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NIST Pubs

Sensor-Driven Fire Model Version 1.1 (NISTIR 6705)

January 1, 2001

Author(s)

William D. Davis, Glenn P. Forney

Modern building fire sensors are capable of supplying substantially more information to the fire service than just the simple detection of a possible fire. With...

Advanced Propellant/Additive Development for Fire Suppressing Gas Generators: Hybrid Systems

January 1, 2001

Author(s)

Stephen Fallis, Russell Reed, Jennifer L. McCormick, Kim Wilson, Gary Holland

The Advanced Propellant/Additive Development for Gas Generators project is a collaborative effort between General Dynamics OTS-Aerospace (GD) in Redmond, WA...

Cold Discharge of CF3I in a Simulated Aircraft Engine Nacelle

January 1, 2001

Author(s)

Jiann C. Yang, Marc R. Nyden, Samuel L. Manzello

One of the potential candidates for halon 1301 replacement in aircraft engine nacelle and dry bay fire protection applications and fuel tank ullage inerting is...

Resonance Tunneling of Field Emitted Electrons Through Adsorbates on Metal Surfaces

January 1, 2001

Author(s)

John William Gadzuk

The NBS involvement in the development of single atom electron spectroscopy at surfaces, as realized in field emission resonance tunneling and reported in the...

Opto-mechanical and electronic design of a tunnel-trap Si-radiometer

January 1, 2001

Author(s)

George P. Eppeldauer, D C. Lynch

Limits for Qualitative Detection and Quantitative Determination in A Century of Excellence in Measurements, Standards, and Technology - A Chronicle of Selected NBS/NIST Publications, 1901-2000

January 1, 2001

Author(s)

Richard M. Lindstrom

Use of Fluorescence to Measure the Lubricant Excess Surface Density During Pool Boiling

January 1, 2001

Author(s)

Mark A. Kedzierski

This paper presents what are believed to be the first measurements of the non-adiabatic lubricant excess surface density on a roughened, horizontal flat pool...

Input Data for Multizone Airflow and IAQ Analysis

January 1, 2001

Author(s)

Andrew K. Persily, E M. Ivy

The use of multizone airflow and contaminant dispersal models requires a range of data. In terms of airflow analysis, these data include leakage characteristics...

Precision Ultrasonic Wave Measurements with Simple Equipment

January 1, 2001

Author(s)

Steven E. Fick, C H. Palmer

We describe the design and construction of a relatively simple, inexpensive laser interferometer system for accurate measurements of ultrasonic waveforms in...

Radio-Frequency Technology Division: Programs, Activities and Accomplishments

January 1, 2001

Author(s)

Dennis S. Friday, Robert M. Judish

Information Technology Measurement and Testing Activities at NIST

January 1, 2001

Author(s)

Michael D. Hogan, Lisa J. Carnahan, Robert J. Carpenter, David W. Flater, James E. Fowler, Simon P. Frechette, M M. Gray, L A. Johnson, R. McCabe, Douglas C. Montgomery, Shirley M. Radack, R Rosenthal, Craig M. Shakarji

Our high technology society continues to rely more and more upon sophisticated measurements, technical standards, and associated testing activities. This was...

NIST Recommended Practice Guide: Rockwell Hardness Measurement of Metallic Materials

January 1, 2001

Author(s)

Samuel R. Low III

The Rockwell hardness test continues to be applied as a tool for assessing the properites of a product while the tolerances on the acceptable material hardness...

Computational and Performance Aspects of PCA-Based Face Recognition Algorithms

January 1, 2001

Author(s)

H Moon, P. Jonathon Phillips

Principal component analysis (PCA) based algorithms form the basis of numerous algorithms and studies in the psychological and algorithmic face recognition...

Rationale and Procedures for Development of a NASA Primary Metrology Laboratory for Large Optics

January 1, 2001

Author(s)

Theodore V. Vorburger, Christopher J. Evans, William T. Estler

Traceable optics metrology is not an expensive overhead. Rather it can improve NASA''s procurement process and eliminate costly Hubble-like mistakes. In...

