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NIST Pubs

Periodic Table: Atomic Properties of the Elements, Version 2

January 1, 2001

Author(s)

Robert A. Dragoset, Arlene Musgrove, Charles W. Clark, William C. Martin

Digital Cinema 2001, Conference Proceedings

January 1, 2001

Author(s)

Charles D. Fenimore, M M. Floyd

This Proceeding provides papers and slides for the presentations at digital Cinema 2001 Conference. The conference addresses a variety of business and technical...

A Phase-Field Model for High Anisotropic InterfaciEnergy

January 1, 2001

Author(s)

Geoffrey B. McFadden, J J. Eggleston, P W. Voorhees

A computationally efficient phase-field model is developed for two-phase systems with anisotropic interfacial energy. The approach allows for anisotropies...

Statistics and Measurements

January 1, 2001

Author(s)

C M. Croarkin

For more than 50 years, the Statistical Engineering Division (SED) has been instrumental in the success of a broad spectrum of metrology projects at NBS/NIST...

Common Biometric Exchange File Format (CBEFF)

January 1, 2001

Author(s)

Fernando L. Podio, J S. Dunn, L Reinert, C J. Tilton, L O'Gorman, P Collier, Mark Jerde, B Wirtz

Common Biometric Exchange File Format (CBEFF) describes a set of data elements necessary to support biometric technologies in a common way. These data can be...

Thermal Spray Process Reliability: Sensors and Diagnostics; Summary of a Workshop held at National Institute of Standards and Technology

January 1, 2001

Author(s)

Stephen D. Ridder

This report covers the second workshop on TS coatings sponsored by the NIST Metallurgy Division. The first of these workshops, held in November, 1998, is...

Guide to Rheological Nomenclature: Measurement in Ceramic Particulate Systems

January 1, 2001

Author(s)

Vincent A. Hackley, Chiara F. Ferraris

This document provides definitions of terms and expressions relating to the measurement of rheological properties in liquid-based ceramic particulate systems (i...

Metallurgy Division 2000 Programs and Accomplishments

January 1, 2001

Author(s)

C A. Handwerker, Robert J. Schaefer

This report describes major programs and accomplishments of the Metallurgy Division of the NIST Materials Science and Engineering Laboratory (MSEL) in FY2000...

Materials Reliability Division FY 2000 Programs and Accomplishments

January 1, 2001

Author(s)

F R. Fickett

The technical activities of the Materials Reliability Division during fiscal year 2000 are summarized. The Division has 23 research projects in the following...

Ceramics Division FY 2000 Programs and Accomplishments

January 1, 2001

Author(s)

Stephen W. Freiman, S J. Dapkunas

The mission of the Ceramics Division is: Work with industry, standards bodies, academia, and other government agencies in providing the leadership for the...

Combinatorial Methods at NIST

January 1, 2001

Author(s)

Alamgir Karim, Eric J. Amis

New, more complex materials are increasingly in demand for applications in biotechnology, microelectronics and nanotechnology. The use of combinatorial methods...

1998 CODATA Recommended Values of the Fundamental Constants of Physics and Chemistry [Wallet Card]

January 1, 2001

Author(s)

Peter J. Mohr, Barry N. Taylor

This publication is a plastic wallet card listing the 1998 self-consistent set of values of the basic constants and conversion factors of physics and chemistry...

1998 CODATA Recommended Values of the Fundamental Constants of Physics and Chemistry [Poster]

January 1, 2001

Author(s)

Peter J. Mohr, Barry N. Taylor

This publication is a large wall chart listing the 1998 self-consistent set of values of the basic constants and conversion factors of physics and chemistry...

1998 CODATA Recommended Values of the Fundamental Constants of Physics and Chemistry [Wall Chart]

January 1, 2001

Author(s)

Peter J. Mohr, Barry N. Taylor

This publication is a small wall chart listing the 1998 self-consistent set of values of the basic constants and conversion factors of physics and chemistry...

The Candela and Photometric and Radiometric Measurements

January 1, 2001

Author(s)

Albert C. Parr

The national measurement system for photometric and radiometric quantities is presently based upon techniques and a measurement chain that make these quantities...

