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NIST/NOAA NS&T Intercomparison Exercise Program for Organic Contaminants in the Marine Environment Description and Results of 1999 Organic Intercomparison Exercises

June 1, 2000

Author(s)

Michele M. Schantz, Reenie M. Parris, Stephen A. Wise

Parallel Genetic Programming

June 1, 2000

Author(s)

John G. Hagedorn, J E. Devaney

This project is developing a generic Genetic Programming system that is inherently parallel. Genetic Programming uses Darwinian selection and reproduction to...

Lattice-Statics Model for Edge Dislocations in Crystals

June 1, 2000

Author(s)

Vinod K. Tewary

A lattice statics Green's function method is described for modeling an edge dislocation in a crystal lattice. The edge dislocation is created by intoducing a...

The TREC-8 Question Answering Track Evaluation

May 1, 2000

Author(s)

Ellen M. Voorhees, D M. Tice

The TREC-8 Question Answering track was the first large-scale evaluation of systems that return answers, as opposed to lists of documents, in response to a...

Full-Scale House Fire Experiment for InterFIRE VR, May 6, 1998. Report of Test.

April 10, 2000

Author(s)

Anthony D. Putorti Jr., Jay A. McElroy

A public/private partnership involving multiple federal agencies and private industry was assembled to develop a comprehensive fire investigation training tool...

SCATMECH: Polarized Light Scattering C++ Class Library

March 1, 2000

Author(s)

Thomas A. Germer

A C++ object class library has been developed to distribute models for polarized light scatteringfrom surfaces. It is the intent of this library to allow...

Modeling and Development of Polishing Processes

February 17, 2000

Author(s)

R B. Mindek

Lapping and polishing have a long history and are probably the oldest known manufacturing professions. They are considered abrasive processes and are used to...

Unified Advanced CD-SEM specification for Sub-0.18um Technology (1999 Version)

January 31, 2000

Author(s)

J Allgair, C Archie, W Banke, H Bogardus, A Delaporte, Michael T. Postek, J Schlesinger, B Singh, Andras Vladar, A Yanof

The Advanced Metrology Advisory Group (AMAG) comprised of representatives from: the International SEMATECH (ISEMATECH) consortium member companies; the National...

Chaotic Resonnce: Hopping Rates, Spectra and Signal-to-Noise Ratios.

January 1, 2000

Author(s)

Emil Simiu, A Kovaleva

We consider a noise-free bistable system with a low frequency signal and a secondary harmonic excitation that causes the system to experience chaotic motion...

PARCS - A Primary Atomic Reference Clock in Space

January 1, 2000

Author(s)

Thomas P. Heavner, Leo W. Hollberg, Steven R. Jefferts, D Meekhof, Thomas E. Parker, William D. Phillips, S L. Rolston, Neil Ashby, W Klipstein, L Maleki, D Seidel, R W. Thompson, L Young, R Vessot, E Mattison, A Demarchi

A Recommendation for an Inspection Standard to Control Sub-Surface Damage in Single-Crystal Sapphire Components

January 1, 2000

Author(s)

Robert S. Polvani

A variety of characterization techniques have been investigated to study surface and subsurface damage in single-crystal sapphire. To characterize the damage in...

The Effect of Non-Linear Viscoelasticity on Interfacial Shear Strength Measurements

January 1, 2000

Author(s)

Gale A. Holmes, R C. Petersen, Donald L. Hunston, Walter G. McDonough, C L. Schutte

A Microshear Test to Measure the Bond Between Dental Composites and Dental Substrates

January 1, 2000

Author(s)

Walter G. McDonough, Joseph M. Antonucci, Gary E. Schumacher, Y Shimada

Mechanical property tests such as the diametral tensile, uniaxial tensile, biaxial flexural, shear, and transverse strength tests are commonly used for...

Effects of Resin Composition on the Remineralizing Ability of Amorphous Calcium Phosphate-Based Polymeric Composites

January 1, 2000

Author(s)

Joseph M. Antonucci, Drago Skrtic, E D. Eanes

Amorphous calcium phosphate (ACP)/acrylic matrix composites have the potential to promote remineralization and/or prevent demineralization of tooth structures...

