27, 1999

Author(s)

G E. Fisher, M Cherry

Guidelines for what to test in the embedded systems world are presented with respect to the year 2000 problem.

Buoyant Turbulent Jets and Flames. Part 3. Round Turbulent Nonbuoyant Starting Jets and Puffs and Buoyant Starting Plumes and Thermals. Annual Report.

October 1, 1999

Author(s)

R Sangras, Z Dai, G M. Faeth

A theoretical and experimental study of the temporal development of round turbulent nonbuoyant starting jets and puffs and buoyant starting plumes and thermals

Buoyant Turbulent Jets and Flames. Part 1. Adiabatic Wall Plumes. Annual Report.

October 1, 1999

Author(s)

R Sangras, Z Dai, G M. Faeth

An investigation of the structure and mixing properties of buoyant turbulent plumes is described, motivated by the need to resolve effects of buoyancy

The Fifth SeaWiFS Intercalibration Round-Robin Experiment (SIRREX-S), July 1996

October 1, 1999

Author(s)

Bettye C. Johnson, Howard W. Yoon, Sally S. Bruce, Ping-Shine Shaw, E A. Thompson, S B. Hooker, R Barnes, R Eplee, S Maritorena, J Mueller

This report documents the fifth Sea-viewing Wide Field-of-view Sensor (SeaWiFS) Intercalibration Round-Robin experiment (SIRREX-5), which was held at the

Analytical and Diagnostic Techniques for Semiconductor Materials, Devices, and Processes

October 1, 1999

Author(s)

B O. Kolbensen, C Claeys, P Stallhofer, F Tardif, Kimberly Benton, Thomas J. Shaffner, D Schroder, S Kishino, P Rai-Choudhury

Guide for the Selection of Commercial Explosives Detection Systems for Law Enforcement Applications

September 1, 1999

Author(s)

Alim A. Fatah, Kathleen M. Higgins

This document includes a variety of information that is intended to be useful to the law enforcement community in the selection of explosives detection

Evaluation of a Test Protocol for Explosives Trace Detectors Using a Representative Commercial Analyzer

September 1, 1999

Author(s)

G A. Eiceman, C Boyett, J E. Parmeter, Alim A. Fatah, Kathleen M. Higgins

A test protocol for evaluating trace detection has been developed and evaluated using a representative commercial analyzer. The test protocol was included as

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