The Ampere and Electrical Standards

January 1, 2001

Author(s)

Randolph Elmquist, Marvin E. Cage, Yi-hua D. Tang, Anne-Marie Jeffery, Joseph R. Kinard Jr., Ronald F. Dziuba, Nile M. Oldham, Edwin R. Williams

This paper describes some of the major contributions to metrology and physics made by the NIST Electricity Division, which has existed since 1901. It was one of...

Electron Interactions with c-C₄F₈

January 1, 2001

Author(s)

Loucas G. Christophorou, James K. Olthoff

The limited electron collision cross-section and transport-coefficient data for the plasma processing gas perfluorocyclobutane (c-C 4F 8) are synthesized...

NIST Centenial Sessions August Second Two Thousand and One

January 1, 2001

Author(s)

W Anderson, Dennis A. Swyt, H Semerjian

The National Conference of Standards Laboratories International was formed in forty years ago (as NCSL) to promote cooperative efforts for solving the common...

Transfer Calibration Validation Tests on a Heat Flux Sensor in the 51 mm High-Temperature Blackbody

January 1, 2001

Author(s)

A V. Murthy, Benjamin K. Tsai, Robert D. Saunders

Wafer Level Underfill: Experiments and Modeling.

January 1, 2001

Author(s)

Daniel Josell, William E. Wallace, Daniel Wheeler

MSIDs Continuous Improvement Activities

January 1, 2001

Author(s)

Sharon J. Kemmerer, Kristy D. Thompson

The purpose of this document is to provide status on two continuous improvement projects internal to the National Institute of Standards and Technology (NIST)...

Submicrometer Linewidth Metrology

January 1, 2001

Author(s)

Michael T. Postek, Robert D. Larrabee

Office of Microelectronics Programs Technical Accomplishments

January 1, 2001

Author(s)

Stephen Knight, Barbara J. Belzer

This document represents the fiscal year 2000 production of the Programs comprising the Office of Microelectronics Programs (OMP).

A Pratical Josephson Voltage Standard at One Volt

January 1, 2001

Author(s)

Yi-hua D. Tang, Norman B. Belecki, J F. Mayo-Wells

Electronics and Electrical Engineering Laboratory, Magnetics Group: Programs, Activities, and Accomplishments

December 31, 2000

Author(s)

Ronald B. Goldfarb

Report of the NIST MEL Architecture Task Force

December 29, 2000

Author(s)

Harry A. Scott, John Evans, Steven R. Ray, E C. Teague, James S. Albus, Herbert T. Bandy, Edward J. Barkmeyer Jr., Neil Christopher, M A. Donmez, Hui-Min Huang, Albert W. Jones, Elena R. Messina, Jim G. Nell, Frederick M. Proctor, Evan K. Wallace

The NIST Manufacturing Engineering Laboratory undertook a series of internal working meetings to examine all of its architecture efforts. A survey of work was...

A Statistical Test Suite for Random and Pseudorandom Number Generators for Cryptographic Applications

December 20, 2000

Author(s)

Elaine B. Barker

Random and pseudorandom numbers are needed for many cryptographic applications. For example, common cryptosystems employ keys that must be generated in a random...

Molecular Dynamics Study of Liquids in Contact with Tethered Chains

December 13, 2000

Author(s)

Raymond D. Mountain

The results of a series of molecular dynamics simulationss of long chain molecules in contact with a surface, with water films, and with water-acetonitrile...

A Bibliography of Publications of the NIST Electromagnetic Technology Division

December 1, 2000

Author(s)

Sara E. Metz

This bibliography lists the publications of the staff of the Electromagnetic Technology Division of NIST during the period from January, 1970 through July, 1999...

Experimental Thermal Conductivity Values for the IUPAC Round-Robin Sample of 1,1,1,2-Tetrafluoroethane (R134a)

December 1, 2000

Author(s)

Richard A. Perkins, Arno D. Laesecke, J -. Howley, M L. Ramires, A N. Gurova, L -. Cusco

Experimental measurements are reported for the thermal conductivity of 1,1,1,2-tetrafluoroethane (R134a). These measurements were obtained with transient and...

Interferometric Metrology of Photomask Blanks: Approaches Using 633 nm Wavelength Illumination

December 1, 2000

Author(s)

Christopher J. Evans, R E. Parks, L Z. Shao, Angela Davies

Preliminary analyses of three optical configurations for measurement of photomask blanks are described. A simple variant of the well known Ritchey-Common test...

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