Color Issues of White LEDs

January 1, 2000

Author(s)

Yoshihiro Ohno

Microroughness-blind Optical Scattering Instrument

January 1, 2000

Author(s)

Thomas A. Germer

Final Report: 1998-1999 NIST/SEMATECH Project on Intercomparison of Linewidth Measurement Methods

January 1, 2000

Author(s)

John S. Villarrubia, Ronald G. Dixson, Samuel N. Jones, J R. Lowney, Michael T. Postek

Abstract unavailable.

1998-99 NIST/International SEMATECH Collaboration to Develop Atom-Based Linewidth Standards

January 1, 2000

Author(s)

Richard M. Silver

This is the final report for the SEMATECH funded SEMATECH/NIST contract for the development of atom-based standard artifacts. This report is intended to...

NIST Random Profile Roughness Specimens and Standard Bullets

January 1, 2000

Author(s)

Jun-Feng Song, Theodore V. Vorburger, Robert A. Clary, Michael L. McGlauflin, Eric P. Whitenton, Christopher J. Evans

Based on the numerical controlled (NC) diamond turning process used previously for manufacturing random profile roughness specimens, two prototype standard...

Gate Dielectric Metrology Review: Project FEPZ001 Year 2 Report

January 1, 2000

Author(s)

Dennis Maher, Curt A. Richter

New Developments in Deep Ultraviolet Laser Metrology for Photolithography

January 1, 2000

Author(s)

Marla L. Dowell, Christopher L. Cromer, Richard D. Jones, Darryl A. Keenan, Thomas Scott

Current and future laser measurement services at 157, 193, and 248 nm will be reviewed. Laser power and energy measurements at 193 nm will be presented...

Final Report, 1998-1999 NIST/SEMATECH Collaboration for Improvement of High-Accuracy Critical-Dimension Meetrology for Semiconductor Manufacturing

December 14, 1999

Author(s)

Andras Vladar, Michael T. Postek

Beginning on or about January 15, 1999, researchers at the National Institute of Standards and Technology (NIST) received partial support from ISEMATECH to...

Energy Dispersive X-Ray Spectrometry With the Transition Edge Sensor Microcalorimeter: A Revolutionary Advance in Materials Microanalysis

December 1, 1999

Author(s)

Dale E. Newbury, David A. Wollman, Kent D. Irwin, Gene C. Hilton, John M. Martinis

The NIST microcalorimeter energy dispersive x-ray spectrometer provides important advances in x-ray spectrometry. The high spectral resolution, approaching 2 eV...

Miniaturization of Bioassays for Toxicological Analysis

December 1, 1999

Author(s)

Laurie E. Locascio

Short-Lived Ozone-Related Compounds, Scientific Assessment of Ozone Depletion: 1998, World Meteorological Organization

December 1, 1999

Author(s)

Michael J. Kurylo III, J M. Rodriguez, M O. Andreae, E L. Atlas, D Blake, John M. Butler, S Lal, D J. Lary, P M. Midgley, Stephen A. Montzka, P C. Novelli, C E. Reeves, P G. Simmonds, L P. Steele, W T. Sturges, R F. Weiss, Y Yokouichi

Boreal Fires, Aerosol Transport, and Feedback to Climate Change: The Need for a Large High-Intensity Boreal Crown Fire Experiment

December 1, 1999

Author(s)

W R. Cofer, C Cahoon, R D, B J. Stocks, J G. Goldhammer, Joseph Conny, M D. Fromm

Evaluation of Analytical Methodologies for Non-Intrusive Drug Testing: Supercritical Fluid Extraction of Cocaine from Hair

December 1, 1999

Author(s)

F Morrison j, Lorna T. Sniegoski, W J. Yoo

DVD '99 Workshop: Standards, Applications, and Technology

November 1, 1999

Author(s)

V R. McCrary, J H. Costello

Proceeding for DVD '99 Workshop: Standards, Applications, and Technology including the speeches of the keynote speakers.

Extracting Thermochemical Information From Ab Initio Data

November 1, 1999

Author(s)

Karl K. Irikura

These are two lectures delivered at the NATO ASI on Energetics of Stable Molecules and Reactive Intermediates, Castelo Branco, Portugal, July 1998. They have...

Y2K Embedded System Testing Guidelines

October 27, 1999

Author(s)

G E. Fisher, M Cherry

Guidelines for what to test in the embedded systems world are presented with respect to the year 2000 problem.

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