The Kelvin and Temperature Measurements

January 1, 2001

Author(s)

Billy W. Mangum, G T. Furukawa, Kenneth G. Kreider, Christopher W. Meyer, Dean C. Ripple, Gregory F. Strouse, Weston L. Tew, Robert D. Saunders, Bettye C. Johnson, Howard W. Yoon, Michael R. Moldover, Charles E. Gibson

The International Temperature Scale of 1990 (ITS90) is defined from 0.65 K upwards to the highest temperature measurable by spectral radiation thermometry, the...

Workshop on Temperature Measurement of Semiconductor Wafers Using Thermocouples

January 1, 2001

Author(s)

Kenneth G. Kreider, D P. DeWitt, Benjamin K. Tsai, B Lojek

Temperature measurement is an important parameter in most semiconductor processes. These measurements are necessary in temperature ranges as low as below 0 C in...

Semiconductor Electronics Division Programs, Activities, and Accomplishments 2000

January 1, 2001

Author(s)

Erik M. Secula

This document represents the fiscal year 2000 production of the Projects comprising the Semiconductor Electronics Division (SED). Project goals, customer needs...

Office of Law Enforcement Standards - Programs, Activities, and Accomplishments

January 1, 2001

Author(s)

Thomas J. Russell

The Office of Law Enforcements (OLES) of the National Institute of Standards and Technology (NIST) helps law enforcement and criminal justice agencies ensure...

NIST Mechanisms for Disseminating Measurements

January 1, 2001

Author(s)

T E. Gills, S Dittmann, Georgia L. Harris, C S. Brickenkamp, J R. Rumble, N M. Trahey

The National Bureau of Standards, predecessor of the National Institute of Standards and Technology, began providing the Nation with measurement artifacts and...

NIST Centenial Sessions August Second Two Thousand and One

January 1, 2001

Author(s)

W Anderson, Dennis A. Swyt, H Semerjian

The National Conference of Standards Laboratories International was formed in forty years ago (as NCSL) to promote cooperative efforts for solving the common...

Transfer Calibration Validation Tests on a Heat Flux Sensor in the 51 mm High-Temperature Blackbody

January 1, 2001

Author(s)

A V. Murthy, Benjamin K. Tsai, Robert D. Saunders

Wafer Level Underfill: Experiments and Modeling.

January 1, 2001

Author(s)

Daniel Josell, William E. Wallace, Daniel Wheeler

MSIDs Continuous Improvement Activities

January 1, 2001

Author(s)

Sharon J. Kemmerer, Kristy D. Thompson

The purpose of this document is to provide status on two continuous improvement projects internal to the National Institute of Standards and Technology (NIST)...

Submicrometer Linewidth Metrology

January 1, 2001

Author(s)

Michael T. Postek, Robert D. Larrabee

Office of Microelectronics Programs Technical Accomplishments

January 1, 2001

Author(s)

Stephen Knight, Barbara J. Belzer

This document represents the fiscal year 2000 production of the Programs comprising the Office of Microelectronics Programs (OMP).

A Pratical Josephson Voltage Standard at One Volt

January 1, 2001

Author(s)

Yi-hua D. Tang, Norman B. Belecki, J F. Mayo-Wells

Computational and Performance Aspects of PCA-Based Face Recognition Algorithms

January 1, 2001

Author(s)

H Moon, P. Jonathon Phillips

Principal component analysis (PCA) based algorithms form the basis of numerous algorithms and studies in the psychological and algorithmic face recognition...

Rationale and Procedures for Development of a NASA Primary Metrology Laboratory for Large Optics

January 1, 2001

Author(s)

Theodore V. Vorburger, Christopher J. Evans, William T. Estler

Traceable optics metrology is not an expensive overhead. Rather it can improve NASA''s procurement process and eliminate costly Hubble-like mistakes. In...

The Ampere and Electrical Standards

January 1, 2001

Author(s)

Randolph Elmquist, Marvin E. Cage, Yi-hua D. Tang, Anne-Marie Jeffery, Joseph R. Kinard Jr., Ronald F. Dziuba, Nile M. Oldham, Edwin R. Williams

This paper describes some of the major contributions to metrology and physics made by the NIST Electricity Division, which has existed since 1901. It was one of...

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