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MEP centers must often report on the impacts they have on their client firms. The main data source for these impacts is the Census Follow-up Survey, which
Edward J. Barkmeyer Jr., Jim G. Nell, Curtis H. Parks
This paper describes the activity model as proposed for use in the Internet Commerce for Manufacturing (ICM), a National Advanced Manufacturing Testbed (NAMT)
This report describes the results of calculations using the NIST Fire Dynamics Simulator (FDS) that were performed to provide insight on the thermal conditions
The National Institute of Standards and Technology (NIST) began its first semiconductor metrology projects over 40 years ago, and continues that work in close
This bibliography covers publications of the Electricity Division (and predecessor organizational units), Electronics and Electrical Engineering Laboratory
This bibliography covers publications of the Electricity Division (and predecessor organizational units), Electronics and Electrical Engineering Laboratory
This is the April 2000 edition of energy price indices and discount factors for performing life-cycle cost analyses of energy and water conservation and
We have simulated the fast streamer stage of liquid dielectric breakdown as stochastic growth of a branching fractal tree. Breakdown and threshold properties of
R Schwengner, H Schnare, S Frauendorf, F Donau, L Kaubler, H Prade, E Grosse, A Jungclaus, K P. Lieb, C Lingk, S Skoda, J Eberth, G de Angelis, A Gadea, E Farnea, D R. Napoli, C A. Ur, G Lo Bianco
We discuss the connection of high-energy gamma-ray measurements with precision atomic mass determinations. These rather different technologies, properly
Alice V. Ling, Andras Vladar, Bradley N. Damazo, M A. Donmez, Michael T. Postek
This report describes the current design of a system for monitoring the performance of several major subsystems of a scanning electron microscope (SEM). The
The Semi-Annual Listing of North American Quality System Registration Organizations (NAQSRO) provides information on organizations that have informed NIST about